Abstract: The present invention provides a method of sample preparation for use in obtaining elemental isotope ratios of a material by accelerator mass spectrometry. The method comprises forming the material into a sample without any substantial chemical alteration of the material. The invention also provides a sample for use in obtaining elemental isotope ratios of a material.
Type:
Grant
Filed:
July 15, 2005
Date of Patent:
May 6, 2008
Assignee:
Xceleron Limited
Inventors:
Ronald Colin Garner, June Valerie Garner, Daniel Nichol Leong
Abstract: The present invention provides a method of sample preparation for use in obtaining elemental isotope ratios of a material by accelerator mass spectrometry. The method comprises forming the material into a sample without any substantial chemical alteration of the material. The invention also provides a sample for use in obtaining elemental isotope ratios of a material.
Type:
Application
Filed:
July 15, 2005
Publication date:
January 25, 2007
Applicant:
Xceleron Limited
Inventors:
Ronald Garner, June Garner, Daniel Cheong