Abstract: The present invention relates generally to the field of semiconductor memories and in particular to memory cells comprising a static random access memory (SRAM) bitcell (100). Leakage current in the read path is reduced by connecting a read access transistor terminal either to GND or VDD during read access or write access and idle state. The SKAM cell inverters may be asymmetrical in size. The memory may comp rise various boost circuits to allow low voltage operation or application of distinguished supply voltages.
Type:
Grant
Filed:
September 17, 2015
Date of Patent:
May 28, 2019
Assignee:
Xenergic AB
Inventors:
Babak Mohammadi, Joachim Neves Rodrigues
Abstract: The present invention relates generally to the field of semiconductor memories and in particular to memory cells comprising a static random access memory (SRAM) bitcell (100). Leakage current in the read path is reduced by connecting a read access transistor terminal either to GND or VDD during read access or write access and idle state. The SKAM cell inverters may be asymmetrical in size. The memory may comp rise various boost circuits to allow low voltage operation or application of distinguished supply voltages.
Type:
Application
Filed:
September 17, 2015
Publication date:
September 6, 2018
Applicant:
Xenergic AB
Inventors:
Babak MOHAMMADI, Joachim NEVES RODRIGUES