Patents Assigned to XENOCS SAS
  • Patent number: 11835474
    Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: December 5, 2023
    Assignee: XENOCS SAS
    Inventors: Karsten Joensen, Peter Hoghoj, Ronan Mahe
  • Patent number: 11796485
    Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: October 24, 2023
    Assignee: XENOCS SAS
    Inventors: Peter Hoghoj, Blandine Lantz
  • Publication number: 20230012833
    Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.
    Type: Application
    Filed: December 29, 2020
    Publication date: January 19, 2023
    Applicant: XENOCS SAS
    Inventors: Karsten JOENSEN, Peter HOGHOJ, Ronan MAHE
  • Publication number: 20220326166
    Abstract: An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path, a distal X-ray detector arranged downstream of the sample holder and being movable, in a motorized way, is disclosed. The first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot near the distal X-ray detector when placed at its largest distance from the sample holder or produce a parallel beam so that the X-ray scattering apparatus has a second X-ray beam delivery system having a second X-ray source and being configured to generate and direct a divergent second X-ray beam towards the sample holder for X-ray imaging.
    Type: Application
    Filed: December 29, 2020
    Publication date: October 13, 2022
    Applicant: XENOCS SAS
    Inventors: Peter HOGHOJ, Blandine LANTZ
  • Patent number: 11275038
    Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.
    Type: Grant
    Filed: May 15, 2019
    Date of Patent: March 15, 2022
    Assignee: XENOCS SAS
    Inventors: Peter Hoghoj, Blandine Lantz, Karsten Joensen, Soren Skou
  • Publication number: 20210364454
    Abstract: A method for X-Ray Scattering material analysis, in particular Small Angle X-ray Scattering material analysis for generating and directing an incident X-ray beam along a propagation direction to a sample held in a sample environment executing a sample measurement process. An apparatus adapted to carry out such a method is also disclosed.
    Type: Application
    Filed: May 15, 2019
    Publication date: November 25, 2021
    Applicant: XENOCS SAS
    Inventors: Peter HOGHOJ, Blandine LANTZ, Karsten JOENSEN, Soren SKOU
  • Patent number: 11029265
    Abstract: An X-ray scattering apparatus has a sample holder for aligning and orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction towards the sample holder, a proximal X-ray detector arranged downstream of the sample holder as to let the direct X-ray beam pass and detect X rays scattered from the sample, and a distal X-ray detector arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam in which the proximal X-ray detector is also movable essentially along the propagation direction of the direct X-ray beam.
    Type: Grant
    Filed: May 17, 2017
    Date of Patent: June 8, 2021
    Assignee: XENOCS SAS
    Inventor: Peter Hoghoj