Patents Assigned to XIA LLC
  • Patent number: 10816587
    Abstract: A technique for characterizing the noise behavior of a superconducting tunnel junction (STJ) detector as a function of its applied bias voltage Vb by stepping the STJ's bias voltage across a predetermined range and, at each applied bias, making multiple measurements of the detector's current, calculating their mean and their standard deviation from their mean, and using this standard deviation as a measure of the STJ detector's noise at that applied bias. Because the method is readily executed under computer control, it is particularly useful when large numbers of STJ detectors require biasing, as in STJ detector arrays In a preferred implementation, the STJ is measured under computer control by attaching it to a digital spectrometer comprising a digital x-ray processor (DXP) coupled to a preamplifier that can set the STJ's bias voltage Vb using a digital-to-analog converter (DAC) controlled by the DXP.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: October 27, 2020
    Assignee: XIA LLC
    Inventors: William K. Warburton, Jackson T. Harris
  • Patent number: 10817588
    Abstract: A digital processing technique for measuring a characteristic of a digitized electronic signal pulse, particularly including its time of arrival and/or maximum. The technique is particularly suited for in-line implementation in a field programmable gate array or digital signal processor. For each detected pulse, one or more ratios are created from values of the pulse above baseline, obtained from regions of the pulse where the values change as its arrival time offset changes, and the ratio or ratios are used as variables in a reference table or equation to generate the value of the desired characteristic. The table or equation is created beforehand by using a secondary technique to study pulses of the type being measured, to establish the relationship between the ratio value or values and the desired characteristic, and to codify that relationship in the reference table or equation. Time resolutions of 2-3% of the sampling interval are demonstrated.
    Type: Grant
    Filed: February 13, 2017
    Date of Patent: October 27, 2020
    Assignee: XIA LLC
    Inventors: William K. Warburton, Wolfgang G. Hennig
  • Patent number: 10416295
    Abstract: A digital processing technique for measuring the time of arrival of a digitized electronic signal pulse for in-line implementation in a field programmable gate array or digital signal processor. For each detected pulse, an interpolation method is used to estimate its maximum M, M is multiplied by a fraction f, and a second interpolation method is used to estimate the time when the pulse reaches the value f·M, which is then taken as the pulse's time of arrival. Various interpolation methods may be used. A particularly accurate method employs convolution of the pulse data by a kernel that is the product of the sinc function and a Gaussian. Detector physics limited time resolutions of 2-5% of the sampling interval are demonstrated. Estimating M is useful in its own right for determining pulse amplitudes, for example as a measure of the energies of photons absorbed in a detector.
    Type: Grant
    Filed: October 24, 2016
    Date of Patent: September 17, 2019
    Assignee: XIA LLC
    Inventor: William K. Warburton
  • Publication number: 20180113160
    Abstract: A digital processing technique for measuring a characteristic of a digitized electronic signal pulse, particularly including its time of arrival and/or maximum. The technique is particularly suited for in-line implementation in a field programmable gate array or digital signal processor. For each detected pulse, one or more ratios are created from values of the pulse above baseline, obtained from regions of the pulse where the values change as its arrival time offset changes, and the ratio or ratios are used as variables in a reference table or equation to generate the value of the desired characteristic. The table or equation is created beforehand by using a secondary technique to study pulses of the type being measured, to establish the relationship between the ratio value or values and the desired characteristic, and to codify that relationship in the reference table or equation. Time resolutions of 2-3% of the sampling interval are demonstrated.
    Type: Application
    Filed: February 13, 2017
    Publication date: April 26, 2018
    Applicant: XIA LLC
    Inventors: William K. Warburton, Wolfgang G. Hennig
  • Publication number: 20180113203
    Abstract: A digital processing technique for measuring the time of arrival of a digitized electronic signal pulse for in-line implementation in a field programmable gate array or digital signal processor. For each detected pulse, an interpolation method is used to estimate its maximum M, M is multiplied by a fraction f, and a second interpolation method is used to estimate the time when the pulse reaches the value f·M, which is then taken as the pulse's time of arrival. Various interpolation methods may be used. A particularly accurate method employs convolution of the pulse data by a kernel that is the product of the sinc function and a Gaussian. Detector physics limited time resolutions of 2-5% of the sampling interval are demonstrated. Estimating M is useful in its own right for determining pulse amplitudes, for example as a measure of the energies of photons absorbed in a detector.
    Type: Application
    Filed: October 24, 2016
    Publication date: April 26, 2018
    Applicant: XIA LLC
    Inventor: William K. Warburton
  • Patent number: 9857480
    Abstract: A method and apparatus for measuring the concentrations of radioxenon isotopes in a gaseous sample wherein the sample cell is surrounded by N sub-detectors that are sensitive to both electrons and to photons from radioxenon decays. Signal processing electronics are provided that can detect events within the sub-detectors, measure their energies, determine whether they arise from electrons or photons, and detect coincidences between events within the same or different sub-detectors. The energies of detected two or three event coincidences are recorded as points in associated two or three-dimensional histograms. Counts within regions of interest in the histograms are then used to compute estimates of the radioxenon isotope concentrations.
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: January 2, 2018
    Assignee: XIA LLC
    Inventors: William K. Warburton, Wolfgang G. Hennig
  • Publication number: 20160245852
    Abstract: A technique for characterizing the noise behavior of a superconducting tunnel junction (STJ) detector as a function of its applied bias voltage Vb by stepping the STJ's bias voltage across a predetermined range and, at each applied bias, making multiple measurements of the detector's current, calculating their mean and their standard deviation from their mean, and using this standard deviation as a measure of the STJ detector's noise at that applied bias. Because the method is readily executed under computer control, it is particularly useful when large numbers of STJ detectors require biasing, as in STJ detector arrays In a preferred implementation, the STJ is measured under computer control by attaching it to a digital spectrometer comprising a digital x-ray processor (DXP) coupled to a preamplifier that can set the STJ's bias voltage Vb using a digital-to-analog converter (DAC) controlled by the DXP.
    Type: Application
    Filed: April 28, 2016
    Publication date: August 25, 2016
    Applicant: XIA LLC
    Inventors: William K. Warburton, Jackson T. Harris
  • Publication number: 20120166117
    Abstract: A technique for characterizing the noise behavior of a superconducting tunnel junction (STJ) detector as a function of its applied bias voltage Vb by stepping the STJ's bias voltage across a predetermined range and, at each applied bias, making multiple measurements of the detector's current, calculating their mean and their standard deviation from their mean, and using this standard deviation as a measure of the STJ detector's noise at that applied bias. Because the method is readily executed under computer control, it is particularly useful when large numbers of STJ detectors require biasing, as in STJ detector arrays In a preferred implementation, the STJ is measured under computer control by attaching it to a digital spectrometer comprising a digital x-ray processor (DXP) coupled to a preamplifier that can set the STJ's bias voltage Vb using a digital-to-analog converter (DAC) controlled by the DXP.
    Type: Application
    Filed: June 7, 2011
    Publication date: June 28, 2012
    Applicant: XIA LLC
    Inventors: William K. Warburton, Jackson T. Harris