Abstract: A trim unit includes a delay line and one or more individually selectable load elements. The delay line has a first end to receive an input clock signal, and has a second end to generate an output clock signal. Each load element includes a select transistor and a load capacitor coupled in series between the delay line and ground potential, and includes a filter circuit having an input to receive a select signal and having an output coupled to a gate of the select transistor. Upon assertion of each select signal, the filter circuit gradually charges the gate of the select transistor, which in turn causes the load element to gradually increase the phase-delay between the input and output clock signals.

Abstract: A memory array having a read mode and a write mode is addressed using separate read and write decoders. The write decoder is used to write bit values to one column of the array. A hard-wired read decoder is utilized to further increase the operating speed during the memory read mode. In one embodiment, a separate read bit line is provided to facilitate faster read operations. In an exemplary embodiment, the write decoder receives two input signals and generates four write address signals on write word lines that are transmitted to the columns of programmable elements of a logic/memory array. The hard-wired read decoder also receives the same two input signals, and generates eight read address signals on two read word lines, two read address signals being transmitted to each column of the logic/memory array.

Abstract: An interactive graphical software tool is provided that can be used to report the configuration data (i.e., the state of the various configuration bits) in a programmed device as well as to probe and stimulate circuits in the programmed device. A graphical or textual representation of the configuration data can be displayed. When used with a programmable device having addressable flip-flops, such as a member of the Xilinx XC6200 family, one embodiment of the invention can change the state of any addressable flip-flop in the configured device. The graphical tool of the invention is preferably implemented using a high level programming language such as Java and features a graphical point and click user interface, remote access to hardware, and symbolic debug capability. According to another aspect of the invention, data can be written into a programmable device using an interactive software tool and a hardware device designed to interface with the programmable device.

Abstract: In a field programmable gate array, a test circuit for testing the signal path of a line, through a pass gate, and onto a second line. A memory cell outputs at a V.sub.GG level, where V.sub.GG .gtoreq.V.sub.DD +V.sub.TN. In order to dynamically test the signal path, three transistors and two test signals are used to apply either 0 volts or V.sub.GG to control the pass gate. Two of the transistors are coupled to the memory cell and the pass gate, whereas the third transistor is coupled to the first and second transistors and ground. The two test signals and an inverter control these transistors so that the memory state can be changed to dynamically switch the pass gate according to the test configuration. An electrical signal is then sent through the signal path under test, and the result is monitored.