Abstract: A probe card device including a probe structure is provided. Probes respectively pass through multiple through holes on at least two guide plates that are stacked and separated from each other, and each of the probes includes a main body, a contacting portion, a head portion, and a neck portion. The contacting portion is exposed under a lowermost guide plate. The head portion is exposed above an uppermost guide plate. The neck portion is connected between the main body and the head portion, and a part of the neck portion protrudes opposite thereof to form a protrusion portion. The protrusion portion and the main body form an included angle, the protrusion portion abuts against an upper surface of the uppermost guide plate, and a spacing between any two of the probes that are adjacent to each other is less than twice the thickness of the protrusion portion.