Abstract: A method and system for verifying the integrity of integrated circuits (ICs) by detecting the presence of unauthorized circuit insertions or modifications using non-destructive x-ray microscopy is disclosed. A reference image based on a trusted IC or a trusted design file may be generated. An un-trusted IC may be received from an un-trusted foundry, which IC is manufactured in response to the trusted design file provided to the foundry. An x-ray microscope may record a plurality of sets of base images of the un-trusted IC, each set corresponding to a different viewing angle. One or more un-trusted images may be produced from the base images. The reference images may be compared with the un-trusted images to illuminate any additions or modifications in circuit elements or other parameters.

Abstract: A method and system for verifying the integrity of integrated circuits (ICs) by detecting the presence of unauthorized circuit insertions or modifications using non-destructive x-ray microscopy is disclosed. A reference image based on a trusted IC or a trusted design file may be generated. An un-trusted IC may be received from an un-trusted foundry, which IC is manufactured in response to the trusted design file provided to the foundry. An x-ray microscope may record a plurality of sets of base images of the un-trusted IC, each set corresponding to a different viewing angle. One or more un-trusted images may be produced from the base images. The reference images may be compared with the un-trusted images to illuminate any additions or modifications in circuit elements or other parameters.