Patents Assigned to XRD-Tools S.R.L.
  • Patent number: 7260178
    Abstract: Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception axis, said collimation and reception axis, conveying in a centre of the diffractometer which is fixed with respect to the primary Euler cradle. The source and detector are adapted to move along the primary Euler cradle. The secondary Euler cradle supports the primary Euler cradle and is arranged to rotate the latter.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: August 21, 2007
    Assignee: XRD-Tools S.R.L.
    Inventor: Giovanni Berti