Patents Assigned to XRF Corporation
  • Patent number: 7576326
    Abstract: Provided are a device and method for detecting and analyzing radiation. A detection unit includes a detector, and generates signal pulses from photons of the radiation. Each signal pulse has an amplitude that is determined by an interaction of the photons at a depth of the detector. A pulse deficit correction trigger corrects for charge deficits that occur from the photon interaction across the depth of the detector by removing depth dependence in the amplitudes of the signal pulses. A multi-channel analyzer receives the signal pulses and generates a spectrum from the received signal pulses, and receives a trigger signal that is generated by the pulse deficit correction trigger to remove the depth dependence in the amplitudes of the signal pulses.
    Type: Grant
    Filed: June 7, 2007
    Date of Patent: August 18, 2009
    Assignee: XRF Corporation
    Inventor: Dexter Eames
  • Patent number: 7504636
    Abstract: A radiation detection apparatus for use in noisy environments in which radiation detection and external noise generate interaction event pulses. A first interaction pulse initiates a following time interval during which the effect of received interaction event pulses is minimized. For example, the interaction event pulses produced by noise are not counted if they occur during the time interval.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: March 17, 2009
    Assignee: XRF Corporation
    Inventor: Larry K. Baxter
  • Publication number: 20080001884
    Abstract: Provided are a device and method for detecting and analyzing radiation. A detection unit includes a detector, and generates signal pulses from photons of the radiation. Each signal pulse has an amplitude that is determined by an interaction of the photons at a depth of the detector. A pulse deficit correction trigger corrects for charge deficits that occur from the photon interaction across the depth of the detector by removing depth dependence in the amplitudes of the signal pulses. A multi-channel analyzer receives the signal pulses and generates a spectrum from the received signal pulses, and receives a trigger signal that is generated by the pulse deficit correction trigger to remove the depth dependence in the amplitudes of the signal pulses.
    Type: Application
    Filed: June 7, 2007
    Publication date: January 3, 2008
    Applicant: XRF CORPORATION
    Inventor: Dexter Eames
  • Patent number: 6111929
    Abstract: Disclosed is a scanning x-ray fluorescence spectrometer for measuring accurately the content of a randomly distributed element contained in a sample. Said device comprising a linear excitation source of radioactive material in a holder which produces a beam of ionizing radiation capable of exciting the emission of primary x-rays of the said element from said sample. The sample is mechanically drawn through said beam in a direction perpendicular to the axis of said source, thus exposing the entire sample to a uniform radiation flux. A linear radiation detector is positioned on a plane parallel to said sample and said source, positioned such that its sensitive area faces said sample at the point where the most intense portion of said beam passes through said sample, thus achieving a uniform collection of x-rays from the sample.
    Type: Grant
    Filed: March 14, 1997
    Date of Patent: August 29, 2000
    Assignee: XRF Corporation
    Inventor: Thomas Hazlett