Abstract: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails.
Type:
Grant
Filed:
August 28, 2012
Date of Patent:
July 8, 2014
Assignees:
Xu Ji Group Corporation, State Grid Corporation of China
Abstract: The present invention provides an integrated battery dispatching system with centralized charging and centralized allocation, which comprises an initial parameter setting module (101), a dispatching selection module (102), a delivery parameter setting module (103), a full battery number acquiring module (104), a logistics fleet delivery strategy submodule (105) and a centralized charging station charging strategy submodule (106). The present invention integrally dispatches centralized battery charging, battery dispatching and logistics vehicle allocation, and arranges the battery to be charged with cheap electric energy according to the battery replacement demand of a delivery station in combination with the capacity constraint for a centralized charging station and the power tariff of a power grid.
Type:
Application
Filed:
April 18, 2013
Publication date:
October 24, 2013
Applicants:
STATE GRID CORPORATION OF CHINA, SOUTHEAST UNIVERSITY, BEI JING XJ ELECTRIC CO., LTD., XU JI GROUP CORPORATION
Inventors:
Fei XUE, HongChao LIU, CiWei GAO, Liang ZHANG, Sheng ZHANG, BenHai WEI, Jun SU
Abstract: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails.
Type:
Application
Filed:
August 28, 2012
Publication date:
April 25, 2013
Applicants:
STATE GRID CORPORATION OF CHINA, XU JI GROUP CORPORATION