Patents Assigned to Xyletech Systems, Inc.
  • Patent number: 6760683
    Abstract: A method for evaluating the performance of an instrument, particularly a hematology analyzer, by comparing its operating data with data compiled from a group of like instruments is provided. The method contemplates collecting historical data which is deposited in a central database where it may be retrieved by any participating laboratory. The participating laboratory performs an analysis and then accesses the database to retrieve data obtained from comparable instruments performing like analyses. The comparative analysis is then conducted from which a determination may be made with regard to a particular instrument.
    Type: Grant
    Filed: February 13, 2003
    Date of Patent: July 6, 2004
    Assignee: Xyletech Systems, Inc.
    Inventor: John C. Yundt-Pacheco
  • Publication number: 20030120462
    Abstract: A method for evaluating the performance of an instrument, particularly a hematology analyzer, by comparing its operating data with data compiled from a group of like instruments is provided. The method contemplates collecting historical data which is deposited in a central database where it may be retrieved by any participating laboratory. The participating laboratory performs an analysis and then accesses the database to retrieve data obtained from comparable instruments performing like analyses. The comparative analysis is then conducted from which a determination may be made with regard to a particular instrument.
    Type: Application
    Filed: February 13, 2003
    Publication date: June 26, 2003
    Applicant: Xyletech Systems, Inc.
    Inventor: John C. Yundt-Pacheco
  • Patent number: 6549876
    Abstract: A procedure for evaluating the performance of an instrument, particularly a hematology analyzer, by comparing its operating data with data compiled from a group of like instruments is provided. The method contemplates collecting historical data which is deposited in a central database where it may retrieved by any participating laboratory. The participating laboratory performs an analysis and then accesses the database to retrieve data obtained from comparable instruments performing like analyzes. The comparative analysis is then conducted from which a determination may be made with regard to a particular instrument.
    Type: Grant
    Filed: July 25, 2000
    Date of Patent: April 15, 2003
    Assignee: Xyletech Systems, Inc.
    Inventor: John C. Yundt-Pacheco
  • Patent number: 5734591
    Abstract: A method is disclosed for analyzing the performance of a testing device for analyzing biochemical samples or human bodily fluids which operates over at least two ranges. The method of the present invention comprises obtaining a first set of test results relating to the biochemical samples from the testing device over at least two ranges, and calculating from the first set of test results an individual range mean for each of the at least two ranges. The method also includes obtaining a second set of test results relating to the biochemical samples from a group of testing devices that operate over the at least two ranges, calculating from the second set of test results a group range mean and a group range standard deviation for each of the at least two ranges, and calculating standard deviation indexes for the testing device from the individual range means, the group range means and the group range standard deviations.
    Type: Grant
    Filed: July 30, 1996
    Date of Patent: March 31, 1998
    Assignee: Xyletech Systems, Inc.
    Inventor: John C. Yundt
  • Patent number: 5541854
    Abstract: A method and graph for analyzing the performance of a testing device that operates over at least two ranges, such as a hematology testing device. The method of the invention comprises forming generally parallel data range axes, each relating to a range of operation of the testing device, and, preferably, labeling at least one of the data range axes with standard deviation index units. The method further comprises obtaining data from a testing device to be analyzed and from a group of testing devices that operate over at least two ranges. Individual ranges for each of at least two ranges as well as group ranges and group standard deviations for at least two ranges are calculated from these test results. In the preferred embodiment, standard deviation indexes are computed for the testing device based on these calculations. The standard deviation indexes are plotted, and the resulting plot is preferably used to analyze the performance of and calibrate the testing device.
    Type: Grant
    Filed: May 26, 1993
    Date of Patent: July 30, 1996
    Assignee: Xyletech Systems, Inc.
    Inventor: John C. Yundt