Patents Assigned to Yokogawa Meters & Instruments Corporation
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Publication number: 20170370967Abstract: An isolated voltage probe includes: a conductor including a positive lead, a negative lead, and a resistance via which the positive lead and the negative lead are connected to each other; a magnetic sensor for measuring a magnetic field in a non-contact manner, the magnetic field being generated by a current flowing through the conductor; and a coaxial cable for transmitting a signal that is based on an output supplied from the magnetic sensor.Type: ApplicationFiled: May 8, 2017Publication date: December 28, 2017Applicants: YOKOGAWA ELECTRIC CORPORATION, YOKOGAWA METERS & INSTRUMENTS CORPORATIONInventor: Katsuki MITSUNAGA
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Publication number: 20170076115Abstract: An electronic device includes a display unit, and an operation unit. The electronic device has a lock function of locking operation functions on the operation unit such that the operation functions are temporarily inoperable. At least one of the operation functions is set to be selectively operable even in a lock state.Type: ApplicationFiled: September 15, 2016Publication date: March 16, 2017Applicants: YOKOGAWA ELECTRIC CORPORATION, YOKOGAWA METERS & INSTRUMENTS CORPORATIONInventors: Gentaro ISHIHARA, Tohru MORI
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Patent number: 9546927Abstract: An optical pulse tester includes: an OTDR measurer configured to execute an OTDR function of measuring a time distribution of a power of return light of an optical pulse input to an optical fiber; a display configured to display an OTDR measurement screen indicating information on execution of the OTDR function; and a controller configured to control the OTDR measurer and the display. The controller displays, on the OTDR measurement screen, a menu for allowing an operating person to call an auxiliary function for measurement of the optical fiber, and displays, on the OTDR measurement screen, a sub-screen indicating information on execution of the auxiliary function called by the operating person.Type: GrantFiled: August 5, 2015Date of Patent: January 17, 2017Assignees: YOKOGAWA ELECTRIC CORPORATION, YOKOGAWA METERS & INSTRUMENTS CORPORATIONInventor: Koji Hayashi
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Publication number: 20160195433Abstract: An optical device includes: a diffraction grating; a depolarization plate containing a birefringent material to eliminate polarization dependency of the diffraction grating; and an optical corrector configured to optically correct diffraction angle deviation of diffracted light due to diffraction at the diffraction grating. The optical corrector may be configured to bend back the diffracted light diffracted by the diffraction grating to re-emit the light to the diffraction grating.Type: ApplicationFiled: January 4, 2016Publication date: July 7, 2016Applicants: Yokogawa Electric Corporation, YOKOGAWA METERS & INSTRUMENTS CORPORATIONInventors: Tsutomu Kaneko, Manabu Kojima
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Publication number: 20160069774Abstract: An optical pulse tester includes: an OTDR measurer configured to execute an OTDR function of measuring a time distribution of a power of return light of an optical pulse input to an optical fiber; a display configured to display an OTDR measurement screen indicating information on execution of the OTDR function; and a controller configured to control the OTDR measurer and the display. The controller displays, on the OTDR measurement screen, a menu for allowing an operating person to call an auxiliary function for measurement of the optical fiber, and displays, on the OTDR measurement screen, a sub-screen indicating information on execution of the auxiliary function called by the operating person.Type: ApplicationFiled: August 5, 2015Publication date: March 10, 2016Applicants: YOKOGAWA METERS & INSTRUMENTS CORPORATION, YOKOGAWA ELECTRIC CORPORATIONInventor: Koji HAYASHI
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Patent number: 9146161Abstract: An optical wavelength meter includes: an interferometer; a reference optical source unit with a laser configured to oscillate in a multi-longitudinal mode; and a signal processor configured to calculate a wavelength of a input beam with reference to interference fringe information of reference beam and interference fringe information of the input beam obtained from the interferometer.Type: GrantFiled: November 1, 2013Date of Patent: September 29, 2015Assignees: YOKOGAWA ELECTRIC CORPORATION, YOKOGAWA METERS & INSTRUMENTS CORPORATIONInventors: Toshikazu Yamamoto, Manabu Kojima
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Publication number: 20150115875Abstract: A charging circuit for charging a rechargeable battery, the charging circuit includes: a switching element connected to a power supply; a pulse width controller configured to control open and close of the switching element; and a MOSFET arranged between the switching element and the rechargeable battery. The charging circuit may further include a thermistor connected between a gate and a source of the MOSFET.Type: ApplicationFiled: October 22, 2014Publication date: April 30, 2015Applicants: YOKOGAWA ELECTRIC CORPORATION, YOKOGAWA METERS & INSTRUMENTS CORPORATIONInventors: Masashi OOMIYA, Moritoshi KOMAMAKI
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Publication number: 20150057977Abstract: An optical measuring apparatus includes a measuring device configured to measure, by a shot unit, data in a predetermined wavelength range, a controller configured to analyze the measured data, a storage storing the measured data of a plurality of shots and the analysis results of the measured data, and a display configured to display the analysis results and waveform data based on the measured data on a single display screen.Type: ApplicationFiled: August 19, 2014Publication date: February 26, 2015Applicants: YOKOGAWA METERS & INSTRUMENTS CORPORATION, YOKOGAWA ELECTRIC CORPORATIONInventor: Gentaro ISHIHARA
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Publication number: 20140125984Abstract: An optical wavelength meter includes: an interferometer; a reference optical source unit with a laser configured to oscillate in a multi-longitudinal mode; and a signal processor configured to calculate a wavelength of a input beam with reference to interference fringe information of reference beam and interference fringe information of the input beam obtained from the interferometer.Type: ApplicationFiled: November 1, 2013Publication date: May 8, 2014Applicants: Yokogawa Meters & Instruments Corporation, Yokogawa Electric CorporationInventors: Toshikazu YAMAMOTO, Manabu KOJIMA