Patents Assigned to Yokogawa Meters & Instruments Corporation
  • OPTICAL WAVELENGTH METER
    Publication number: 20140125984
    Abstract: An optical wavelength meter includes: an interferometer; a reference optical source unit with a laser configured to oscillate in a multi-longitudinal mode; and a signal processor configured to calculate a wavelength of a input beam with reference to interference fringe information of reference beam and interference fringe information of the input beam obtained from the interferometer.
    Type: Application
    Filed: November 1, 2013
    Publication date: May 8, 2014
    Applicants: Yokogawa Meters & Instruments Corporation, Yokogawa Electric Corporation
    Inventors: Toshikazu YAMAMOTO, Manabu KOJIMA