Patents Assigned to YXLON International GmbH
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Patent number: 11651482Abstract: Method for obtaining at least one significant feature in a series of components of the same type on the basis of data sets by non-destructive testing. The method includes examining a classified random sample of components which have a known production sequence, by a non-destructive testing. A three-dimensional data set for each component is obtained, and components of the sample are divided by good and rejected parts. Defect-free component regions from all of the components of the random sample are extracted. At least one feature which is characteristic of the type of component and production process which, over a predetermined time of component production, exhibits considerable characteristic differences between the good and rejected parts is determined. The determination can be accomplished using neural networks, machine learning approaches, or statistics from the field of data analytics. The at least one feature and its characteristic is defined as a trained classifier.Type: GrantFiled: April 16, 2019Date of Patent: May 16, 2023Assignee: YXLON INTERNATIONAL GMBHInventors: Thomas Wenzel, Jeremy Simon
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Patent number: 10964073Abstract: A method for the reconstruction of a test part in an X-ray CT method in an X-ray CT system, which has an X-ray with a focus, an X-ray detector, and a manipulator which moves the test part within the X-ray CT system. To generate recordings of the test part in various positions, the manipulator travels a predefinable parameterizable path-curve and makes recordings at triggered positions. For each recording, the position of the manipulator is determined and the respective associated projective geometry is calculated. Thereafter, a further path curve is followed having different parameters from the preceding path curve. The path curve is determined iteratively by means of an optimization algorithm, at the value of which the quality function is minimal. For each test part, a CT reconstruction is carried out by means of a suitable algorithm with reference to the allocation of the individual recordings to the respective projective geometry.Type: GrantFiled: February 3, 2017Date of Patent: March 30, 2021Assignee: YXLON INTERNATIONAL GMBHInventors: Frank Herold, Philipp Klein, Sarajaddin Rahmani
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Patent number: 10840053Abstract: A receptacle for receiving a plug connector of a high-voltage cable for a microfocus X-ray tube with a cathode, which has a metal filament and grid cap. The receptacle has a ceramic insulator with three contiguous cavities. The first cavity near the filament includes electrical contacts for the filament and the grid cap. The second cavity includes spring contacts for supplying current to the filament and a center pin for supplying voltage to the grid. The third cavity receives the plug connector. The insulator has a removable grid mounting which is conductively connected to the grid cap of the cathode. The first and second cavities are surrounded in the radial direction by the grid mounting. An air gap extends radially between grid mounting and ceramic body. At the end of the grid mounting remote from the filament is a circumferential groove in the axial direction between the grid mounting and the ceramic insulator.Type: GrantFiled: March 15, 2018Date of Patent: November 17, 2020Assignee: YXLON INTERNATIONAL GMBHInventors: Lothar Schultheis, Bjoern Schrader
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Patent number: 10825162Abstract: Method for obtaining information from short-fibre-reinforced plastic components sequentially produced by an X-ray computed tomography. A learning phase includes: generating CT data sets for a random sample of plastic components from a production process; extracting at least one defect-free region of the plastic components; determining characteristic feature(s) in the extracted regions, relevance of individual features, and regions which are characteristic of the plastic component type and production process thereof, over a predetermined period of the plastic components productions, which exhibit considerable characteristic differences between good parts and reject parts; and defining the feature(s) with its characteristic as trained classifier.Type: GrantFiled: April 16, 2019Date of Patent: November 3, 2020Assignee: YXLON INTERNATIONAL GMBHInventors: Thomas Wenzel, Jeremy Simon
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Patent number: 10739279Abstract: A method for checking the location of elements in a tire in an X-ray inspection system. The X-ray inspection system has an X-ray tube, a linear X-ray detector and a manipulator. The method includes: using a three-dimensional model of the tire, in which potential locations of the elements in the tire are described; recording two-dimensional X-ray line images of the tire elements consisting of pixels, which are described by a vector from the X-ray tube through the element to the X-ray detector; allocation of the pixels of an element from the two-dimensional X-ray line image to the three-dimensional model of the tire, in that the intersection point of a straight line through the X-ray tube with the vector of the pixel from the two-dimensional X-ray line image is assigned with the potential location of the element of the three-dimensional model as a point in the space for the pixel.Type: GrantFiled: April 26, 2018Date of Patent: August 11, 2020Assignee: YXLON INTERNATIONAL GMBHInventor: Karsten Koch
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Patent number: 10712291Abstract: To compensate for artifacts in a visual display, a detector is provided having a first sensor element (2a, 2a?, 2a?, 2a??) including a plurality of first pixel elements (7a, 8a) arranged linearly one behind another, and a second sensor element (2b, 2b?, 2b?, 2b??) having a plurality of second pixel elements (7b, 8b) arranged linearly one behind another. Edge pixel elements (8a, 8b), which are arranged linearly one behind another and in line with the first and second central pixel elements (7a, 7b), are provided in a gap between the closest-together first and second central pixel elements (7a, 7b) of the first and second sensor elements (2a, 2a?, 2a?, 2a??, 2b, 2b?, 2b?, 2b??) arranged next to one another. The edge pixel elements (8a, 8b) have a width that is less than first and second widths of the respective first and second central pixel elements (7a, 7b).Type: GrantFiled: October 11, 2018Date of Patent: July 14, 2020Assignee: YXLON INTERNATIONAL GMBHInventor: Klaus Bavendiek
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Patent number: 10571413Abstract: The invention relates to a method for testing an electronic component for defects, by examining the electronic component in a production line by means of automatic optical inspection; determining the coordinates of regions in which an examination using automatic optical inspection is not possible; transmitting the coordinates of these regions from the production line to a computer; transporting the electronic component from the production line into an X-ray device which is arranged outside the production line, for non-destructive material testing; transmitting the coordinates of the regions from the computer to this X-ray device; examining the electronic component by means of the X-ray device only in the regions in which an examination using automatic optical inspection is not possible; transmitting the results of the examination in the X-ray device to the computer; returning the electronic component to the production line if the result indicates that it is not defective.Type: GrantFiled: April 14, 2016Date of Patent: February 25, 2020Assignee: YXLON INTERNATIONAL GMBHInventors: Keith Bryant, Bernhard Murkens, Mathias Wientapper
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Patent number: 10504633Abstract: A diaphragm for restricting a cross section of an electron beam of an X-ray tube includes a base body made of a first material, which has a first cylindrical or conical diaphragm aperture, and an additional body made of a second material, which has a second cylindrical or conical diaphragm aperture. The additional body in the installed state is arranged on the side near the electron source, wherein the atomic number of the first material is greater than the atomic number of the second material. The diameters of the diaphragm apertures at the end far from the electron source are not smaller than at the end near the electron source, and the second diaphragm aperture at its end far from the electron source lies completely inside the first diaphragm aperture at its end near the electron source.Type: GrantFiled: November 17, 2017Date of Patent: December 10, 2019Assignee: YXLON International GmbHInventor: André Schu
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Patent number: 10495586Abstract: The invention relates to a device for non-destructively material testing objects, in particular rims and wheels (12), comprising an X-ray inspection cabin (14) which contains an X-ray inspection device (28) for X-raying the objects and comprising conveyor devices (34, 36, 56, 68, 98) for conveying objects through at least one lock (20, 22) into the X-ray inspection cabin (14) and out of the X-ray inspection cabin (14). The aim of the invention is to prevent a leakage of X-rays into the surrounding area through the lock (20, 22) and to reduce the quantity of lead needed for shielding and optionally the space requirement of the device (10).Type: GrantFiled: August 29, 2016Date of Patent: December 3, 2019Assignee: YXLON INTERNATIONAL GMBHInventors: Frank Bogumil, Reinhard Krüger, Joscha Malin, Jürgen Melchert, Florian Freiherr Von Oldershausen, Erhard Ottens, Heiko Schlüter
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Patent number: 10209204Abstract: An X-ray inspection system includes an X-ray source and a detector. A rotary table is arranged between the X-ray source and the detector. The rotary table is configured to secure a test object on the rotary table. The rotary table is arranged on a positioning table. The positioning table is configured to move parallel to an xy-plane between the X-ray source and the detector. The xy-plane is perpendicular to a surface of the detector extending parallel to the xz-plane and the rotary table is configured to rotate about a z-axis.Type: GrantFiled: October 21, 2014Date of Patent: February 19, 2019Assignee: YXLON INTERNATIONAL GMBHInventors: Andreas Mecke, Jan Spalding, Axel Klein
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Publication number: 20180136145Abstract: The invention relates to a method for testing an electronic component for defects, by examining the electronic component in a production line by means of automatic optical inspection; determining the coordinates of regions in which an examination using automatic optical inspection is not possible; transmitting the coordinates of these regions from the production line to a computer; transporting the electronic component from the production line into an X-ray device which is arranged outside the production line, for non-destructive material testing; transmitting the coordinates of the regions from the computer to this X-ray device; examining the electronic component by means of the X-ray device only in the regions in which an examination using automatic optical inspection is not possible; transmitting the results of the examination in the X-ray device to the computer; returning the electronic component to the production line if the result indicates that it is not defective.Type: ApplicationFiled: April 14, 2016Publication date: May 17, 2018Applicant: Yxlon International GMBHInventors: Keith BRYANT, Bernhard MURKENS, Mathias WIENTAPPER
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Patent number: 9772259Abstract: A method for calibrating an X-ray inspection system for a tire. The X-ray inspection system includes an X-ray tube, a linear X-ray detector, and a manipulator for the tire. The method includes moving one of the X-ray tube, the linear X-ray detector, and the manipulator along a travel path from a set starting position to a set end position, capturing, at a preset reading rate during the movement of one of the X-ray tube, the linear X-ray detector, and the manipulator, a continuous capture of X-ray radiography images of a cord within the tire, tracking the cord using successive X-ray radiography images, and deducing an absolute position of the cord using a total shift of the cord in the X-ray radiography images between the starting position and the end position and using known geometric data.Type: GrantFiled: January 28, 2014Date of Patent: September 26, 2017Assignee: YXLON INTERNATIONAL GMBHInventors: Juergen Melchert, Klaus Bavendiek
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Patent number: 9372270Abstract: An X-ray line detector includes a housing and a predefined number of carrier modules having the same width disposed in the housing. A one-piece printed circuit board, on which a photodiode is arranged, is attached to each carrier module. Each printed circuit board is wider than an active area of pixels constituting the photodiode and ascintillator element is attached to each photodiode. Each scintillator element has a length that exactly covers the active area in the width thereof plus an interspace between two adjacent pixels of a photodiode. The width of each carrier module is at most twice as great as the length of a scintillator element. The carrier modules are arranged in two rows in the housing such that the photodiodes of each row are opposite each other, the scintillator elements abut against each other upon contact, and mutually contacting scintillator elements are arranged in respectively opposite rows.Type: GrantFiled: January 28, 2014Date of Patent: June 21, 2016Assignee: YXLON International GmbHInventor: Klaus Bavendiek
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Patent number: 9322936Abstract: An X-ray line detector includes a housing having an upper part a lower part and a linear inlet slot for X-ray radiation to be detected. At least one detector element including a plurality of linearly arranged photodiodes is disposed opposite the inlet slot. Each photodiode is arranged on a printed circuit board mounted on a base carrier disposed in the housing. Each photodiode has a multiplicity of pixels including respective active areas of equal width arranged equidistantly in relation to each other with distances between the active areas being equidistant. Adjacent printed circuit boards are spaced apart from each other at a distance such that edge pixels on the respective adjacent printed circuit boards are disposed at a distance from one another corresponding to a sum of the width of the active area of a pixel and twice the distance between adjacent pixels of a photodiode.Type: GrantFiled: December 27, 2013Date of Patent: April 26, 2016Assignee: Yxlon International GmbHInventor: Klaus Bavendiek
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Patent number: 9322789Abstract: A method is provided for feeding-in X-ray fluoroscopy images of an object in the context of a digital laminography technique, in which the X-ray fluoroscopy images are not fed in at 360°, but a feed-in of first X-ray fluoroscopy images takes place at 180° and, after tilting the object, a feed-in of second X-ray fluoroscopy images follows in the same angular range of 180°. The second X-ray fluoroscopy images, after suitable reflection onto the complementary points, are set to the first X-ray fluoroscopy images and, from the resultant complete data set, a calculation is carried out in the context of the digital laminography technique. A multiaxis manipulator system is used for feeding-in X-ray fluoroscopy images in the context of carrying out a digital laminography technique on an object, which is secured on a fixing device of the manipulator system.Type: GrantFiled: July 5, 2013Date of Patent: April 26, 2016Assignee: YXLON INTERNATIONAL GMBHInventor: Martin Muenker
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Patent number: 8774349Abstract: A device for the non-destructive testing of cylindrical or tubular test objects using X-radiation in tomosynthesis or laminography includes a mounting device configured to be spatially fixed at a predetermined site, a carriage attached to the mounting device and movable on a guide device in a first direction parallel to an X-axis and a C-arm disposed on the carriage. An X-ray tube and a detector are disposed opposite one another on the C-arm. The X-ray tube is movable in a second direction that is perpendicular to the X-axis, perpendicular to a plane covered by the C-arm, and parallel to a Y-axis. The detector is movable in a third direction parallel to the second direction. The C-arm may alternatively be replaced by a half shell.Type: GrantFiled: December 21, 2009Date of Patent: July 8, 2014Assignee: Yxlon International GmbHInventors: Martin Muenker, Oliver Rokitta
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Publication number: 20140132352Abstract: The invention relates to a high frequency power multiplier solution which enables multiple coupled high frequency power amplifier assemblies to be interconnected for adding individual powers thus avoiding the need of otherwise conventional and functionally complex functional groups of a power combiner.Type: ApplicationFiled: January 17, 2012Publication date: May 15, 2014Applicant: YXLON International GmbHInventor: Ulrich Hansen
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Patent number: 8437447Abstract: A laminography system includes a first linear guide defining a z-direction of a Cartesian coordinate system and an imaging radiation source fixable to the first linear guide and movable along the first linear guide. The radiation source is configured to form a cone of rays including a central ray defining a y-axis of the Cartesian coordinate system. A detector is disposed in a position so as to be struck at a center thereof by the central ray of the radiation source substantially in an x-direction of the Cartesian coordinate system. The system also includes a first rotation device configured to rotate the detector about a first axis of rotation that is parallel to a z-axis of the Cartesian coordinate system and that passes through an intersection of the central array and the detector. The detector is fixable to a second linear guide and is movable on the second linear guide along the first axis of rotation. An object slide is disposed between the radiation source and the detector.Type: GrantFiled: March 7, 2011Date of Patent: May 7, 2013Assignee: YXLON International GmbHInventor: Martin Muenker
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Patent number: 8360640Abstract: The invention relates to an X-ray tube, especially a microfocus X-ray tube (2), comprising means (18) for orienting an electron beam (10) towards a target (4). A control device (20) is used to control the means for orienting the electron beam (10) towards the target (4) in such a way that the electron beam (10) scans the target (4), in addition to a measuring device (22) for measuring the intensity of the target current which flows to different scanning sites when the target (4) is scanned by the electron beam (10), or a measuring variable dependent on the target current, and an evaluation device (24) for associating each measured value of the target flow with the corresponding scanning site. Said X-ray tube enables the easy and economical implementation of a method for checking the operability of the target (4).Type: GrantFiled: December 28, 2007Date of Patent: January 29, 2013Assignee: YXLON International GmbHInventor: Alfred Reinhold
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Publication number: 20120137468Abstract: A handle for a housing of a portable X-ray device includes an annular base body. The annular base body includes a holding part and a mounting part. A mounting device is disposed in the mounting part and includes two wheels spaced apart from one another on a common axle and a recess between the two wheels, wherein the two wheels protrude beyond an outer contour of the annular base body. Connecting straps are disposed on the holding part and configured to connect the annular base body to the housing.Type: ApplicationFiled: August 5, 2010Publication date: June 7, 2012Applicant: YXLON INTERNATIONAL GMBHInventors: Jan Bressendorff, Casper Lindskov Hansen, Per Buchard Jorgensen