Patents Assigned to Zehntel Incorporation
  • In-circuit testing system
    Patent number: 4791356
    Abstract: An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform to restimulate the same device in a subsequent in-circuit test.
    Type: Grant
    Filed: September 19, 1986
    Date of Patent: December 13, 1988
    Assignee: Zehntel Incorporation
    Inventors: Frederick E. Warren, Harvey B. Crisler, Robert G. Jacobson, Chang H. Kim, Edward C. Llewellyn