Abstract: A system and method of calibrating and measuring optical properties of an imaging optical device is disclosed in which a structure of uniformly periodic linear elements is imaged using the optical device being calibrated. This image is obtained with the optical axis of the device at an angle ? with respect to a normal to the uniformly periodic structure. This is done by situating the linear elements on the hypotenuse of a wedge, i.e., a right-angled triangular prism. The image is then taken with the optical axis of the optical device oriented vertically. An advantage of the arrangement is that the structure of uniformly periodic linear elements does not need to be carefully focused making the system quick and easy to implement.

Abstract: A system and method of calibrating and measuring optical properties of an imaging optical device is disclosed in which a structure of uniformly periodic linear elements is imaged using the optical device being calibrated. This image is obtained with the optical axis of the device at an angle ? with respect to a normal to the uniformly periodic structure. This is done by situating the linear elements on the hypotenuse of a wedge, i.e., a right-angled triangular prism. The image is then taken with the optical axis of the optical device oriented vertically. An advantage of the arrangement is that the structure of uniformly periodic linear elements does not need to be carefully focused making the system quick and easy to implement.