Patents Assigned to Zetec, Inc.
  • Patent number: 11499940
    Abstract: An eddy current instrument for non-destructive testing of a tubular metallic object, the instrument comprising a probe head with probe coils and probe coil signal conditioning and analog to digital conversion electronics and a probe connector module with a processor and probe coil excitation signal generation electronics. The probe connector processor is configured to interface to an external computing device, which may be a personal computer. The probe head and probe connector module may be connected by a rigid shaft or by a flexible coupling.
    Type: Grant
    Filed: January 17, 2020
    Date of Patent: November 15, 2022
    Assignee: Zetec, Inc.
    Inventor: Tom O'Dell
  • Patent number: 11499941
    Abstract: A flexible eddy current probe for non-destructive testing of a metallic object may include one or more plus-point coils and a flexible printed circuit having first and second parallel sides, third and fourth parallel sides, and a number of adjacent strips. The strips have first and second ends that are contiguous with the first and second parallel sides, respectively. Each of the strips may contain a pair of coils oriented along the length of the strip, a first coil being proximate to the first end and a second coil being proximate to the second end, and each of the coils is configured to excite an eddy current in the metal object or to sense an eddy current. Each of the strips may also be independently flexible from one another. The eddy current sensor array is configured to be scanned over the metal object.
    Type: Grant
    Filed: December 11, 2019
    Date of Patent: November 15, 2022
    Assignee: Zetec, Inc.
    Inventors: Steve Timm, Evan Lloyd, Tom O'Dell, Bill Ziegenhagen, Evans Nguyen
  • Patent number: 10921287
    Abstract: A drive coil assembly to generate a specific spatial distribution of eddy currents within the walls of a conductive tube or pipe, which may be used in conjunction with a separate array of magnetic sensors to detect defects in the tubing wall. The drive coil assembly comprises a plurality of coils which are generally wrapped around the circumference of a cylindrical probe body, but which are further shaped with serpentine undulation in the axial direction. The undulation is characterized by a spatial amplitude, a spatial phase and a spatial frequency; typically, the spatial frequency results in an integer number of undulations around the circumference of the drive coil and the phase is chosen to uniformly distribute the lobes about the circumference. The temporal phase of the electrical current in each coil is chosen to null out net current of the assembly around the circumference.
    Type: Grant
    Filed: July 27, 2016
    Date of Patent: February 16, 2021
    Assignee: ZETEC, INC.
    Inventor: Noa M. Rensing
  • Patent number: 10866213
    Abstract: A flexible eddy current probe for non-destructive testing of a metallic object, the probe having a flexible printed circuit containing eddy current drive and sense coils and a rotary encoder configured to measure liner distance as the eddy current probe is scanned over the object. The probe features an encoder arm that adjustably connects a flexible eddy current sensor array to the rotary encoder.
    Type: Grant
    Filed: October 26, 2018
    Date of Patent: December 15, 2020
    Assignee: Zetec, Inc.
    Inventor: William Oren Wekell
  • Patent number: 10295503
    Abstract: A system for displaying an area covered in a non-destructive scan of an area larger than the test probe is disclosed. Position encoders are included on the test probe to track the motion of the probe and to provide a record of the portion of the area under test that has been covered by the probe.
    Type: Grant
    Filed: October 15, 2015
    Date of Patent: May 21, 2019
    Assignee: ZETEC, INC.
    Inventors: Laurent Enenkel, Frederic Morrow, Alexandre Charlebois, Martin Garneau, Stephane Turgeon
  • Patent number: 9784715
    Abstract: A device and method of eddy current based nondestructive testing of tubular structures made of electrically conductive materials is disclosed. The device includes a plurality of excitation electromagnets having an axis of symmetry and magnetoresistive sensors having an easy axis for magnetic field sensing; wherein the magnetoresistive sensors are arranged in a circular array on a single plane with the easy axis aligned radially with respect to the circular pattern and wherein the electromagnets are arranged in a circular pattern on both sides of the plane with their axes of symmetry being arranged parallel to the plane and orthogonal to radii of the circular pattern on which the electromagnets are placed.
    Type: Grant
    Filed: April 17, 2014
    Date of Patent: October 10, 2017
    Assignee: ZETEC, INC.
    Inventors: Jevne Branden Micheau-Cunningham, Jeffrey Raymond Gueble, William Frederick Ziegenhagen, Stephen Timm, Paubla Mejia Tarango
  • Patent number: 9267921
    Abstract: A rotating field eddy current probe for sensing flaws in electrically conductive tubing is disclosed. The probe includes two stimulation coils physically arranged at 90 degrees to each other about an axis a current sensing portion. The a first alternating current is applied to one of the stimulation coils at a first phase and a second alternating current is applied to the second of the stimulation coils at a second phase, said second phase being electrically 90 degrees apart from said first phase and creating a rotating oscillating magnetic field.
    Type: Grant
    Filed: June 29, 2012
    Date of Patent: February 23, 2016
    Assignee: Zetec, Inc.
    Inventors: Jevne Branden Michaeu-Cunningham, Anil Sood, Steve Timm, William Ziegenhagen, Pauline Tarango
  • Publication number: 20140312891
    Abstract: A device and method of eddy current based nondestructive testing of tubular structures made of electrically conductive materials is disclosed. The device includes a plurality of excitation electromagnets having an axis of symmetry and magnetoresistive sensors having an easy axis for magnetic field sensing; wherein the magnetoresistive sensors are arranged in a circular array on a single plane with the easy axis aligned radially with respect to the circular pattern and wherein the electromagnets are arranged in a circular pattern on both sides of the plane with their axes of symmetry being arranged parallel to the plane and orthogonal to radii of the circular pattern on which the electromagnets are placed.
    Type: Application
    Filed: April 17, 2014
    Publication date: October 23, 2014
    Applicant: Zetec, Inc.
    Inventors: Jevne Branden Micheau-Cunningham, Jeffrey Raymond Gueble, William Frederick Ziegenhagen, Stephen Timm, Paubla Mejia Tarango
  • Patent number: 8738339
    Abstract: A method of establishing position dependent focal laws and dynamically accessing these focal laws during inspection is disclosed comprising the steps of partitioning a CAD model into distinct geometric regions prior to inspection, generating a dedicated set of focal laws for each of the geometric regions, and associating each position of the scanner with one of the geometric regions. A method of compressing an A-Scan using a windowing technique is also disclosed. Additionally, methods for computing and displaying volumetric slices in real-time are disclosed. Finally, a method of firing multiple probes at different firing frequencies is disclosed, as well as a multi-probe inspection system that enables parallel firing.
    Type: Grant
    Filed: October 5, 2009
    Date of Patent: May 27, 2014
    Assignee: Zetec, Inc.
    Inventors: Daniel Richard, Dirk Verspeelt, Frederic Morrow, Guy Maes, Jean-Francois Tremblay, Martin Garneau, Stephane Turgeon, Alexandre Charlebois
  • Publication number: 20140012521
    Abstract: A method of analyzing historic and current eddy current test probe data is disclosed. The method takes into account that the two data sets of data may not be an exact match in acquisition technique based on factors such as probe pull speed, direction, record leg or instrument configuration. The method includes the steps of aligning a first set of eddy current data to a second set of eddy current data based on prominent features found in both data sets; converting the first set of eddy current data to a modified first set of eddy current data to match the second set of operating conditions and; comparing the modified first set and the second set to find change over time.
    Type: Application
    Filed: July 6, 2012
    Publication date: January 9, 2014
    Applicant: ZETEC, INC.
    Inventor: Jeff Strizzi
  • Publication number: 20140002070
    Abstract: A rotating field eddy current probe for sensing flaws in electrically conductive tubing is disclosed. The probe includes two stimulation coils physically arranged at 90 degrees to each other about an axis a current sensing portion. The a first alternating current is applied to one of the stimulation coils at a first phase and a second alternating current is applied to the second of the stimulation coils at a second phase, said second phase being electrically 90 degrees apart from said first phase and creating a rotating oscillating magnetic field.
    Type: Application
    Filed: June 29, 2012
    Publication date: January 2, 2014
    Applicant: Zetec, Inc.
    Inventors: Jevne Branden Michaeu-Cunningham, Anil Sood, Steve Timm, William Ziegenhagen, Pauline Tarango
  • Patent number: 8386404
    Abstract: A system and method for precisely detecting tubing flaws using a computer architecture that combines scalable processing power with an extensible array of detection and classification possibilities involving eddy current data analysis, as well as detection algorithms for pinpointing exact tubing regions and wherein these regions can be further divided into manageable segments for flaw analysis. Multiple classification tools utilized to discriminate detection and to precisely assign proper report codes to detect flaws repeatedly and accurately.
    Type: Grant
    Filed: January 19, 2010
    Date of Patent: February 26, 2013
    Assignee: Zetec, Inc.
    Inventors: Jeff Strizzi, Tom Matelich
  • Publication number: 20100185576
    Abstract: A system and method for precisely detecting tubing flaws using a computer architecture that combines scalable processing power with an extensible array of detection and classification possibilities involving eddy current data analysis, as well as detection algorithms for pinpointing exact tubing regions and wherein these regions can be further divided into manageable segments for flaw analysis. Multiple classification tools utilized to discriminate detection and to precisely assign proper report codes to detect flaws repeatedly and accurately.
    Type: Application
    Filed: January 19, 2010
    Publication date: July 22, 2010
    Applicant: ZETEC, INC.
    Inventors: Jeff Strizzi, Tom Matelich
  • Publication number: 20100181791
    Abstract: An apparatus for automated inspection and repair of a tube sheet. The apparatus has a rotating gripper pod, comprising at least one tube gripper, a sliding body portion containing the gripper pod; a housing portion comprising at least one tube gripper and a tool head coupling. The tool head coupling swapably attaches to a eddy current test probe and at least one kind of tube repair tool. Novel, auto-locking tube grippers are also disclosed. A serial bus connects electronic modules within the apparatus and also connects the apparatus to an external controller.
    Type: Application
    Filed: January 14, 2010
    Publication date: July 22, 2010
    Applicant: Zetec, Inc.
    Inventor: Thomas O'Dell
  • Patent number: 7109704
    Abstract: A flexible shaft of nonrigid components for use in pushing an eddy current probe through small diameter pipe bends includes a thin-walled flexible outer sleeve enclosing a data cable helically coiled around a central inner core, typically of braided wire. The inner core is functionally incompressible and inextensible to sustain compressive forces derived from pushing the shaft through a pipe. The outer sleeve supported from within by the data cable and the inner core for sustaining lateral forces of pusher rollers is longitudinally even and smooth to advance the shaft without damage to it.
    Type: Grant
    Filed: March 11, 2005
    Date of Patent: September 19, 2006
    Assignee: Zetec, Inc.
    Inventor: Christopher R Loud
  • Patent number: 6923078
    Abstract: In an eddy current probe shaft, a sleeve encloses an inner core of length shorter than the sleeve causing the inner core to curl within sleeve. The inner core includes data cables that typically comprise coaxial cables to which the sleeve is attached at shaft lead and trail ends. The shaft is assembled by stretching the sleeve over the inner core and securing the stretched sleeve to the inner core, the sleeve causing the inner core to curl as the sleeve returns to its unstretched length. Slack thus produced in the inner core, and particularly in the coaxial cables, allows the probe to bend without stressing the coaxial cables and without two coaxial cables within the sleeve moving relative to each other therein eliminating signal drift phenomenon caused by a change in capacitance characteristics of the coaxial cables when insulation of the coaxial cables stretch upon bending.
    Type: Grant
    Filed: December 17, 2002
    Date of Patent: August 2, 2005
    Assignee: Zetec, Inc.
    Inventor: Christopher R. Loud
  • Patent number: 6809671
    Abstract: A digital synthesizer generates an electrical digital carrier that is converted to analog and driven a probe coil to generate an electromagnetic wave propagated into a test material proximate the probe coil. A return electromagnetic wave generated by eddy currents in the material includes signatures of material defects modulated on the return carrier electromagnetic wave. The return wave is detected by one or more probe coils and amplified. A second amplifier is applied selectively amplifying the signal in segments such that each segment exploits the input range of the analog to digital converter. The signal is then converted from an analog signal to a digital signal and then digitally mixed with digital sine and cosine functions also generated by the digital synthesizer to yield sum and difference values. A gain scaling stage then trims the signal to overcome circuit imprecision such that the amplification in each respective segment is a power of two.
    Type: Grant
    Filed: March 26, 2004
    Date of Patent: October 26, 2004
    Assignee: Zetec, Inc.
    Inventor: Estell Lopez
  • Patent number: 6798197
    Abstract: A method and apparatus of a digital synthesizer generating an electrical digital carrier that is converted to analog and driven a probe coil to generate an electromagnetic wave propagated into a test material proximate the probe coil. A return electromagnetic wave generated by eddy currents in the material includes signatures of material defects modulated on the return carrier electromagnetic wave. The return wave is detected by one or more probe coils and amplified. A second amplifier is applied selectively amplifying the signal in segments such that each segment exploits the input range of the analog to digital converter. The signal is then converted from an analog signal to a digital signal and then digitally mixed with digital sine and cosine functions also generated by the digital synthesizer to yield sum and difference values. A gain scaling stage then trims the signal to overcome circuit imprecision such that the amplification in each respective segment is a power of two.
    Type: Grant
    Filed: October 8, 2002
    Date of Patent: September 28, 2004
    Assignee: Zetec, Inc.
    Inventor: Estell Lopez
  • Patent number: 6734669
    Abstract: A digital synthesizer generates an electrical digital carrier that drives probe coil to generate an electromagnetic wave propagated into a test material proximate the probe coil. A return electromagnetic wave generated by eddy currents in the material includes signatures of material defects modulated on the return carrier electromagnetic wave. The return wave is detected by one or more probe coils, amplified, converted from an analog signal to a digital signal and then digitally mixed with digital sine and cosine functions also generated by the digital synthesizer to yield sum and difference values, mathematically expressing various eddy current signals received by the probe in a complete set of orthogonal functions. A low pass filter then removes all but the difference values. A direct current reference component is subtracted from the mixed digital signal, which translates the signal to center about a zero axis for ease of display and analysis.
    Type: Grant
    Filed: June 11, 2002
    Date of Patent: May 11, 2004
    Assignee: Zetec, Inc
    Inventor: Estell Lopez
  • Patent number: 6734668
    Abstract: An eddy current probe comprising two solenoid coils wound around a common rectangular wafer base of high permeability material extending beyond the coils at wafer corners with the wafer becoming the solenoid core. Posts also of high permeability material depend from a wafer front at its corners with coils crossing orthogonally on the wafer. The coils are connected to alternating current to produce magnetic fields that have like magnetic poles at wafer corners diagonally opposed across the wafer, the coils switching in phase to alternate the magnetic field between posts at base diagonal corners. With the posts at the wafer base corners, the combined magnetic fields generated from the orthogonal coils conduct through the posts and emanate from post ends. The post ends have a curvature matching that of a material to be tested for better coupling the magnetic field into the material.
    Type: Grant
    Filed: October 2, 2002
    Date of Patent: May 11, 2004
    Assignee: Zetec, Inc.
    Inventors: Christopher Hils, David Jonathan Brown