Abstract: Aspects of the subject disclosure may include, for example, an IoT device inspection method, and a device therefor. An analysis server transmits an information collection module to an IoT device, collects state information about the IoT device through the information collection module, and searches, on the basis of the state information, for a database including information related to weaknesses, so as to analyze weaknesses of the IoT device. Other embodiments are disclosed.
Type:
Application
Filed:
April 26, 2024
Publication date:
September 5, 2024
Applicant:
ZIEN INC.
Inventors:
Young Min CHO, Min Kyeong Son, Min Soo Eun