Patents Assigned to Zumbach Electronic AG
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Publication number: 20230334731Abstract: Method for rectifying images of an elongated, preferably translucent, object generated by means of an optical coherence tomography method having the following steps: a capturing step, in which at least one region of the object is captured in at least one first orientation (?1) in a first image and in at least one second, different, orientation (?2) in a second image, preferably by an optical coherence tomography method; and a determination step, wherein corresponding reconstruction images (R1, R2) of the region are generated on the basis of the captured images, wherein at least one refractive index (n1, n2, n3) is determined, preferably iteratively, for each of a plurality of layers of the object on the basis of spatial, reconstruction deviations (?exy) between the first and second reconstruction images, a rectification step, wherein a rectified overall reconstruction image is calculated based on the determined refractive indices (n1, n2, n3).Type: ApplicationFiled: April 20, 2021Publication date: October 19, 2023Applicant: ZUMBACH ELECTRONIC AGInventor: Silvano BALEMI
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Patent number: 10232420Abstract: A method for determining the stamping quality of profiled bar includes steps of: a) upstream of the rolling stand performing shaping, the initial speed VA of the starting product is determined and the initial diameter DA or initial cross-sectional area FA are determined contactlessly. b) After the rolling stand, the final speed VE of the end product is measured and the diameter DE or area FE of a virtual enveloping shell for the end product is determined contactlessly. c) The diameter DN of a virtual, round end product is determined contactlessly as DN=square root of (DA2*VA/VE) and/or the average cross-sectional area FNE of the end product (2) is determined contactlessly as FNE=FA*VA/VE. d1) The characteristic stamping variable PKG is calculated, and the characteristic stamping variable PKG is compared with a pre-set setpoint value PKGset. A device for carrying out the method is also provided.Type: GrantFiled: May 9, 2014Date of Patent: March 19, 2019Assignee: ZUMBACH ELECTRONIC AGInventor: Urs Peter Studer
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Patent number: 8243284Abstract: A method for measuring the roundness profiles moved forward in longitudinal direction inside a rolling mill, using two laser scanners, respectively provided with a light-sensitive sensor and a laser. At least three shadow edges that fit against the round profile to be measured and enclose the round profile to form a polygon are generated and measured and the corresponding tangents are computed.Type: GrantFiled: April 1, 2008Date of Patent: August 14, 2012Assignee: Zumbach Electronic AGInventor: Urs-Peter Studer
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Publication number: 20100260380Abstract: A device for optically measuring and/or testing oblong products moving in a longitudinal direction. The device includes a plurality of cameras arranged in a plane perpendicular to the longitudinal direction, and distributed around the longitudinal direction. Each of the cameras has a fixed focus. The device further includes a displacing device adapted to displace each of the cameras simultaneously and jointly over the same distance toward the surface of the oblong product to focus on the oblong product, wherein the device defines a center that is located in the plane.Type: ApplicationFiled: October 23, 2008Publication date: October 14, 2010Applicant: Zumbach Electronic AGInventors: Beda Kaeser, Daniel Berard
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Publication number: 20100245843Abstract: A method for measuring the roundness profiles moved forward in longitudinal direction inside a rolling mill, using two laser scanners, respectively provided with a light-sensitive sensor and a laser. At least three shadow edges that fit against the round profile to be measured and enclose the round profile to form a polygon are generated and measured and the corresponding tangents are computed.Type: ApplicationFiled: April 1, 2008Publication date: September 30, 2010Applicant: ZUmbach Electronic AGInventor: Urs-Peter Studer
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Patent number: 7675631Abstract: A method of measuring a dimension and/or position of an object located in a measuring field, includes projecting a fan-shaped reference wave onto a holographic optical element having a first interference pattern and a second interference pattern; forming a first parallel partial wave front from the fan-shaped reference wave using the first interference pattern, the first parallel partial wave front entering the measuring field; and forming a second parallel partial wave front from the fan-shaped reference wave using the second interference pattern, the second parallel partial wave front entering the measuring field; wherein the measuring field is located behind the holographic optical element, and the first parallel partial wave front and the second parallel partial wave front intersect in the measuring field. A method of making a holographic optical element is also disclosed.Type: GrantFiled: December 27, 2007Date of Patent: March 9, 2010Assignee: Zumbach Electronic AGInventors: Urs-Peter Studer, Beda Kaeser
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Publication number: 20080186502Abstract: A method of measuring a dimension and/or position of an object located in a measuring field, includes projecting a fan-shaped reference wave onto a holographic optical element having a first interference pattern and a second interference pattern; forming a first parallel partial wave front from the fan-shaped reference wave using the first interference pattern, the first parallel partial wave front entering the measuring field; and forming a second parallel partial wave front from the fan-shaped reference wave using the second interference pattern, the second parallel partial wave front entering the measuring field; wherein the measuring field is located behind the holographic optical element, and the first parallel partial wave front and the second parallel partial wave front intersect in the measuring field. A method of making a holographic optical element is also disclosed.Type: ApplicationFiled: December 27, 2007Publication date: August 7, 2008Applicant: Zumbach Electronic AGInventors: Urs-Peter Studer, Beda Kaeser
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Patent number: 7201056Abstract: Provided is a device for measuring at least one parameter of an extruded flat conductor cable in a water bath that follows the extruder. The device distinguishes itself in that the flat conductor cable is guided with one of its flat sides essentially perpendicular across an ultrasonic head arranged in a water bath and that the ultrasonic head is a displaceable ultrasonic head that can be displaced crosswise to the longitudinal direction, or the ultrasonic head is a stationary ultrasonic element row that extends crosswise to the longitudinal direction of the flat conductor cable. This device allows measuring the total width of the flat conductor cable, such that different parameters can be determined.Type: GrantFiled: April 9, 2004Date of Patent: April 10, 2007Assignee: Zumbach Electronic AGInventors: Erhard Bracher, Frédéric Guerne
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Patent number: 7140253Abstract: A device is provided for the ultrasonic measuring of cylindrical test specimen, in particular tubes and hoses, wherein said device can be filled with water or submerged in a water bath and is provided with at least one ultrasonic measuring head secured on the device. The device is characterized by a cylindrical reference mandrel, the longitudinal axis of which at least essentially coincides with the measuring axis of the device, and at least one cylindrical auxiliary mandrel that extends parallel to the reference mandrel, can be moved to a position between the ultrasonic measuring head and the reference mandrel, and can also be removed from this position.Type: GrantFiled: June 21, 2004Date of Patent: November 28, 2006Assignee: Zumbach Electronic AGInventors: Hubert A. Merki, Sven Naegeli, James Daleo
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Patent number: 7068359Abstract: A contactless system for measuring centricity and diameter includes an optical measuring device for determining the external diameter and the position of a cable on an optical, perpendicular plane that runs transversally to the central axis Z of a measuring device. The cable has a conductor and a jacket that insulates the conductor and is pulled through the measuring device along the central axis Z. The system also includes an inductive measuring coil device for determining the position of the conductor on an inductive measuring plane, which is likewise perpendicular and runs transversally to the central axis Z of the measuring device. A correlation device correlate the position of the cable, determined by the optical measuring device with the position of the conductor calculated by the inductive measuring coil device and calculates the centricity of the conductor in the jacket from the correlation.Type: GrantFiled: March 1, 2003Date of Patent: June 27, 2006Assignee: Zumbach Electronic AGInventor: Urs-Peter Studer
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Publication number: 20040255677Abstract: A device is provided for the ultrasonic measuring of cylindrical test specimen, in particular tubes and hoses, wherein said device can be filled with water or submerged in a water bath and is provided with at least one ultrasonic measuring head secured on the device. The device is characterized by a cylindrical reference mandrel, the longitudinal axis of which at least essentially coincides with the measuring axis of the device, and at least one cylindrical auxiliary mandrel that extends parallel to the reference mandrel, can be moved to a position between the ultrasonic measuring head and the reference mandrel, and can also be removed from this position.Type: ApplicationFiled: June 21, 2004Publication date: December 23, 2004Applicant: ZUMBACH ELECTRONIC AGInventors: Hubert A. Merki, Sven Naegeli, James Daleo
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Publication number: 20040200285Abstract: Provided is a device for measuring at least one parameter of an extruded flat conductor cable in a water bath that follows the extruder. The device distinguishes itself in that the flat conductor cable is guided with one of its flat sides essentially perpendicular across an ultrasonic head arranged in a water bath and that the ultrasonic head is a displaceable ultrasonic head that can be displaced crosswise to the longitudinal direction, or the ultrasonic head is a stationary ultrasonic element row that extends crosswise to the longitudinal direction of the flat conductor cable. This device allows measuring the total width of the flat conductor cable, such that different parameters can be determined.Type: ApplicationFiled: April 9, 2004Publication date: October 14, 2004Applicant: Zumbach Electronic AGInventors: Erhard Bracher, Frederic Guerne
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Publication number: 20040109209Abstract: A holographic optical element is provided for measuring the dimension and position of an object with aid of a deflected laser beam generated by a monochromatic and coherent laser light source that sweeps across an angular range to produce a fan-shaped reference wave front. The element includes at least two interference patterns. Each interference pattern is created through simultaneous exposure of the element to the fan-shaped reference wave front generated by the monochromatic and coherent laser light source and a parallel partial wave front generated by the same monochromatic and coherent laser light source and hitting the element at a different angle than the reference wave front. The number of parallel partial wave fronts used for the exposure of the element corresponds to the number of interference patterns, and if the parallel partial wave fronts are virtually extended through the holographic optical element, they intersect behind the element in a center of a measuring field.Type: ApplicationFiled: December 4, 2003Publication date: June 10, 2004Applicant: Zumbach Electronic AGInventors: Urs-Peter Studer, Beda Kaser
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Patent number: 6678063Abstract: The invention relates to a method and an arrangement for optically detecting the measurements, in particular the diameters, of a long object during or after its production, which object moves forward continuously at high speed in lengthwise direction. With this method, one light beam intersects with the object at a measuring location at a flat angle (&agr;) and a second light beam intersects with the object at the same measuring location at a flat angle (&bgr;) and the shadows formed in the process are detected. The light beams are offset relative to each other in the cross-sectional plane that extends perpendicular to the longitudinal axis of the object by a specific angle (&ggr;), and the angle (&agr;) corresponds to the angle (&bgr;) and preferably measures 10 to 40°, in particular essentially 20°.Type: GrantFiled: June 5, 2001Date of Patent: January 13, 2004Assignee: Zumbach Electronic AGInventor: Emilio Serra
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Patent number: 5976449Abstract: A method and an apparatus for measuring an electric insulated conductor, in particular a medium-voltage and/or high-voltage insulated conductor, are proposed. Seen in profile cross-section, the insulated conductor (50) includes a copper conductor, an inner semiconductor, an insulation and an outer semiconductor and is produced in an extrusion device (90) having an appropriately assigned crosslinking section (40). To achieve an even distribution of the two semiconductor layers and of the insulation layer, the insulated conductor (50) is radiated through immediately at the outlet from the crosslinking section (40) and a correction of the die setting in the extrusion device is carried out by means of values thus determined.Type: GrantFiled: December 8, 1997Date of Patent: November 2, 1999Assignee: Zumbach Electronic AGInventors: Hannes Salzmann, Ulrich Jung, Wilfried Kotter
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Patent number: 5795531Abstract: A method and an apparatus for an exact measurement of the thickness of a plurality of individual semi-conductor and insulation layers and the determination of the centricity/eccentricity of a medium-voltage and/or high-voltage insulated conductor. The individual semi-conductor and insulation layers of the insulated conductor emerging from an extrusion device are penetrated with X-rays in at least two directions laying within a plane orthogonal to the axis of the insulated conductor. On carrying out a line-scan intensity detection of the X-rays having penetrated the insulated conductor, the thickness of the individual layers as well as the position of the conductor is computed. These values are compared with target ones, and, if necessary, the position of the extruder heads can be corrected accordingly.Type: GrantFiled: September 26, 1995Date of Patent: August 18, 1998Assignee: Zumbach Electronic AGInventors: Hannes Salzmann, Ulrich Jung, Wilfried Kotter
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Patent number: 5518681Abstract: A method and an apparatus for measuring an electric insulated conductor, in particular a medium-voltage and/or high-voltage insulated conductor, are proposed. Seen in profile cross-section, the insulated conductor (50) comprises a copper conductor, an inner semiconductor, an insulation and an outer semiconductor and is produced in an extrusion device (90) having an appropriately assigned crosslinking section (40). To achieve an even distribution of the two semiconductor layers and of the insulation layer, the insulated conductor (50) is radiated through immediately at the outlet from the crosslinking section (40) and a correction of the die setting in the extrusion device is carried out using the values thus determined.Type: GrantFiled: June 15, 1994Date of Patent: May 21, 1996Assignee: Zumbach Electronics AGInventors: Hannes Salzmann, Ulrich Jung, Wilfried Kotter
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Patent number: 5418616Abstract: Two optical windows serve for the passage of a light beam through a treatment chamber in which a product is disposed whose dimensions are to be detected. Between the treatment chamber and each one of the optical windows there is disposed a rotary valve, which permits the separation of the optical window from the treatment chamber. Thus it is possible to prevent a medium that adversely influences the optical windows in the treatment chamber from gaining access to the interior face of the windows if protection of the windows has priority over a measurement. It is thus possible to considerably extend the service life of the windows.Type: GrantFiled: May 25, 1993Date of Patent: May 23, 1995Assignee: Zumbach Electronic AGInventor: Guillermo Canales
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Patent number: 5383022Abstract: Laser beams from separate sources are deflected by a rotating mirror and travel over further mirrors and objective lenses into a measuring field for measuring the dimensions of an object 3 in the x and y directions. The result is a simple, compact configuration. The separate optical systems for both measuring directions can be set in an optimum manner independently of one another, permitting great precision. Thanks to an offset of the optical axis of the incident laser beams relative to the rotation axis of the mirror the measurements in the two directions are made staggered in time so that the measurement signals can be processed in a common measuring channel.Type: GrantFiled: April 6, 1993Date of Patent: January 17, 1995Assignee: Zumbach Electronic AGInventor: Beda Kaser
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Patent number: 5302904Abstract: A testing voltage of 800 to 5000 volts is applied to a measuring electrode constructed of carbon fiber brushes. This testing voltage is regulated to the desired value by means of a control circuit. Sparkover pulses travel through a filter to an output, with the response level of the testing voltage being regulated accordingly. Thus the test is reliable without highly electrically or mechanically stressing the test object.Type: GrantFiled: September 30, 1992Date of Patent: April 12, 1994Assignee: Zumbach Electronic AGInventor: Peter Nopper