Patents Examined by Afred E. Smith
  • Patent number: 4472826
    Abstract: In an X-ray examination apparatus comprising an image intensifier tube and an optical light distribution system there is included an image field selector, by means of which, using a subbeam diverted from the imaging beam, a measurement field can be selected and by means of which this measurement field or a boundary outline thereof can be projected back into the imaging radiation path. Thus, it is achieved that during an examination stage an indication of the extent and location of a measurement field which is considered to be relevant for controlling the desired exposure for pictures to be produced, can be constantly displayed on the image screen of the television monitor.
    Type: Grant
    Filed: February 22, 1983
    Date of Patent: September 18, 1984
    Assignee: U.S. Philips Corporation
    Inventor: Johannes T. A. van de Ven