Abstract: Disclosed is a spectroscopic device, system, and method for measuring the concentration of one or more molecular species of interest in a gas, liquid or solid sample, where the device may be portable, may be commercially manufactured, and/or may be adapted to existing systems and/or integrated with new systems to provide optical gas sensing for such systems. The disclosed devices, systems, and methods can be particularly useful in monitoring the purity of, e.g., a certain gas species, including determining whether a gas mixture contains certain gas species above a set concentration limit.

Abstract: Disclosed is a spectroscopic device, system, and method for measuring the concentration of one or more molecular species of interest in a gas, liquid or solid sample, where the device may be portable, may be commercially manufactured, and/or may be adapted to existing systems and/or integrated with new systems to provide optical gas sensing for such systems. The disclosed devices, systems, and methods can be particularly useful in monitoring the purity of, e.g., a certain gas species, including determining whether a gas mixture contains certain gas species above a set concentration limit.

Abstract: A spectroscopic measurement apparatus includes an optical system, a photodetector, and an analysis unit. The optical system guides measurement target light from an object to a light receiving surface of the photodetector, and forms a spectral image of the measurement target light on the light receiving surface of the photodetector. The photodetector includes the light receiving surface on which a plurality of pixels are arranged respectively on a plurality of rows. The photodetector receives the spectral image for a first exposure time by a plurality of pixels in a first region on the light receiving surface, and outputs first spectrum data. The photodetector receives the spectral image for a second exposure time by a plurality of pixels in a second region on the light receiving surface, and outputs second spectrum data. The second exposure time is longer than the first exposure time.

Abstract: An optical particle detector including at least one channel intended to receive a fluid carrying at least one particle, and across which light rays are intended to pass such that the light rays are partially scattered by the at least one particle, a plurality of photodetectors capable of receiving said scattered light rays, wherein the detector includes at least one optical waveguide configured to collect, at least at one entrance of the waveguide, light rays that were not scattered by the at least one particle and having crossed the channel, and to reinject the unscattered light rays into the channel through at least one exit of the waveguide.

Abstract: A coherent anti-Stokes Raman scattering microscope imaging apparatus, comprising: a laser light source (21), a two-dimensional oscillating mirror assembly (22), a first light dichroic mirror plate (23), an objective lens (24), a sample translation platform (25), a collection device (26), and a data processing module; the laser light source (21) is used for producing a first laser beam and a second laser beam; the first laser beam and the second laser beam are coaxially emitted and are incident on the two-dimensional oscillating mirror assembly (22); the first laser beam and the second laser beam leaving the two-dimensional oscillating mirror assembly pass through the first light dichroic mirror plate (23) and the objective lens (24); the objective lens (24) focuses the first laser beam and the second laser beam onto the sample translation platform; the signal light produced on the sample translation platform (25) passes through the objective lens (24).

Abstract: This application relates to a device for measuring a transmittance curve of an Fabry-Perot using a frequency comb light source and a method using the same. The device includes the following components sequentially arranged in an optical path: a single frequency pulse laser generating single frequency pulse laser; a frequency comb laser converting received single frequency pulse laser into frequency comb laser; and an Fabry-Perot to be detected receiving laser output from the frequency comb laser; where the device further includes a first receiving unit receiving laser from an output end of the frequency comb laser and performing component and spectrum analysis, and a second receiving unit receiving laser from an output end of the Fabry-Perot to be detected and performing component and spectrum analysis.

Abstract: A spectroscopic measurement apparatus includes an optical system, a photodetector, and an analysis unit. The optical system guides measurement target light from an object to a light receiving surface of the photodetector, and forms a spectral image of the measurement target light on the light receiving surface of the photodetector. The photodetector includes the light receiving surface on which a plurality of pixels are arranged respectively on a plurality of rows. The photodetector receives the spectral image for a first exposure time by a plurality of pixels in a first region on the light receiving surface, and outputs first spectrum data. The photodetector receives the spectral image for a second exposure time by a plurality of pixels in a second region on the light receiving surface, and outputs second spectrum data. The second exposure time is longer than the first exposure time.

Abstract: The disclosure provides a wafer inspection method and wafer inspection apparatus. The method includes: receive scanning information of at least one wafer, wherein the scanning information includes a plurality of haze values; the scanning information is divided into a plurality of information blocks according to the unit block, and the feature value of each of the plurality of information blocks is calculated according to the plurality of haze values included in each of the plurality of information blocks; and converting the feature value into a color value according to the haze upper threshold and the haze lower threshold, generating the color value corresponding to the at least one wafer according to the converted color value according to the feature value, whereby the color graph displays the texture content of the at least one wafer.

Abstract: A spectroscopic measurement apparatus includes an optical system, a photodetector, and an analysis unit. The optical system guides measurement target light from an object to a light receiving surface of the photodetector, and forms a spectral image of the measurement target light on the light receiving. The photodetector includes the light receiving surface on which a plurality of pixels are arranged respectively on a plurality of rows. The photodetector receives the spectral image for a first exposure time by a plurality of pixels in a first region on the light receiving surface, and outputs first spectrum data. The photodetector receives the spectral image for a second exposure time by a plurality of pixels in a second region on the light receiving surface, and outputs second spectrum data. The second exposure time is longer than the first exposure time.

Abstract: Disclosed are a dual-optical-path spectrophotometer and a color measurement method thereof. The spectrophotometer includes an integrating sphere, a light source, and a sensor. A second shutter, a semi-reflecting and semi-transmitting device and lenses are arranged between the detection hole and the sensor, and a light guide device and a first shutter are arranged between a light guide hole formed in the integrating sphere and the semi-reflecting and semi-transmitting device. The color measurement method includes the following steps. A first shutter is closed, a second shutter is opened, light, reflected by the measuring opening, enters a sensor and the sensor measures a spectral reflected signal of the object surface. The first shutter is opened, the second shutter is closed, reflected light enters the sensor, and the sensor measures a spectral reflected signal of a light source. A final sampled signal is calculated.

Abstract: This disclosure describes a capacitively controlled Fabry-Perot interferometer which comprises a first mirror layer with a first metallic thin-film layer embedded in a first insulating layer and a second mirror layer with a second metallic thin-film layer embedded within a second insulating layer. A control region in the first metallic thin-film layer is at least partly aligned in an actuation direction with a control region in the second metallic thin-film layer. The interferometer also comprises a first control electrode and a first dielectric layer, and the first dielectric layer lies between the first control electrode and at least a part of the control region of the first metallic thin-film layer.

Abstract: A spectroscopic measurement apparatus includes a pulsed laser light source that emits pulsed laser light, a beam splitter that splits the pulsed laser light into pump light and probe light, a delay circuit that changes a delay time of the pump light with respect to the probe light, a chopper that intensity-modulates the pump light, a wavelength converter that wavelength-converts the probe light into vacuum ultraviolet light, an optical system that guides the pump light and the wavelength-converted probe light to a sample, and a detector that detects the probe light reflected by the sample.

Abstract: A method for detecting gas concentration in a glass bottle with dynamical threshold adjustment is provided includes acquiring second harmonic peaks P0, Pa, PX in the glass bottle, calculating absolute values of the differences between P0 and Pa, as well as between P0 and PX, and performing quality inspection on a glass bottle to be detected. The performing includes collecting the second harmonic peaks for the glass bottle to be detected, calculating a mean PL of elements in the current queue L, updating the second harmonic peak Pa and the second harmonic peak PX, collecting second harmonic peaks for a current glass bottle to be detected, and determining whether the current glass bottle to be detected is an acceptable medicinal bottle based on the updated data and the collected second harmonic peaks.

Abstract: A gas analyzer that easily facilitates alignment is provided. The gas analyzer is a gas analyzer for measuring a predetermined component in a measurement gas by irradiating light on the measurement gas from a light emitting element and receiving light that passes through the measurement gas. The gas analyzer includes a base member configured to be adjustable in position along at least one axis that is not parallel to the optical axis of the light emitting element, and a holding member configured to hold the light emitting element and to be held to the base member in an angularly adjustable manner around at least one axis that is not parallel to the optical axis.

Abstract: An optical process sensor for measuring at least one measured variable of a medium in a container includes: a housing; a light source in the housing for emitting transmission light; a light detector in the housing for receiving reception light; and an interface including a first mechanical section, which is an integrated part of the housing, and a first optical section having a first path and a first light guide, wherein the first light guide is configured such that transmission light is guided from the light source into the first path via the first light guide and decouples transmission light from the housing, and having a second path and a second light guide, wherein the second light guide is configured such that reception light is coupled into the interior of the housing and guided from the second path to the light detector via the second light guide.

Abstract: In some implementations, an optical device may include an aperture, one or more optical elements, an optical filter, and an optical sensor. The aperture may be configured to receive light. The one or more optical elements may be configured to diffuse the light received by the aperture, direct the diffused light to the optical filter via a folded optical path, wherein a length of the folded optical path is greater than a distance between the aperture and an input surface of the optical filter, and cause the diffused light to be distributed across the input surface of the optical filter. The optical filter may be configured to filter the diffused light distributed across the input surface of the optical filter to pass portions of the diffused light associated with one or more wavelengths to the optical sensor.

Abstract: An optoelectronic apparatus includes a heat sink, which is shaped to define a base, a first platform at a first elevation above the base, and a second platform alongside the first platform at a second elevation above the base, which is different from the first elevation. A first monolithic emitter array is mounted on the first platform and is configured to emit first optical beams. A second monolithic emitter array is mounted on the second platform and is configured to emit second optical beams. An optical element is configured to direct both the first and the second optical beams toward a target region.

Abstract: A three-dimensional Raman image mapping measuring device for a flowable sample according to an embodiment of the present disclosure is designed to be capable of measuring a flowable sample during mapping measurement of a three-dimensional image that is a region of a confocal Raman by using a micro Raman spectrometer and a three-axis sample stage (Piezo stage). The three-dimensional Raman image mapping measuring device for a flowable sample includes at least one piezo element; an element holder equipped with the piezo element and having an opening, a sample stage for supporting the element holder equipped with the piezo element, an objective lens mounted in the opening in the element holder, a sample holder for controlling vertical movement of the flowable sample disposed under the lower portion of the sample stage, and a transparent window disposed between the sample stage and the sample holder.