Patents Examined by Albert Gaglairdi
  • Patent number: 7060971
    Abstract: A flaw inspection system (10) contains a substrate (12) to be inspected, such as a generator tube wall, a rotor of a generator, an aircraft skin, having or thought to have interior defects (24, 26) such as stress cracks, where the substrate (12) has attached reference blocks (14, 16) also containing defects (18, 20) of the type that might be found in the substrate, where an ultrasonic generator (28) emits sound waves (30) which contact all the defects, causing heat (32) which is sensed by a thermal camera (50) which, in association with a controller (54) causes images (60, 62) to appear on a monitor (52) from which the type and number of defects (24, 26) in the substrate (12) can be determined.
    Type: Grant
    Filed: September 13, 2002
    Date of Patent: June 13, 2006
    Assignee: Siemens Westinghouser Power Corporation
    Inventors: Paul Zombo, Paul Vona, Miguel A. Felix
  • Patent number: 6924487
    Abstract: A neutron detector is provided which is able to measure thermal neutron radiation within a gap filled with a substance that permits scintillation in the absorption of thermal neutron radiation, the gap being formed between at least a first and second spaced apart photodetector working in electrical coincidence. The substance disposed within the gap can be either a gas, liquid or solid. In the case of a gas, a shell is used so that the gas can be retained and kept under pressure. The neutron detector is able to differentiate between gamma radiation and neutron energy. An alternate embodiment of the novel detector includes a device which employs a plurality of detectors surrounding a moderator which can be used to measure both thermal and high energy neutrons.
    Type: Grant
    Filed: October 1, 2002
    Date of Patent: August 2, 2005
    Assignee: Constellation Technology Corporation
    Inventors: Alexander I. Bolozdynya, John D. Richards, Anatoli Arodzero
  • Patent number: 6881959
    Abstract: Method and system for generating an image of the radiation density of a source of photons located in an object wherein Compton scattering and non-Compton scattering events are detected and contained within data used for image reconstruction. The system includes a multiple pinhole collimator, a position sensitive scintillation detector as used in standard Gamma cameras, and a silicon pad detector array inserted between the collimator and the scintillation detector. The problem of multiplexing, normally associated with multiple pinhole systems, is reduced by using the extra information from the detected Compton scattering events. For properly selected pinhole spacing, this leads to a significantly improved image quality. A valuable enhancement can be achieved when adding only a small fraction of gamma rays with reduced angular ambiguity. The system does not require a highly optimized Compton camera behind the collimator.
    Type: Grant
    Filed: October 31, 2002
    Date of Patent: April 19, 2005
    Assignee: The Regents of the University of Michigan
    Inventors: Ling Jian Meng, Neal H. Clinthorne, W. Leslie Rogers, David K. Wehe