Patents Examined by Alesa Allgood
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Patent number: 12216183Abstract: A magnetic sensor includes a first path and a second path, a plurality of structures, and a plurality of first electrodes and a plurality of second electrodes. The first path includes at least one first array. The second path includes at least one second array. The at least one first array and the at least one second array are disposed so that they are arranged in a first direction. The at least one first array and the at least one second array each include an odd number of structures disposed so that they are arranged in a second direction.Type: GrantFiled: August 26, 2022Date of Patent: February 4, 2025Assignee: TDK CORPORATIONInventors: Tetsuya Hiraki, Kenzo Makino, Naoki Ohta
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Patent number: 12218511Abstract: A monitoring system for a power line structure includes a system for harvesting electrical energy from electric fields emanating from the power line. The monitoring system includes a weather resistant enclosure configured to be mounted near the power line. The electrical energy harvesting system includes an electric field antenna configured to receive electric fields emanating from the power line, an electrical energy harvesting circuit mounted within the enclosure and an earth ground connector configured to couple the harvesting circuit to an earth ground connection by direct connection or via a capacitive structure. An energy storage device is also electrically coupled to the harvesting circuit. The monitoring system further includes a sensor system electrically coupled to the harvesting system. The sensor system is configured to sense a condition and transmit corresponding condition data.Type: GrantFiled: March 17, 2022Date of Patent: February 4, 2025Inventor: Steven Marquis
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Patent number: 12209888Abstract: A reading device for capacitive sensing element comprises a differential capacitive sensing element, a modulator, a charge-voltage conversion circuit, a phase adjustment circuit, a demodulator and a low-pass filter. The modulator outputs a modulation signal to the common node of the capacitive sensing element and modulates the output signal of the capacitive sensing element. The two input terminals of the charge-to-voltage conversion circuit are connected to two non-common nodes of the capacitive sensing element. The charge-to-voltage converter read the output charge of the capacitive sensing element and convert it into a voltage signal. The modulator generates a demodulation signal through the phase adjustment circuit. The demodulator receives the demodulation signal from the phase adjustment circuit and demodulates the output of the charge-to-voltage conversion circuit. The low-pass filter is connected to the output of the demodulator for filtering the demodulated voltage signal to output the read signal.Type: GrantFiled: January 13, 2023Date of Patent: January 28, 2025Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Lu-Pu Liao, Yu-Sheng Lin, Liang-Ying Liu, Chin-Fu Kuo
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Patent number: 12210056Abstract: Embodiments of the present invention provide testing systems with liquid cooled thermal arrays that can pivot freely in three dimensions allowing surfaces to be brought into even, level, and secure contact, thereby preventing air gaps between surfaces and improving thermal performance. In this way, more DUTs can be tested in parallel within a small test space, overall costs of the test system are reduced, and greater cooling capacity can be provided for testing high-powered devices. Gimbaled mounts can be disposed on a bottom surface of individual thermal interface boards (TIBs) of a test system, and/or on top of individual thermal heads of a thermal array (TA) having a common cold plate (or having multiple cold plates).Type: GrantFiled: October 10, 2023Date of Patent: January 28, 2025Assignee: Advantest Test Solutions, Inc.Inventors: Gregory Cruzan, Karthik Ranganathan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings, Chee Wah Ho
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Patent number: 12203974Abstract: A control part of a semiconductor fault analysis device outputs an alignment command that moves a chuck to a position at which a target is detectable by a first optical detection part and then aligns an optical axis of a second optical system with an optical axis of a first optical system with the target as a reference, and outputs an analysis command that applies a stimulus signal to a semiconductor device and receives light from the semiconductor device emitted according to a stimulus signal with at least one of a first optical detection part and a second optical detection part in a state in which a positional relationship between the optical axis of the first optical system and the optical axis of the second optical system is maintained.Type: GrantFiled: January 13, 2021Date of Patent: January 21, 2025Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Masataka Ikesu, Shinsuke Suzuki
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Patent number: 12203999Abstract: A high current source (200) for a test system for testing an electric power device (30) comprises a first plurality of first switchable half-bridges (212) and a second plurality of second switchable half-bridges (222), which are connected in parallel and by means of which a test current is redundantly distributed. A control device (280) is designed to control the first and second half-bridges (212, 222) on the basis of an input signal in such a way that an output signal for the test current, which corresponds to the input signal, is applied across a bridge branch (230) between the first switchable half-bridges (212) and the second switchable half-bridges (222).Type: GrantFiled: January 8, 2021Date of Patent: January 21, 2025Assignee: OMICRON Electronics GmbHInventors: Lukas Bitschnau, Horst Schedler
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Patent number: 12203976Abstract: An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.Type: GrantFiled: May 14, 2020Date of Patent: January 21, 2025Assignee: Cohu GmbHInventors: Anton Schuster, Andreas Wiesböck, Stefan Binder
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Patent number: 12188981Abstract: An oscillation period detection circuit and method, and semiconductor memory are provided. The oscillation period detection circuit includes an oscillator module, a control module, and a counting module. The oscillator module includes a target oscillator, and is configured to receive an enable signal and control the target oscillator to output an oscillation clock signal according to the enable signal; the control module is configured to receive the enable signal and the oscillation clock signal, and perform valid time reforming processing according to the oscillation clock signal and the enable signal to determine a target time; the counting module is configured to receive the enable signal and the oscillation clock signal, and perform period counting processing according to the enable signal and the oscillation clock signal to determine a target period number. The oscillation period of the target oscillator is calculated according to the target time and the target period number.Type: GrantFiled: May 5, 2022Date of Patent: January 7, 2025Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.Inventor: Zhiqiang Zhang
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Patent number: 12189003Abstract: A magnetic sensor includes an MR element. The MR element includes a free layer. The free layer has a first surface having a shape that is long in one direction and a second surface located opposite the first surface, and has a thickness that is a dimension in a direction perpendicular to the first surface. The first surface has a first edge and a second edge located at both lateral ends of the first surface. In a given cross section, the thickness at the first edge is smaller than the thickness at a predetermined point on the first surface between the first edge and the second edge.Type: GrantFiled: November 22, 2023Date of Patent: January 7, 2025Assignee: TDK CORPORATIONInventors: Hirokazu Takahashi, Kenzo Makino
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Patent number: 12188788Abstract: Disclosed herein is a magnetic sensor that includes first and second magnetic structures each having an annular structure and arranged in a first direction with a magnetic gap interposed therebetween, a magnetosensitive element disposed on a magnetic path formed by the magnetic gap and has a sensitivity axis in the first direction, a first excitation coil wound around the first magnetic structure, and a second excitation coil wound around the second magnetic structure.Type: GrantFiled: October 14, 2022Date of Patent: January 7, 2025Assignee: TDK CORPORATIONInventors: Takato Fukui, Takeo Gokita
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Patent number: 12188977Abstract: A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.Type: GrantFiled: March 17, 2021Date of Patent: January 7, 2025Assignee: NHK Spring Co., Ltd.Inventors: Tsuyoshi Inuma, Shuji Takahashi, Kazuya Soma, Takashi Nidaira, Yuya Hironaka
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Patent number: 12186054Abstract: A transmitting element for generating a magnetic field for tracking of an object includes a first spiral trace that extends from a first outer origin inward to a central origin in a first direction. A second spiral trace can extend from the central origin outward to a second outer origin in the first direction. The second spiral trace can extend from the central origin to the second outer origin in the first direction. The first spiral trace and the second spiral trace can be physically connected at the central origin to form the fluorolucent magnetic transmitting element and at least a portion of the first spiral trace overlaps at least a portion of the second spiral trace.Type: GrantFiled: October 18, 2023Date of Patent: January 7, 2025Assignee: St. Jude Medical International Holding S.a r.l.Inventors: Anthony D. Hill, John Hauck, Ryan M. Albu, Timothy G. Curran, Ryan Link
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Patent number: 12188978Abstract: What is disclosed are methods and structures of an improved probe card assembly to inspect micro devices.Type: GrantFiled: February 20, 2020Date of Patent: January 7, 2025Assignee: VueReal Inc.Inventors: Gholamreza Chaji, Chang Ho Park
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Patent number: 12180018Abstract: The present invention relates to an electronic device testing apparatus and a testing method thereof. When the test is completed, a pressing head picks up a tested electronic device from a test socket and places the tested electronic device on an output carrier, the output carrier moves out of a test zone, and an input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed; after the pressing head picks up an electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the pressing head places the electronic device to be tested in the test socket. Accordingly, in the present invention, the operation of the pressing head is simplified, and the overall test efficiency is improved.Type: GrantFiled: August 29, 2022Date of Patent: December 31, 2024Assignee: CHROMA ATE INC.Inventors: Chin-Yi Ouyang, Chien-Ming Chen
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Patent number: 12174281Abstract: A system and method are provided for creating magnetic resonance (MR) images with reduced motion artifacts from the MR data from which the images are produced. The method includes selecting a candidate image from a plurality of candidate images reconstructed from the MR data. The method also includes registering the candidate image to a reference image, comparing the candidate image to a consistency map, and, based on comparing the candidate image using the consistency map, selecting a blending algorithm. The method also includes generating a blended image using the blending algorithm and the candidate image and repeating these steps for each candidate image. The method also includes performing a Fourier aggregation to generate a combined image and displaying the combined image with reduced motion artifacts compared to the plurality of candidate images.Type: GrantFiled: September 19, 2022Date of Patent: December 24, 2024Assignees: Regents of the University of Minnesota, Duke UniversityInventors: Oren Solomon, Noam Harel, Guillermo Sapiro, Edward Auerbach, Steen Moeller, Remi Patriat, Henry Braun, Tara Palnitkar
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Patent number: 12174229Abstract: An apparatus for measuring dynamic on-resistance of a device under test (DUT) is provided. The apparatus comprises a testing interface configured for coupling between the DUT and a measuring equipment; a first measuring circuit configured for sensing a drain-source voltage of the DUT and generating a first measuring signal proportional to the drain-source voltage; a current sensing circuit configured for sensing a drain current flowing from a drain to a source of the DUT and generating a current sensing signal; a second measuring circuit configured for receiving the current sensing signal and generating a second measuring signal proportional to the drain current; a first clamping circuit configured for eliminating overshoots in the first measuring signal; a second clamping circuit configured for eliminating overshoots in the second measuring signal. As the overshoot in the measuring voltage signals can be eliminated, the time required for the measuring signal to settle is shortened.Type: GrantFiled: July 13, 2022Date of Patent: December 24, 2024Assignee: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.Inventors: Yiming Lin, Jianjian Sheng
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Patent number: 12174275Abstract: Magnetic field closed loop sensors including offset reduction circuitry to reduce undesired baseband components attributable to offset associated with magnetoresistance elements are described. A superimposed signal including a main signal portion indicative of a parameter of a target and an offset reduced signal portion is coupled to feedback circuitry. The feedback circuitry generates a feedback signal to drive a feedback coil. Main processing circuitry is operative to extract the main signal portion from the superimposed signal and produce a sensor output signal based on the main signal portion. Example offset reduction circuitry can take the form of AC coupling circuitry or a ripple reduction loop.Type: GrantFiled: March 1, 2023Date of Patent: December 24, 2024Assignee: Allegro MicroSystems, LLCInventor: Hernán D. Romero
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Patent number: 12164009Abstract: A magnetic sensor includes a first insulating layer, a second insulating layer, a third insulating layer, a lower coil element located on an opposite side of the first insulating layer from the second insulating layer, and a second MR element. The second MR element includes a magnetization pinned layer and a free layer. The magnetization pinned layer and the free layer are located on an opposite side of the third insulating layer from the second insulating layer. The first and third insulating layers each contain a first insulating material. The second insulating layer contains a second insulating material.Type: GrantFiled: August 25, 2022Date of Patent: December 10, 2024Assignee: TDK CORPORATIONInventors: Keisuke Takasugi, Kenzo Makino, Hiraku Hirabayashi, Masanori Sakai
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Patent number: 12163808Abstract: The described techniques address issues associated with hybrid current or magnetic field sensors used to detect both low- and high-frequency magnetic field components. The hybrid sensor implements a DC component rejection path in the high-frequency magnetic field component path. Both digital and analog implementations are provided, each functioning to generate a DC component cancellation signal to at least partially cancel a DC component of a current signal generated via the high-frequency magnetic field component path. The hybrid sensor provides a high-bandwidth, high-accuracy, and low DC offset hybrid current solution that also eliminates the need for DC decoupling capacitors in the high-frequency path. A modification is also described for implementing a Sigma-Delta (??) quantization noise reduction path to reduce the quantization noise and to improve accuracy.Type: GrantFiled: November 27, 2023Date of Patent: December 10, 2024Assignee: Infineon Technologies AGInventors: Mario Motz, Amirhossein Jouyaeian, Kofi Makinwa
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Patent number: 12153104Abstract: A magnetic sensor 1 includes a plurality of MR elements disposed in first to fourth areas. Each of the first to fourth areas includes a first end edge and a second end edge located at both ends in a first reference direction, and a third end edge and a fourth end edge located at both ends in a second reference direction. Each of the first and second end edges extends along the second reference direction. Each of the third and fourth end edges extends along a third reference direction. Each of the plurality of MR elements has a shape long in a direction different from each of the first reference direction, the second reference direction, and the third reference direction.Type: GrantFiled: September 20, 2022Date of Patent: November 26, 2024Assignee: TDK CORPORATIONInventors: Tetsuya Hiraki, Kazuya Watanabe