Abstract: A reflectometer and a method for measuring the reflectance and transmittance of material using an integrating sphere and a light concentrator. The reflectance and transmittance measurements are performed as a function of the angle of incidence of a beam of light onto a sample and reference material. In a preferred embodiment, a CHC-lens concentrator having a high f/# and a low index of refraction is used.
Type:
Grant
Filed:
July 31, 1995
Date of Patent:
April 28, 1998
Assignee:
The United States of America as represented by the Secretary of the Navy
Inventors:
Keith A. Snail, Leonard Hanssen, David Chenault