Patents Examined by André C Stephenson
  • Defect knowledge library
    Patent number: 6744266
    Abstract: A method and associated apparatus for creating a defect knowledge library containing case study information of wafer defects on semiconductor wafers. The method comprises creating a database entry that contains a case study of a specific defect including defect information that comprises one or more defect images and storing the database entry for subsequent access. The database entries are stored on a server and are accessible by a plurality of clients.
    Type: Grant
    Filed: July 13, 2001
    Date of Patent: June 1, 2004
    Assignee: Applied Materials, Inc.
    Inventors: Amos Dor, Maya Radzinski