Abstract: A fixed electrode and a movable electrode used to drive each arm are disposed at a drive unit. As a voltage is applied between the fixed electrode and the movable the electrode, a coulomb force causes the movable the electrode to move, thereby driving the arms along the closing direction. The dimensions of a sample can be measured based upon the electrostatic capacity achieved between the electrodes when the sample becomes gripped by the arms.

Abstract: An RSSI circuit provides a relatively inexpensive technique for accurately measuring received signal strength over a wide dynamic range. A received signal is processed by a rectifier circuit that generates a series of DC offsets of increasing magnitude. The DC offsets are imposed on a first polarity of the received signal to create a series of outputs that are the first polarity of the received signal with increasing DC offsets. Each of the outputs is coupled to one input of a weighted comparator with the other input of the comparator coupled to a second and opposite polarity of the received signal with no offset. The comparators determine when overlap occurs to indicate particular signal levels.

Abstract: The present invention relates to systems and methods for sensing capacitance change of a capacitive sensor and for optimizing a capacitive sensing circuit. In an exemplary embodiment, a capacitive sensor may be coupled to an amplifier at floating node. A programming circuit is connected to the floating node for controlling a charge on the floating node. A method of controlling the charge of the floating node is also provided. The method includes applying a first predetermined voltage to a source of a programming transistor, applying a second predetermined voltage to a floating gate of the programming transistor, and applying a third predetermined voltage to a drain of the programming transistor until a charge on the floating gate of the programming transistor reaches a predetermined value. The charge on the floating gate of the programming transistor drives the charge on the floating node to the predetermined value, and thus is controlled.

Abstract: The present invention provides a micro sensor for monitoring the cleaning and drying processes for very high aspect ratio micro channels in dielectric films oriented parallel to the fluid-solid interface during the manufacture of ICs, MEMS and other micro-devices. The micro sensor can be used to monitor “vertical” micro features common in microelectronics fabrication or “horizontal” micro features found in MEMS or microfluidic fabrication. By forming the micro channels parallel to the interface, the channels can be made with much higher and well controlled aspect ratios. In addition, multiple sensors can sense the impedance at various points along the micro features. The addition of a guard reduces the effects of any parasitic capacitance, which extends the measurement bandwidth of the sensor.

Abstract: A sensor system comprising a sensor operable to provide an output signal representative of a sensed parameter is provided. The sensor system also comprises a control system coupled to the sensor, wherein the control system is operable to change a physical characteristic of the sensor based on the output signal representative of the sensed parameter.

Abstract: A capacitive sensor, in particular for the detection of an obstruction of objects or body parts by motor driven devices, includes an arrangement of a multitude of electrodes on a support and means to measure a capacitance or a capacitance change. The sensor is of a flat and film-like embodiment with a support made out of a film material for the arrangement of the electrodes. Furthermore, a capacitive sensor system, for detection of an obstruction situation of objects or body parts with motor driven devices uses several sensors of the above design, is disclosed, whereby an obstruction situation is detected, if a selection of several sensors is responding.

Abstract: A measuring instrument has a phase signal transmitter that transmits, in accordance with a rotation of the spindle, a phase signal that differs corresponding to the rotation angle of the spindle, and an arithmetic processor that arithmetically processes the phase signal to obtain the absolute position of the spindle. The phase signal transmitter transmits the phase signal at a predetermined pitch. Since the phase signal differs corresponding to the rotation angle of the spindle, a rotation angle of the spindle is uniquely determined by the phase signal. Unlike an increment type measuring instrument, since there is no concern that the signal will be skip-read, the spindle can be rotated at high speed, so that operational performance of the micrometer can be improved. Further, since there is no concern that the signal will be skip-read, the phase signal can be minutely varied with respect to the rotation of the spindle.

Abstract: A network test instrument provides maximum compensation of FEXT by use of mutual inductance between one or more signals. The inductance is suitably formed as a PCB trace component, or as discrete components.

Abstract: A measuring device to measure the insulation resistance (Riso) of a fuel cell system with respect to an electrical ground point comprises a resistor arrangement—formed by a series connection of reference resistors—between two load-current lines of the fuel cell system as well as one reference voltage source, which is arranged between the ground point and a node between the reference resistors and which is switchable between at least two different reference voltages (Urefo, Urefu). The measuring device further comprises one voltage-sensing device that acquires the voltage (Uo, Uu) between at least one of the load-current lines and the ground point.

Abstract: A system for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle for conveying the system inside the pipe. The system includes a first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe, a second contact positioned in a spaced apart relationship from the first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe, and a voltage reading device connected to the first contact and the second contact for measuring the voltage between the first contact and the second contact as the vehicle moves through the pipe.

Abstract: An image forming apparatus that senses image position differences without a dedicated light source or driver circuit, the apparatus including a transfer belt and an image forming unit for deflecting a light emitted from a light source, forming a latent image on a surface by scanning the deflected light, developing the latent image, and transferring the developed image onto the belt or recording medium delivered by the belt. The apparatus also includes an optical path changing unit for changing an optical path of the light before it reaches the deflecting unit and guiding the light to a sensing position of a sensing image formed on the surface of the transfer belt, a sensing unit for receiving a light reflected or transmitted by the sensing position and sensing the sensing image, and a control unit for controlling the image forming unit according to the sensing signal sensed by the sensing unit.

Abstract: A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and second input ports. The comparator is coupled to compare a first voltage received on the first input port against a reference voltage received on the second input port. The first voltage is related to the current driven through the circuit node, a frequency at which the switch is switched, and a capacitance of the DUT capacitor.

Abstract: Imaging methods, image engines, and photoconductor charging systems are described. According to one embodiment, an imaging method includes providing a charge device configured to provide an electrical charge to a surface of an imaging member which is usable for imaging, moving a surface of the charge device adjacent to the imaging member and a bias member, during the moving, first charging a discharged portion of the surface of the charge device using the bias member providing a charged portion of the surface of the charge device, during the moving, second charging a portion of the surface of the imaging member using the charged portion of the charge device, the second charging providing the discharged portion of the surface of the charge device, and repeating the first charging and the second charging during the moving.

Abstract: In a first embodiment of the invention there is provided an electronic chip for use with an automatic testing equipment device testing a device under test. The device under test has a plurality of pins and the electronic chip is placed in a channel of a test card that is associated with one of the pins. An input signal is provided to a pin of the device under test and the resulting output is provided to the pin electronics for the channel of the test card. In most embodiments, the output signal is a voltage signal. One purpose for the electronic chip is to measure jitter based upon timing measurements performed by the electronic chip. Jitter measurements are particularly important for high-speed serial devices. The electronic chip includes an integrating time measurement circuit for receiving the input signal and producing an output signal including a timing measurement of at least a portion of the input signal.

Abstract: A dielectric constant waveguide measuring apparatus preferably comprises a rectangular waveguide aperture on each end with a width a and height b. The waveguide frame is preferably split to permit the waveguide to be opened for insertion of the unknown material into a middle reduced cross-sectional area portion of the waveguide frame. In one embodiment, a metal septum is inserted between two samples of the unknown material to thereby reduce the cross-sectional area of the waveguide aperture by splitting width a of the rectangular waveguide in half. The waveguide frame is closed and a frequency response of the waveguide is then measured. The dynamic dielectric constant of the unknown material is determined from the frequency of the lowest order minimum value of the frequency response of the waveguide apparatus wherein the unknown material has been inserted.

Abstract: A quantitative microchip Coulter counter is provided for use in detecting and measuring particles or macromolecules. The device comprises a conduit, a fluid handling system, and a measurement system. Preferably, the conduit is at least in part formed from an elastomeric material.

Abstract: A beam position detector for measuring the properties of a charged particle beam, including the beam's position, size, shape, and intensity. One or more absorbers are constructed of thermo-resistive material and positioned to intercept and absorb a portion of the incoming beam power, thereby causing local heating of each absorber. The local temperature increase distribution across the absorber, or the distribution between different absorbers, will depend on the intensity, size, and position of the beam. The absorbers are constructed of a material having a strong dependence of electrical resistivity on temperature. The beam position detector has no moving parts in the vicinity of the beam and is especially suited to beam areas having high ionizing radiation dose rates or poor beam quality, including beams dispersed in the transverse direction and in their time radio frequency structure.

Abstract: A thermal activation apparatus comprises a housing having an insertion slot for insertion therethrough of a heat-sensitive adhesive sheet. A sensor detects the heat-sensitive adhesive sheet inserted through the insertion slot and outputs a corresponding detection signal for determining a start time of the thermal activation apparatus. A transfer unit transfers the heat-sensitive adhesive sheet and a thermal activation unit thermally activates a heat-sensitive adhesive layer of the heat-sensitive adhesive sheet. An ejection unit ejects the heat-sensitive adhesive sheet after thermal activation. A control unit disposed within the housing controls operation of the thermal activation apparatus and includes a printer communication unit for communicating the thermal activation apparatus with a printer for printing on a printable surface of the heat-sensitive adhesive sheet before or after thermal activation of the heat-sensitive adhesive layer of the heat-sensitive adhesive sheet.

Abstract: In a printing press, an adjustment system for positioning a rolling element such as a form roller or an impression cylinder relative to a first cylinder having a first diameter and relative to at least a second cylinder adapted to replace the first cylinder and having a second diameter different than the first diameter, the system comprising an actuating member operable to displace the rolling element relative to the first cylinder and having a pivotable fixed first end and a second end mechanically linked to the rolling element, the actuating member providing sufficient displacement to bring the rolling element into contact with the first cylinder such that a predetermined contact pressure therebetween is reached, the actuating member also being operable to bring the rolling element into contact with the second cylinder such that the predetermined contact pressure therebetween is reached. A method for displacing a rolling element is also presented.

Abstract: A method for monitoring the depth of at least one via (11) in a wafer including the steps of arranging the via (11) as a capacitive plate (21), providing a corresponding capacitive plate (23), applying an electrical potential difference to the via (11) and the corresponding capacitive plate (23), measuring the resultant capacitance between the via (11) and a corresponding capacitive plate (23) and determining the depth of the at least one via (11) by the capacitance.