Abstract: The invention relates to an electronic electricity meter (1) having an optical interface (5, 6), which is used to test the load curve of the meter. To this end, after a test message is received from a testing unit (7, 8, 9), the microcomputer (2) of the meter (1) applies load meter pulses to the optical interface (5, 6).

Abstract: According to the present invention, the functionality and possible process-related defects of an integrated circuit device are quickly assessed and isolated using a special testing methodology. Utilizing a test chip, an Electron Beam (E-Beam) is used to locate defective circuitry of the integrated circuit at functional levels, and an emission microscope is used to locate possible DC leakage related to silicon which is indicative of process-related defects. Using the methodology of the present invention on a test chip rather than a real production device means that the functional analysis time may be reduced from weeks to less than one hour.

Abstract: An arrangement has a unit with at least one plug for pluggable module (MO1, MO2) that forwards signals to a processing and/or peripheral unit, so that the measuring range of the unit is adapted to the measuring range of the signals. The disclosed arrangement requires only one further module (MO1, MO2) for all measuring ranges, i.e., for all voltage and current ranges. The desired measuring range is set by the position of the module (MO1, MO2) on the plug. The invention has application in input and output component groups.

Abstract: There is disclosed an apparatus and method for determining locked rotor test data for three-phase alternating current motor without mechanically coupling the rotor to any instrumentality. The "locked rotor" test is conducted by connecting a source of single-phase alternating current with a variable frequency to the field windings of a three-phase a.c. motor. The frequency of the voltage source is varied from approximately the rated frequency to a lower frequency and the input electrical power and the input voltage are recorded at two or more data points defined by two or more frequencies between the rated frequency and 0. The single-phase input power data and the single-phase input voltage data is then scaled by a scaling factor to convert it to equivalent three-phase locked rotor data. Particularly, the single-phase input power is multiplied by 1.515 to convert it to equivalent three-phase input power, and the single-phase input voltage is multiplied by 0.

Abstract: A meter provides an arrangement for the optional connection of its voltage circuit to a current path or to a calibration system. The arrangement includes an opening, provided in the housing of the meter for inserting a contact device connected to the calibration system, and a pivoting lever. On insertion of the contact device into the opening, the pivoting lever can be moved from an operating position, connecting the voltage circuit to the current path, into a calibration position connecting the voltage circuit to the calibration system. Consequently, the arrangement can be changed over between the operating position and the calibration position with a minimum possible cost.