Abstract: The present disclosure relates to determining locations of low-energy events on power lines. For example, an IED may receiving an input signal indicating a local electrical condition of a power line. The IED may detect traveling waves on the power line based on the local electrical condition. The IED may detect traveling waves on the power line based on the local and remote electrical conditions. The IED may determine that the traveling waves are associated with a low-energy event. The IED may determine the location of the low-energy event on the power line based at least in part on the traveling waves.

Abstract: A USB test device for testing a power feed device having a USB plug includes: a connector connected to the USB plug; a communication control unit that communicates with the power feed device through a communication line of the connector; a load control unit capable of controlling a load of a power supply line of the connector receiving power supply from the power feed device; a test control unit that gives an instruction to the load control unit based on power supply information which was obtained by the communication control unit and which is about a combination of electric power that can be supplied from the power feed device, and examines a state of power supply to the load from the power feed device; and a display unit that displays a result of examination by the test control unit.

Abstract: A dongle for connecting a computerized device to a certified unit under test (UUT) includes a computerized device communication port and a UUT communication port. The dongle also includes a communication module operatively connecting the computerized device communication port and the UUT communication port. The communication module includes an internet protocol (IP) module that supplies an IP address to a computerized device connected to the computerized device communication port, wherein the IP address enables the computerized device to receive signals from and/or send signals to the UUT.

Abstract: Systems and methods may be used to measure a frequency of a power delivery system and/or of a supply signal transmitted to a load. A system may record an input waveform, determine a frequency of the input waveform at a present time based at least in part on the input waveform and a derivative of the input waveform, and control an operation of a power delivery system based at least in part on the determined frequency.

Abstract: A sensor for detecting voltage of a power cable includes a housing configured to be coupled around at least a portion of the power cable. A first conductive element supported by the housing is configured to be electrically coupled to the power cable when the housing is coupled around at least a portion of the power cable. A first capacitive element supported by the housing is electrically interconnected with the first conductive element. A second capacitive element supported by the housing is electrically interconnected with the first conductive element. A processor determines a cable capacitance of the power cable based upon alternatively sensing an electrical characteristic (i) the first capacitive element and the second capacitive element and (ii) the first capacitive element without the second capacitive element. The sensor determines the voltage of the power cable based upon the determined cable capacitance.

Abstract: A method for generating an error signal indicating an error type of an error in a multi-phase electrical energy supply network. Measured values describe a current operating state of the network. The measured values are transmitted to a protection device. An evaluating device evaluates every possible loop of the network that can be affected with respect to the recognition of the error type of an error, by using the measured values. In order to be able to more reliably recognize the error type even under different network conditions, the measured values and/or values derived from the measured values are evaluated using at least two different protection criteria, for every possible loop. Each of the protection criteria is suitable for indicating an error type of an error present in the evaluated loop, and the error signal is generated in consideration of all available evaluation results of the protection criteria.

Abstract: A staggered probe card and a conductive probe are provided. The staggered probe card includes an upper guide board, a lower guide board spaced apart from the upper guide board, and a plurality of conductive probes arranged in rows and passing through the upper and lower guide boards. Each of the conductive probes has an elongated structure defining a longitudinal direction, and includes a bottom surface and two long side surfaces respectively connected to two edges of the bottom surface. A distance between the two long side surfaces gradually decreases in a tapering direction that extends away from the bottom surface. In two of the rows of the conductive probes adjacent to each other, any two long side surfaces respectively belonging to the two adjacent rows and arranged adjacent to each other have a lateral interval along a direction that is non-parallel to the arrangement direction.

Abstract: A computer-implemented method includes, by one or more processors in electronic communication with a tunneling magnetoresistive sensor, wherein the tunneling magnetoresistive sensor is a component of a magnetic storage drive configured to read magnetic data from a magnetic storage medium, detecting a short across the tunneling magnetoresistive sensor, measuring a change in resistance of the tunneling magnetoresistive sensor, measuring a change in voltage amplitude for the tunneling magnetoresistive sensor, and dividing said change in voltage amplitude by said change in resistance to yield a ratio. The computer-implemented method further includes, responsive to the ratio being greater than a predetermined ratio threshold, determining that the short is caused by a magnetic shunt. A corresponding computer program product and computer system are also disclosed.

Abstract: A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with different interchangeable modules for wafer testing. Modules, such as probe card positioners and air-cooled rail systems, for example, can be mounted or docked to the probe station. The wafer probe station is also provided with a front loading mechanism having a rotatable arm that rotates at least partially out of the probe station chamber for wafer loading.

Abstract: One preferable aspect of the present invention is a state detecting system which detects a state of a machine device based on a detection signal from a detecting element provided to the machine device, and is the state detecting system which includes a non-normal time rate detecting unit which detects a rate or a value as a non-normal time rate, the rate being a rate of an integration value of a time during which an amplitude of the detection signal exceeds a predetermined normal amplitude within a predetermined time, and the value being physically equivalent to the rate.

Abstract: A computer-implemented method includes, by one or more processors in electronic communication with a tunneling magnetoresistive sensor, wherein the tunneling magnetoresistive sensor is a component of a magnetic storage drive configured to read magnetic data from a magnetic storage medium, detecting a short across the tunneling magnetoresistive sensor, measuring a change in resistance of the tunneling magnetoresistive sensor, measuring a change in voltage amplitude for the tunneling magnetoresistive sensor, and dividing said change in voltage amplitude by said change in resistance to yield a ratio. The computer-implemented method further includes, responsive to the ratio being greater than a predetermined ratio threshold, determining that the short is caused by a magnetic shunt. A corresponding computer program product and computer system are also disclosed.

Abstract: Embodiments described herein relate to a magnetic positioning system and method that allows the position of a receiver to be determined in environments containing conducting material such as concrete. A number of transmitters create modulated magnetic fields which are distorted as they propagate through the conducting materials. A finite difference time domain (FDTD) simulation of the environment is used to generate an accurate model of the fields within the environment. A receiver is used to measure the field strength of each transmitter. The receiver position is determined by evaluating the misfit between the received fields and the values in the FDTD model.

Abstract: Disclosed is a camshaft or crankshaft sensor including a toothed target, a measuring cell adapted to supply a raw signal and a processor module having two modes of operation: 1) a measurement mode in which the processor module is adapted to supply an output port of the sensor a measurement signal representing the times of passage of the teeth of the target at the level of the measuring cell; and 2) a diagnostic mode in which the processor module is adapted to supply at the output port of the sensor a diagnostic signal different from the measurement signal and representing the amplitude of the raw signal. Also disclosed is a method and a module for diagnosing such a sensor.

Abstract: Methods that include: subjecting an article including a moisture sensor to steam sterilization in a steam sterilizer to produce a sterilized article, the moisture sensor having a moisture absorbing layer and a resonant circuit; subjecting the sterilized article to drying; and interrogating the resonant circuit, wherein the interrogation is affected by an amount of water present in the moisture absorbing layer.

Abstract: A method and system is provided for locating a fault in a mixed power transmission line. The method is implemented by an Intelligent Electronic Device (IED) of the mixed line. The IED detects a travelling wave from one or more signals received from one or more measurement equipment. Thereafter, the IED identifies a line section with the fault, and generates two or more estimates for the location of the fault based on a time difference between arrival of two peaks of the travelling wave, a velocity of propagation of the travelling wave in the line section identified with the fault, and a length of one or more line sections. The IED determines the location of the fault based on a comparison of each estimate with a threshold, wherein the threshold is estimated based on the one or more signals, equivalent source impedance of each source and total line impedance.

Abstract: A capacitive sensor device comprises a first sensor electrode, a second sensor electrode, and a processing system coupled to the first sensor electrode and the second sensor electrode. The processing system is configured to acquire a first capacitive measurement by emitting and receiving a first electrical signal with the first sensor electrode. The processing system is configured to acquire a second capacitive measurement by emitting and receiving a second electrical signal, wherein one of the first and second sensor electrodes performs the emitting and the other of the first and second sensor electrodes performs the receiving, and wherein the first and second capacitive measurements are non-degenerate. The processing system is configured to determine positional information using the first and second capacitive measurements.

Abstract: A probe card device includes a first die, a second die, and a plurality of rectangular probes. Each of the rectangular probes includes a middle segment, two extending segments, and two contact end segments. In each of the rectangular probes, the two extending segments are respectively arranged in the first die and the second die, the two contact end segments respectively extend from two opposite ends of the two extending segments along a direction away from the middle segment, each of the two contact end segments includes a conductive portion, and at least one of the two contact end segments includes a piercing portion partially embedded in the conductive portion thereof. A conductivity of the piercing portion is less than that of each of the two conductive portions, and a Vickers hardness number of the piercing portion is larger than that of each of the two conductive portions.

Abstract: A measurement device that performs a predetermined measurement task together with a plurality of other measurement devices is provided. This measurement device is provided with a sampling phase generator for generating a sampling phase for instructing a timing of sampling, and a communication unit for communicating with at least one of the plurality of other measurement devices. The communication unit transmits the sampling phase generated by the sampling phase generator to at least one of the plurality of other measurement devices. The sampling phase generator is configured to generate a third sampling phase, using an operation that is based on a generated first sampling phase and a second sampling phase received by the communication unit from at least one of the plurality of other measurement devices.

Abstract: A method for detecting corrosion may comprise placing an electromagnetic logging tool into a wellbore, emitting an electromagnetic field from a transmitter, energizing a casing with the electromagnetic field to produce an eddy current, recording the eddy current from the casing with a receiver, creating a well log from the recorded eddy current, removing a collar signal from the well log to obtain a collar-removed signal, calculating a baseline signal from the collar-removed signal, subtracting the baseline signal from the collar-removed signal to obtain a baseline-subtracted signal, calculating an artifact-removed signal with the baseline-subtracted signal, and displaying the artifact-removed signal. A system for detecting corrosion may comprise an electromagnetic logging tool, wherein the electromagnetic logging tool comprises a transmitter and a receiver. The system may further comprise an information handling system.

Abstract: A probe card, for testing an electrical characteristic of a device under test (DUT) including a plurality of semiconductor devices, includes a substrate, a first probe pin disposed on a surface of the substrate and including a tip portion capable of contacting a pad of the DUT, and a second probe pin disposed on the surface of the substrate and including a tip portion capable of contacting the pad of the DUT. The first probe pin protrudes further than the second probe pin protrudes from the surface of the substrate in a first direction that is substantially perpendicular to the surface of the substrate.