Patents Examined by Brian Le
  • Patent number: 7373003
    Abstract: A method, system, and data structure for the scaling down of data is provided. At least two blocks of transformed data samples representing at least two blocks of original data samples are received. One of at least two tables of constants is selected wherein each table of constants is capable of reducing the number of transformed data samples by a different factor. The constants taken from the selected table are applied to the at least two blocks of transformed data samples to produce one block of transformed data samples representing one block of final data samples. The data is processed one dimension at a time by multiplying the data in one dimension with selected constants taken from previously developed tables corresponding to the desired scale down factor. Scaling down by different factors in each dimension as well as scaling down in one dimension and scaling up in the other dimension may be achieved.
    Type: Grant
    Filed: November 4, 2004
    Date of Patent: May 13, 2008
    Assignee: International Business Machines Corporation
    Inventors: Joan La Verne Mitchell, Timothy James Trenary, Nenad Rijavec, Ian Richard Finlay
  • Patent number: 7362881
    Abstract: An obstacle detection system using stereo cameras mounted on a vehicle, to detect an obstacle existing on a ground plane at a high speed and in a high precision even with the stereo cameras being uncalibrated and with a vibration during a traveling and a change in the inclination of the ground plane. The obstacle detection system comprises: a plurality of uncalibrated TV cameras for inputting stereo images; an image storage unit 2 for storing a plurality of images inputted from the TV cameras; a feature extraction unit 3 for extracting a plurality of mutually parallel lines existing on the ground plane; a parameter computation unit 4 for determining a relation to hold between the projected positions of an arbitrary point of the ground plane upon the individual images, from the plurality of lines extracted by the feature extraction unit 3; and a detection unit 5 for detecting an object having a height from the ground plane, by using the relation determined by the parameter computation unit 4.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: April 22, 2008
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiroshi Hattori, Kazunori Onoguchi, Nobuyuki Takeda
  • Patent number: 7356177
    Abstract: According to the present invention, techniques including a method and apparatus for classifying and displaying images are provided. In an embodiment of the present invention a defect image classification method using inspected objects is provided. The method includes defect images obtained from at least one inspected object. Next a set of defect images is classified into a specified category, which has a feature. The defect images are arranged for display according to the feature and then displayed. The arranging of the defect images may also be based on an evaluation value for each defect image. Another embodiment provides a defect image classification method using inspected objects. Defect images are obtained from at least one inspected object.
    Type: Grant
    Filed: August 17, 2006
    Date of Patent: April 8, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Kenji Obara, Yuji Takagi, Ryo Nakagaki, Yasuhiko Ozawa, Toshiei Kurosaki, Seiji Isogai
  • Patent number: 7352890
    Abstract: A system for analyzing defects in electronic circuit patterns, including: comparing position information of structural defects with position information of electrical faults and extracting corroborated defects having common position information between the structural defects and electrical faults; classifying images of extracted corroborated defects into critical defect images and non-critical defect images based on a pre-stored classification rule which defines critical and non-critical defects by referring to images of defects, position information of defects, and results of performing an electronic test; modifying the pre-stored classification rule by correcting classification of classified defect images displayed on the screen; and repeating the operations for each subsequent object, wherein for each present object under inspection, using a modified pre-stored classification rule with respect to a previous object, as the pre-stored classification rule for the operations with respect to the present object.
    Type: Grant
    Filed: February 17, 2006
    Date of Patent: April 1, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Shimoda, Ichirou Ishimaru, Yuji Takagi, Takuo Tamura, Yuichi Hamamura, Kenji Watanabe, Yasuhiko Ozawa, Seiji Isogai
  • Patent number: 7352901
    Abstract: Defects in the contour of a target object is detected by obtaining an digital variable-density image of the contour and edges are extracted from the image of the contour so as to sequentially represent the contour. Their directions are measured and the direction of each edge is compared with those of other edges selected according to their distances from the edge under consideration. The differential is indicative of the presence or absence of an indentation or a protrusion in the contour, representing a defect.
    Type: Grant
    Filed: October 9, 2001
    Date of Patent: April 1, 2008
    Assignee: OMRON Corporation
    Inventor: Shiro Fujieda
  • Patent number: 7336837
    Abstract: Methods, computer code products and devices for encoding and/or decoding video data in multiple passes, the video data having a multiple components each component including multiple coefficients. The method can starting the next pass of the encoding or decoding process immediately after the end of the current encoding or decoding pass for a given component without regard to whether other components have finished the current encoding or decoding pass. In addition, stagger delays and dampers can be used to more closely regulate the encoding or decoding process to ensure that one component is not encoded or decoded too quickly with respect to other components.
    Type: Grant
    Filed: January 11, 2005
    Date of Patent: February 26, 2008
    Assignee: Nokia Corporation
    Inventors: Justin Ridge, Yiliang Bao, Marta Karczewicz, Xianglin Wang
  • Patent number: 7336814
    Abstract: A system and method facilitate machine-vision, for example three-dimensional pose estimation for target objects, using one or more images sensors to acquire images of the target object at one or more positions, and to identify features of the target object in the resulting images. A set of equations is set up exploiting invariant physical relationships between features such as constancy of distances, angles, and areas or volumes enclosed by or between features. The set of equations may be solved to estimate a 3D pose. The number of positions may be determined based on the number of image sensors, number of features identified, and/or number of known physical relationships between less than all features. Knowledge of physical relationships between image sensors and/or between features and image sensors may be employed. A robot path may be transformed based on the pose, to align the path with the target object.
    Type: Grant
    Filed: July 14, 2005
    Date of Patent: February 26, 2008
    Assignee: Braintech Canada, Inc.
    Inventors: Remus F Boca, Babak Habibi, Mohammad Sameti, Simona Pescaru
  • Patent number: 7333638
    Abstract: Minutiae based fingerprint transactions are validated and authenticated over wireless based communications systems, such as over a Bluetooth wireless based communication system. Minutiae points are unique identification points on a fingerprint where a ridge in the fingerprint joins another ridge or a ridge ends. The combination of any three minutiae points forms a triangle, and the method/algorithm of the present invention uses triangles of minutiae points because triangles are proportional regardless of possible differences in scale of two fingerprints being compared. A first method/algorithm uses a minutiae exchange where triplets of minutiae points are exchanged and form triangles for comparison between an original template of minutiae points and a stored template of minutiae points. A second method/algorithm exchanges three linear equations for three pairs of minutiae points that form triangles for comparison between an original template and a stored template.
    Type: Grant
    Filed: January 18, 2005
    Date of Patent: February 19, 2008
    Assignee: Lenovo (Singapore) Pte Ltd.
    Inventors: Seth B. Chisamore, Christopher E. Holladay, Michael P. Outlaw, Matthew B. Trevathan
  • Patent number: 7333631
    Abstract: A landmark used to effectively determine the location of an autonomous vehicle, and a self-localization apparatus and method using the landmark are provided. In the self-localization method, first, first and second outer line information and shape information are extracted from a landmark image received from a camera. Next, a projective invariant is calculated from the shape information and stored in a hash table. Thereafter, the calculated projective invariant is compared with reference projective invariants for a plurality of landmarks stored in a predetermined data storage area in the form of a hash table, thereby determining which landmark corresponds to the landmark image. Then, information on the distance and orientation of the determined landmark with respect to the autonomous vehicle is analyzed in response to the first and second outer line information.
    Type: Grant
    Filed: May 5, 2003
    Date of Patent: February 19, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kyoung-sig Roh, Young Son, Ki-cheol Park, Joo-young Kwak
  • Patent number: 7330580
    Abstract: A system for inspecting a liquid crystal display (LCD) panel (10) includes a magnifier (11) for magnifying an image of the inspected LCD panel, a charge coupled device (CCD) camera (12) for capturing the magnified image of the inspected LCD panel, an image acquisition card (13) for converting analog signals of the magnified image into digital signals, and a computer (14). The computer is for obtaining color template intervals based on a statistical theory, rotating the magnified image when necessary, obtaining transverse mask codes and longitudinal mask codes of magnified image pixels, obtaining a color transverse mask code matrix of sub-pixels of the inspected LCD panel, and determining whether the sub-pixels of the inspected LCD panel are defective according to the color transverse mask matrix. A related method for inspecting an LCD is also provided.
    Type: Grant
    Filed: October 28, 2004
    Date of Patent: February 12, 2008
    Assignees: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Yi-Feng Weng, Xiao-Guang Li, Xin Lu
  • Patent number: 7330601
    Abstract: A method for describing pattern repetitiveness which may exist within an image, is provided. The method of describing pattern repetitiveness of an image comprises: (a) projecting an image on a predetermined axis having a predetermined direction, (b) decomposing the projected image down one level, (c) increasing a threshold value while a pattern quantizing value is retained, and denoising the decomposed data, and (d) describing pattern repetitiveness of the image using the pattern quantizing value of the denoised data and the threshold value used for denoising. Because the method of describing pattern repetitiveness of an image effectively denoises the original image without damaging the pattern repetitiveness of the original image, and the pattern repetitiveness is described using the denoised data, it is possible to describe more definite pattern repetitiveness.
    Type: Grant
    Filed: April 2, 2001
    Date of Patent: February 12, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyun-doo Shin, Yang-lim Choi
  • Patent number: 7327886
    Abstract: Processing for judging whether a face is included in a frame is performed, in a predetermined interval, on each of frames included in a moving image of a subject, displayed on a monitor, until the judgment becomes positive. If it is judged that a face is included in a frame, the facial position is detected in the frame, and stored. Then, judgment is made as to whether a face is included in the next frame after predetermined time. If the judgment is positive, the facial position is detected. The previously stored facial position is replaced by the newly detected facial position, and the newly detected facial position is stored. These processes are repeated until photographing operation is performed by operating a release unit.
    Type: Grant
    Filed: January 19, 2005
    Date of Patent: February 5, 2008
    Assignee: FUJIFILM Corporation
    Inventor: Wataru Ito
  • Patent number: 7327861
    Abstract: The organism authenticating apparatus 71 of this invention comprises a means that fixes the position of a hand or a finger of a hand, an infrared ray radiating means 97 that radiates infrared rays, an infrared ray image input means 91 that is placed at the opposite side of said hand or said finger of a hand with regard to said infrared ray radiating means, an organism recognizing means that recognizes that the organism is live, a processing means that processes data that are inputted by said infrared ray image input means so that it collates them with image data that are registered in advance and an output means that outputs the result of processing carried out by said processing means. By using this invention, it becomes possible to obtain a clear blood vessel pattern image by a compact size apparatus by using an infrared ray source and by capturing the passed-through infrared ray image of the organism, and it becomes possible by using an organism recognizing means to prevent false authentication.
    Type: Grant
    Filed: February 25, 2002
    Date of Patent: February 5, 2008
    Assignee: Bionics Co., Ltd.
    Inventors: Kinya Choshi, Yusuke Kaneda
  • Patent number: 7327870
    Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.
    Type: Grant
    Filed: March 14, 2006
    Date of Patent: February 5, 2008
    Assignee: Teradyne, Inc.
    Inventor: Rohit Patnaik
  • Patent number: 7327905
    Abstract: When a photo album is generated of an event such as wedding, images to be inserted in image insertion areas in a template can be selected easily. A professional photographer photographs the bride and groom on the day of wedding, and obtains image data sets. An editing screen has a catalog display field and a template display field. The image data sets are classified into scenes in the event, and correspondence information representing correspondence between the scenes in the event, the classified image data sets, and pages in the template is generated with reference to a table relating the scenes to the pages. A catalog of the image data sets classified into the scene corresponding to a specified one of the pages is displayed in the editing screen with reference to the correspondence information.
    Type: Grant
    Filed: November 29, 2004
    Date of Patent: February 5, 2008
    Assignee: FUJIFILM Corporation
    Inventors: Takashi Tsue, Koichi Yamada
  • Patent number: 7319791
    Abstract: A method for recognizing an object in a target image using model primitives comprising an additive primitive and a subtractive primitive; weights are assigned to the additive and subtractive primitives; a target primitive is derived for the object; associations are determined between the target primitive and the model primitives; a similarity score is computed for the target primitive with respect to the model primitives; the similarity score is increased for each association between the target primitive and the additive primitive and decreased for each association between the target primitive and the subtractive primitive; the weights determine an amount by which the similarity score is increased or decreased for each of the associations.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: January 15, 2008
    Assignee: Matrox Electronic Systems, Ltd.
    Inventors: Stephane Baldo, Djamel Yahia Meddah
  • Patent number: 7315641
    Abstract: A pattern correcting method of a mask for manufacturing a semiconductor device includes extracting a correction portion to be corrected from a mask pattern on the mask, obtaining a surrounding environment of the correction portion and giving a correction amount to the correction portion. The correction amount is variable. The variable correction amount is given to the correction portion in accordance with the surrounding environment of the correction portion.
    Type: Grant
    Filed: September 14, 2000
    Date of Patent: January 1, 2008
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kei Yoshikawa, Satoshi Usui, Koji Hashimoto
  • Patent number: 7308140
    Abstract: A method of measuring a similarity between images is provided. The method includes the steps of (a) computing a statistical dissimilarity between the images; (b) computing a perceptual dissimilarity between the images; and (c) computing a dissimilarity between the texture features of the images based on the statistical dissimilarity and the perceptual dissimilarity. When images perceptually similar to a query image are searched and retrieved according to the above measuring method, the possibility that the retrieved images are not perceptually similar to the query image is small. Accordingly, the image searching performance can be improved when searching images having texture features similar to that of a query image.
    Type: Grant
    Filed: April 2, 2001
    Date of Patent: December 11, 2007
    Assignees: Samsung Electronics Co., Ltd., The Regents of the University of California, Applera Corporation
    Inventors: Hyun-doo Shin, Yang-Iim Choi, Bangalore S. Manjunath, Peng Wu
  • Patent number: 7308133
    Abstract: A system and method for classifying facial image data, the method comprising the steps of: training a classifier device for recognizing one or more facial images and obtaining corresponding learned models the facial images used for training; inputting a vector including data representing a portion of an unknown facial image to be recognized into the classifier; classifying the portion of the unknown facial image according to a classification method; repeating inputting and classifying steps using a different portion of the unknown facial image at each iteration; and, identifying a single class result from the different portions input to the classifier.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: December 11, 2007
    Assignee: Koninklijke Philips Elecyronics N.V.
    Inventors: Srinivas Gutta, Miroslav Trajkovic, Vasanth Philomin
  • Patent number: 7305120
    Abstract: According to the claimed invention, a method of scanning and measuring surfaces of a three-dimensional object is disclosed. The method includes (a) scanning the object from one or more different angles with a scanning device; (b) identifying unscanned surfaces of the object that have not yet been scanned by the scanning device; (c) estimating surface areas of the unscanned surfaces; (d) comparing the surface areas of the unscanned surfaces for selecting an unscanned surface having the largest surface area; (e) rotating the object with respect to the scanning device such that the scanning device is pointing towards the unscanned surface with the largest surface area; (f) scanning the object with the scanning device for scanning the unscanned surface with the largest surface area; and (g) repeating steps (b) to (f) until all required surfaces of the object have been scanned.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: December 4, 2007
    Assignee: BenQ Corporation
    Inventor: Wen-Kuei Li