Patents Examined by Byungro Ro Lee
  • Patent number: 11287453
    Abstract: A method for measuring a power-on reset time includes: detecting a power supply pin voltage of a chip, and recording a time point at which the power supply pin voltage reaches a preset voltage as a first time point; detecting an output signal of a preset pin of the chip, and recording a time point at which the preset pin completes a pulse output for a first time after the chip is powered on, as a second time point, and recording a time point the preset pin completes a pulse output for a second time, as a third time point; wherein widths of the pulse output for the first time and for the second time are the same; and computing the power-on reset time of the chip according to the first time point, the second time point and the third time point.
    Type: Grant
    Filed: October 22, 2018
    Date of Patent: March 29, 2022
    Assignee: Shenzhen Goodix Technology Co., Ltd.
    Inventors: Qingbin Li, Dekun Chen