Abstract: A system, robot and method to measure the color of an area of a sample. The system includes a light source to emit spatially coherent light that includes a broad spectrum of wavelengths; an optical arrangement to scan an area of the sample, part-by-part, with a collimated beam of said light; an optical spectrometer to receive scattered light and measure an optical spectrum for each part; and a computing device. The optical arrangement includes a collimator and/or is configured to preserve collimated said spatially coherent light. The system is configured for synchronizing the scanning of the area with the recording of the optical spectra for the area's parts, the recording of the optical spectrum of each part lasting an optical spectrum integration time equal to the duration of the scan of said part. The computing device determines color coordinates, computes and analyzes an overall optical spectrum, calculates XYZ Tristimulus values.

Abstract: The invention is a method for manufacturing filters for an optical filter system, for manufacturing an optical filter system, and for manufacturing an optical measurement device. The system comprises a plurality of filters, and a frame holding the plurality of filters in a predefined pattern. The method comprises, per filter, the steps of: applying a plurality of coatings on a substrate to obtain a coated substrate provided with a stack of filter coatings designed for the specific spectral sensitivity of the filter, dividing the coated substrate into a plurality of portions, determining the good ones of the portions, which meet a predefined design requirement, dicing the coated substrate into the plurality of portions, and picking a good one of the portions as the filter.

Abstract: A physical body inspection system includes a light source device, an image pickup device and a display. The light source device is configured to apply light in a predetermined wavelength band to a physical body, the physical body being an inspection object, the predetermined wavelength band being a wavelength band in wavelength bands constituting environment light at an inspection time-of-day, and the light in the predetermined wavelength band being low in intensity. The inspection time-of-day is a time of day when the physical body is inspected. The image pickup device is configured to pick up an image of the physical body. The display is configured to display the picked-up image of the physical body.

Abstract: A dual resolution spectrometer includes a slit plate comprising a slit receiving light reflected from a measurement target. The slit plate directs the light reflected from the measurement target to a first mirror. The first mirror reflects light from the slit to a diffraction grating. The diffraction grating disperses light from the first mirror according to a wavelength of the light. The diffraction grating directs light in a first wavelength region to a second mirror and directs light in a second wavelength region to a third mirror. The second mirror reflects the light in the first wavelength region to a detector. The third mirror reflects the light in the second wavelength region to the detector. The detector detects the light in the first wavelength region and the light in the second wavelength region with different resolutions from each other.

Abstract: Provided are an inspection method, a program, and an inspection system capable of improving accuracy of inspecting a color of a surface of an object. The inspection method includes acquisition step and comparison step. Acquisition step is a step of acquiring a target image of a surface of an object obtained by an imaging system imaging the surface of the object illuminated by an illumination system. Comparison step, is a step of comparing a color of an attention region on the target image with a color of a reference region. The reference region is a region of a reference image of a surface of a reference object as a reference of a color of the object, and a region corresponding to a combination of an incident angle of light from the illumination system and a reflection angle of light to the imaging system in the attention region.

Abstract: Disclosed is an apparatus for acquiring polarized images attached to a thermal analysis apparatus including a pair of sample containers housing a measurement sample and a reference sample, respectively, and a heating furnace, configured to observe at least the measurement sample through a window or an opening of the heating furnace, and including an attachment section attached to the thermal analysis apparatus, a light source, a polarizer configured to polarize light emitted from the light source, a camera and an analyzer polarize light reflected from the measurement sample or the reference sample to enter the camera after the measurement sample or the reference sample is irradiated via the window or the opening with polarized light transmitted through the polarizer. A first optical path of the polarizer and a second optical path of the analyzer are not parallel, and both the polarizer and the analyzer are rotatable.

Abstract: The invention relates to an assembly comprising a interferometer for carrying out an optical coherence tomography, wherein the interferometer is divided into two spatially spaced-apart interferometer parts (1, 2), wherein the two interferometer parts (1, 2) can be moved related to one another and are optically connected to one another via flexible light guides (3, 4, 5), which bridge the spatial distance, wherein according to the invention, an assembly having an interferometer is provided, which is as unsusceptible as possible to the effects brought about by bending a tube cable packet and allows for an optimum signal-to-noise ratio or an optimum image quality of an OCT image, characterised in that at least one first flexible light guide (3) is designed as a polarisation-maintaining light guide consisting of two connected polarisation-maintaining light-guiding fibres (3a, 3b).

Abstract: A method of creating a local oscillator light beam LO for a phase-resolved spectroscopy measurement comprises the steps of providing a first measuring light beam (1) and a second measuring light beam (2) being aligned to each other, creating the local oscillator light beam LO by an optical non-linear interaction of a first portion (1A) of the first measuring light beam (1) and a first portion (2A) of the second measuring light beam (2) in an optical nonlinear medium (20), and superimposing the local oscillator light beam LO, a second portion (1B) of the first measuring light beam (1) and a second portion (2B) of the second measuring light beam (2) with a predetermined mutual phase relationship, for providing a sample light beam (3) for the phase-resolved spectroscopy measurement. The local oscillator light beam LO and the second portions (1B, 2B) of the first and second measuring light beams (1, 2) are superimposed with a displaced Sagnac interferometer (10).

Abstract: A method generates first points based on a first scan of an environment that includes one or more moving objects. The method transforms the first points into a first static frame, which includes removing one or more of the first points corresponding to the one or more moving objects. The method generates second points based on a second scan of the environment that includes the one or more moving objects. The method transforms the second points into a second static frame, which includes removing one or more of the second points corresponding to the one or more moving objects. The method combines the first static frame and the second static frame into an accumulated static frame, which has an increase in resolution compared with the first static frame. The method then loads the accumulated static frame into a point cloud.

Abstract: A sensor system, the manufacturing of such system, and the use of such system for optical detection of a target analyte in a gaseous medium are described. The sensor system includes a hollow waveguide that is provided with a reflective mirror layer along its inner wall and a concentrating coating of an inorganic sorption material. The mirror layer defines a light path for guiding light between a light inlet and a light outlet that are provided on opposing terminal ends of the hollow waveguide. The concentrating coating increases an effective concentration of target analytes, if present, and allows optical, preferably spectroscopic, analysis of the medium by recording transmission of light, preferably infrared light, guided through the hollow waveguide.

Abstract: A temporal magnification spectrometer includes a dual-chirp comb source, a signal leg, a local oscillator leg, an optical detector, and a temporal magnification analyzer. The dual-chirp comb source produces optical carrier laser light. A signal comb having signal linearly chirped waveforms interacts with a sample to produce a transmitted signal comb. The local oscillator leg produces a local oscillator comb having local oscillator linearly chirped waveforms. The optical detector receives the transmitted signal and local oscillator combs and produces an RF domain signal. The analyzer receives and Fourier transforms the RF domain signal to produce an RF comb, which is sampled to produce sampled RF comb lines, which are normalized to produce temporally magnified sample frequency domain data. Intermediate sample temporal data are normalized to produce a steady-state sample spectral response.

Abstract: Embodiments of the present invention relate to apparatus and methods for dual comb spectroscopy with deterministic stepping and scanning of temporal pulse offset. In one embodiment, the present invention relates to a novel dual-comb spectroscopy including mode locked robust Er-combs and digital phase-locking electronics for step scanning between the two frequency combs and applicable to any phase-locked dual-comb system. The tight phase control of the DCS source allows for the control of temporal offset between the two comb pulses during measurements.

Abstract: A micro light emitting device inspection apparatus adapted to inspect a plurality of micro light emitting devices is provided. The micro light emitting device inspection apparatus includes a carrier stage, a light guide module and a detective module. The carrier stage is configured to hold the micro light emitting devices. The light guide module has a plurality of optical fibers. Each of the optical fibers has a light receiving surface and a light emitting surface away from each other. The at least one light beam is received by the light receiving surface of each optical fiber and exits through the light emitting surface of the optical fiber. The detective module is configured to receive and detect the at least one light beam from the light emitting surface of each optical fiber, thereby obtaining at least one optical property.

Abstract: A detection device is adapted to traverse a search area and generate sensor data associated with an object that may be present in the search area, the detection device comprising a first logic device configured to detect and classify the object in the sensor data, communicate object detection information to a control system when the detection device is within a range of communications of the control system, and generate and store object analysis information for a user of the control system when the detection device is not in communication with the control system. A control system facilitates user monitoring and/or control of the detection device during operation and to access the stored object analysis information. The object analysis information is provided in an interactive display to facilitate user detection and classification of the detected object by the user to update the detection information, trained object classifier, and training dataset.

Abstract: The present disclosure provides a method for detecting light leakage of a screen, a method for detecting ambient light, and an apparatus for detecting ambient light. The method for detecting light leakage of a screen includes: acquiring display parameters of a screen, the display parameters including: a brightness value of the screen and grayscale values of respective pixel points within a preset display region of the screen; inputting the display parameters into a pre-trained neural network model, to process the display parameters using the neural network model, to obtain light leakage values corresponding to the respective pixel points; and obtaining a light leakage value of the screen based on the light leakage values corresponding to the respective pixel points. Based on the above technical solutions, the light leakage value of the screen can be accurately and reliably determined.

Abstract: An interferometric system is provided that includes detects, authenticates and quantifies analytes such as taggants. Methods of using such systems as part of an authentication and material tracking processes are also provided.

Abstract: Light mapping devices and systems for use in indoor or vertical farming are disclosed herein. In particular, a light detection device is provided that includes a plurality of light sensors configured for detecting light emitted from one or more light sources at distinct positions across a grow plane. The light detection device will also include a microcontroller and one or more signal routing circuit boards, or junctions, for making electrical connections between the light sensors and the microcontroller in a multiplex architecture to enable the microcontroller to cycle through and read the Lux values from each of the light sensors with sub-second frequency and in real-time. The light detection device may also be part of a light mapping system that converts the Lux values to PPFD and generates a heatmap of PPFD intensity at distinct locations across the grow plane.

Abstract: The present invention relates to the use of a Raman spectral signature of nitrate, as a biomarker for an early, real-time diagnosis of nitrogen status in growing plants in a non-invasive or non-destructive way in order to detect nitrogen deficiency before the onset of any visible symptoms. The early, real-time diagnosis of nitrogen deficiency in plants makes it possible to correct nitrogen deficiency for the avoidance of negative effects on the yield and biomass of growing plants or leafy vegetables.

Abstract: A non-contact apparatus for measuring wafer thickness includes a monolithic wavelength sweeping semiconductor laser light source having a laser source, a laser control unit that controls the laser source, and a processor to control the laser source to oscillate laser light having a wavelength that changes with a setting profile relative to time; an optical system that guides and emits the laser light onto a wafer; a detection unit that detects an interference light signal of reflected light; an A/D converter that converts the interference light signal detected by the detection unit into a digital signal; and a calculation unit that calculates a thickness of the wafer by analyzing the digital signal from the A/D converter. The processor causes the laser control unit to operate with a clock signal, and to oscillate laser light that performs wavelength-sweeping with the setting profile relative to the time, from the laser source.

Abstract: The invention relates to a method and to an assembly (200) for localizing an optical coupling point (11) and to a method for producing a microstructure (100) at the optical coupling point (11).