Abstract: A displacement measurement device 10 is provided with: a laser light source 11 for emitting laser light to a measurement area R of a measurement target object S; a focusing optical system (the beam splitter 151, the first reflecting mirror 1521, the condenser lens 155) having a front focal point in the measurement area R and a rear focal point on a predetermined imaging surface (the detection surface 1561); a non-focusing optical system (the beam splitter 151, the diffuser 153, the second reflecting mirror 1522, and the condenser lens 155) in which light from a measurement area R of a correspondence point in the measurement area corresponding to each point of the imaging surface with respect to the focusing optical system is incident on the point of the imaging surface; and a photodetector (image sensor 156) configured to detect light intensity on the imaging surface for each point.

Abstract: A system (100) and method can monitor a reflectance of a mirror target that includes at least one curved mirror (M). The system (100) can take a first irradiance measurement of the sun (S), the first irradiance measurement representing a direct solar irradiance. The system (100) can take a second irradiance measurement that represents an irradiance from a reflection of the sun (S) from the mirror target plus background irradiance from a reflection of the sky from the mirror target. The system (100) can take a third irradiance measurement that represents the background irradiance from the reflection of the sky from the mirror target. The system (100) can determine a reflectance of the mirror target from the first, second, and third irradiance measurements. The system (100) can compare the reflectance to a specified reflectance threshold, and, upon determining that the reflectance of the mirror target is less than the specified reflectance threshold, can generate an alert signal.

Abstract: An electronic device includes a housing that houses a movable member inside the housing, and a shock absorbing member that reduces a shock to the movable member. The shock absorbing member holds the housing on an inner side of the shock absorbing member and includes at least one of a protrusion protruding in a direction along a movable direction of the movable member or a depression depressed in a direction along the movable direction on an outer side of the shock absorbing member.

Abstract: Embodiments are directed to an optical spectrometry method, comprising: generating a sequence of 2D Hadamard masks along the time dimension, wherein each 2D Hadamard mask is arranged with a wavelength dimension and a coefficient dimension; detecting an optical signal from light transmitted through the sequence of 2D Hadamard masks; and reconstructing a spectrum to be detected by analyzing the optical signal, wherein each 2D Hadamard mask in the sequence of 2D Hadamard masks comprises a plurality of columns along the wavelength dimension, each column corresponding to a different Hadamard coefficient, and having different respective sequency values along the time dimension.

Abstract: Imaging apparatus (22) includes a radiation source (40), which emits pulsed beams (42) of optical radiation toward a target scene (24). An array (52) of sensing elements (78) output signals indicative of respective times of incidence of photons in a first image of the target scene that is formed on the array of sensing elements. An image sensor (64) captures a second image of the target scene in registration with the first image. Processing and control circuitry (56, 58) identifies, responsively to the signals, areas of the array on which the pulses of optical radiation reflected from corresponding regions of the target scene are incident, and processes the signals from the sensing elements in the identified areas in order measure depth coordinates of the corresponding regions of the target scene based on the times of incidence, while identifying, responsively to the second image, one or more of the regions of the target scene as no-depth regions.

Abstract: A method and system are presented for use in measuring one or more characteristics of patterned structures. The method comprises: performing measurements on a patterned structure by illuminating the structure with exciting light to cause Raman scattering of one or more excited regions of the pattern structure, while applying a controlled change of at least temperature condition of the patterned structure, and detecting the Raman scattering, and generating corresponding measured data indicative of a temperature dependence of the detected Raman scattering; and analyzing the measured data and generating data indicative of spatial profile of one or more properties of the patterned structure.

Abstract: Embodiments of the disclosure include a receiver of an optical sensing system. The receiver may include a Hadamard mask configured to resonate during a scanning procedure performed by the optical sensing system. The Hadamard mask may include a frame beginning pattern corresponding to a start of a frame captured during the scanning procedure. The Hadamard mask may also include a coded pattern configured to provide sub-pixelization of the frame. The receiver may also include a photodetector array positioned on a first side of the Hadamard mask. The photodetector array may be configured to detect light that passes through the Hadamard mask during the scanning procedure to generate the frame.

Abstract: An illumination device for a spectral optical measurement device includes arranged with respect to an optical axis of the illumination device which, during a measurement operation, extends along a normal to a center point of an area of a sample to be illuminated. One or more segments of a mirror in a shape of a ring are centered on the optical axis. The mirror has an internal reflective surface arranged such that, during the measurement operation, the internal reflective surface receives light emitted from the light source and reflects the light over the area of the sample to be illuminated. The internal reflective surface has a freeform shape in a cross-section through the internal reflective surface in a plane parallel to the optical axis (for example in which the optical axis lies), and, in a cross-section of the mirror in a plane perpendicular to the optical axis, the internal reflective surface is represented by a straight line.

Abstract: An optical power meter unit includes a transmitting/receiving port configured to connect to a fiber under test. The optical power meter unit also includes a light source and an optical power meter. The optical power meter unit further includes an optical fiber extending between the transmitting/receiving port and the optical power meter. The optical fiber has a core size greater than a core size of the fiber under test.

Abstract: A method of optical device metrology is provided. The method includes introducing a first type of light into a first optical device during a first time period, the first optical device including an optical substrate and an optical film disposed on the optical substrate, the first optical device further including a first surface, a second surface, and one or more sides connecting the first surface with the second surface; and measuring, during the first time period, a quantity of the first type of light transmitted from a plurality of locations on the first surface or the second surface during the first time period, wherein the measuring is performed by a detector coupled to one or more fiber heads positioned to collect the light transmitted from the plurality of locations.

Abstract: The invention discloses a glycosuria measurement device, comprising a prism body and a housing. The prism body comprises a first accommodating space, a junction surface, a first light penetrating surface, a second light penetrating surface, a third light penetrating surface and a light-emitting surface. The first accommodating space accommodates urine. The junction surface is formed at a bottom surface of the first accommodating space. The first light penetrating surface is formed at the first lateral surface of the first accommodating space. The second light penetrating surface is formed at the second lateral surface of the first accommodating space. The third light penetrating surface is disposed opposite to the junction surface. The light-emitting surface is disposed opposite to the junction surface. The housing comprises a second accommodating space, a first light-emitting port and a second light-emitting port. The second accommodating space accommodates the prism body.

Abstract: Provided are an inspection method, a program, and an inspection system capable of improving accuracy of inspecting a color of a surface of an object. The inspection method includes acquisition step and comparison step. Acquisition step is a step of acquiring a target image of a surface of an object obtained by an imaging system imaging the surface of the object illuminated by an illumination system. Comparison step is a step of comparing a color of an attention region on the target image with a color of a reference region. The reference region is a region of a reference image of a surface of a reference object as a reference of a color of the object, and a region corresponding to a combination of an incident angle of light from the illumination system and a reflection angle of light to the imaging system in the attention region.

Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.

Abstract: Provided is an identification apparatus wherein each spectral light beam corresponding to a predetermined wavenumber shift is projected to the imaging portion) so that a distance between a projection position of the spectral light beam corresponding to the predetermined wavenumber shift on the imaging portion and a changed projection position as a result of the different excitation wavelength is shorter than a distance at the imaging lens between an optical path of the spectral light beam corresponding to the predetermined wavenumber shift and a changed optical path as a result of the different excitation wavelength.

Abstract: A sensor degradation evaluation method according to an aspect of the present disclosure includes an evaluation step of evaluating degradation of at least one of a sensor for coarse measurement that receives interference fringes produced by a spectrometer for coarse measurement and a sensor for fine measurement that receives interference fringes produced by a spectrometer for fine measurement, and the evaluation step includes causing a plurality of kinds of laser light having wavelengths different from one another to be sequentially incident on the spectrometer for coarse measurement and the spectrometer for fine measurement and acquiring a coarse-measurement wavelength and a fine-measurement wavelength on a wavelength basis from a plurality of the received interference fringes, acquiring a degradation parameter on a wavelength basis from the coarse-measurement wavelength and the fine-measurement wavelength on a wavelength basis, and comparing the degradation parameter on a wavelength basis with a threshold.

Abstract: An optical inspection system that may include an illumination optics configured to generate an illumination light beam and to illuminate a sample with the illumination light beam; at least one collection optics configured to collect light from the sample; at least one detector configured to detect at least one detected light beam outputted from the at least one collection optics; multiple polarizers that are configured to (a) set a polarization of the illumination light beam by selectively introducing, under a control of the control unit, at least one illumination optics polarization change, and (b) set a polarization of the at least one detected light beam by selectively introducing, under a control of the control unit, at least one collection optics polarization change. The multiple polarizers may include one or more illumination half-wave plates, one or more quarter-wave plates, and one or more inhomogeneous polarizers.

Abstract: An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.

Abstract: A measuring apparatus for measuring a spectrum of a gaseous sample includes a tunable laser light source to provide an illuminating light beam, a sample cell with an inner surface to provide scrambled light that is transmitted through the gaseous sample, a detector to detect intensity of transmitted scrambled light and a pressure control system to maintain an absolute pressure of the gaseous sample smaller than 50 kPa inside the sample cell to reduce spectral widths of spectral features of the gaseous sample. The measuring apparatus measures spectral transmittance values of the sample by modulating the spectral position of the illuminating light, and detecting the intensity of the transmitted light at different spectral positions. The divergence of the illuminating light beam in a transverse direction is greater than 30° to cause multiple consecutive reflections of the scrambled light from the inner surface.

Abstract: A method includes: transmitting an incident light to an object located on a stage, in which a first light and a second light are reflected; receiving the first light and the second light by an imaging lens group to obtain a third pattern corresponding to the first pattern and a fourth pattern corresponding to the second pattern; transmitting the third pattern and the fourth pattern to an image sensor, in which a center point of the third pattern and a center point of the fourth pattern are separated by a first distance on the image sensor; calculating a tilted angle between an optical axis of the imaging lens group and a normal direction of the stage according to the first distance; and adjusting the stage according to the tilted angle such that the normal direction is parallel to the optical axis.

Abstract: The spectroscopic measuring instrument includes: a spectrometer to make measurement of a reflection spectrum of an object relative to a light source and output measurement information representing a result of the measurement; a shadow projector including obstacle(s) to allow light from the light source to cast shadow(s) on an object surface; an imaging device to output image information representing an image of an imaging area including the object surface; a storage interface removably connectable to a computer readable medium; and a processing device. The processing device is connected to the spectrometer, the imaging device and the storage interface, and performs a measurement process of storing the measurement information from the spectrometer and the image information from the imaging device in the computer readable medium connected to the storage interface.