Abstract: Methods, systems, and apparatuses provide dynamic creation and modification of wafer test maps. Test plans are defined for a testing session of a wafer lot. The test plan is associated with a number of seed map patterns. During a wafer lot testing session, test results are dynamically obtained and examined at run-time of a test. Moreover, the seed map patterns are overlaid on the test sites defined in the test plan. If the test result statistics are outside of defined threshold tolerance levels, then a new wafer test map is created or modified at run-time, according to corresponding seed map patterns. If seed map patterns are within the intersection of valid test sites, then seed map patterns are created at run-time.

Abstract: A technique for monitoring operational parameters of networked components includes storing data within each component descriptive of the component. The data is polled by a monitoring station and provides a basis for monitor views compiled in real time. The monitor views provide a view of current levels of parameters controlled or monitored by each device, such as on virtual meters. Historical levels of operational parameters may be presented in virtual strip chart output. Textual descriptions of the components are provided, along with listings of key settings. More detailed data may be accessed by links between the monitor views and other user viewable representations for the system and the specific components.