Patents Examined by Casey Bryant
  • Patent number: 10168208
    Abstract: A signal detected by a photomultiplier tube is pre-amplified and converted into a digital signal. A time average value of signal components, each of which has a voltage lower than a predetermined base threshold value, is calculated as a base voltage. A signal that has been subjected to base correction processing is subjected to threshold value processing and to base correction processing in a non-incident state in which light is not incident on the photomultiplier tube. An output signal thereof is subjected to dark current calculation processing; and a light emission signal amount is calculated by subtracting, from the signal component of the detection light obtained by the threshold value processing, a time average value of the signal components of the dark current. As the result, discriminating the dark current pulse from floor noises enhances the accuracy of the base voltage, and thus the accuracy of light detection.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: January 1, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yutaka Kasai, Fujio Onishi, Osamu Tasaki, Hidetsugu Tanoue, Kazuhiro Tanaka
  • Patent number: 10165999
    Abstract: Improvement of a frame rate and suppression of power consumption are intended. A radiological-image acquisition device (100) includes a plurality of pixels, a capacitive element (1a) that accumulates electric charge corresponding to a dose (X) of radiation, and a read control unit (read element control unit 22, reset element control unit 23) that reads, from at least one pixel (active pixel 10) that is not subjected to initialization in two or more frames, an output (output voltage Vout) corresponding to the electric charge.
    Type: Grant
    Filed: March 10, 2016
    Date of Patent: January 1, 2019
    Inventors: Kunihiko Iizuka, Shigenari Taguchi, Katsuhisa Kashiwagi
  • Patent number: 10156711
    Abstract: Various embodiments for a multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample are disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each generated multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: December 18, 2018
    Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
    Inventors: Hari Shroff, Andrew York
  • Patent number: 10156644
    Abstract: A counting X-ray detector includes, in a stacked array, a converter material for converting X-ray radiation into electric charges and an electrode. In an embodiment, the electrode is electrically conductively connected to the converter material. The electrode is designed to be at least partly transparent. In an embodiment, the electrode includes: an electrically conductive contact layer, an electrically conductive first intermediate layer, an electrically conductive high voltage layer, a second intermediate layer and an electrically conductive heating layer.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: December 18, 2018
    Inventors: Thorsten Ergler, Miguel Labayen De Inza
  • Patent number: 10145733
    Abstract: A method of auto-calibrating light sensor data of a mobile device includes, obtaining, by the mobile device, one or more reference parameters representative of light sensor data collected by a reference device. The method also includes collecting, by the mobile device, light sensor data from a light sensor included in the mobile device, itself. One or more sample parameters of the light sensor data obtained from the light sensor included in the mobile device are then calculated. A calibration model is then determined for auto-calibrating the light sensor data of the light sensor included in the mobile device based on the one or more reference parameters and the one or more sample parameters.
    Type: Grant
    Filed: September 2, 2015
    Date of Patent: December 4, 2018
    Assignee: QUALCOMM Incorporated
    Inventors: Santiago Mazuelas, Ashwin Swaminathan, Piero Zappi, Muralidhar Reddy Akula, Abhijeet Bisain, Aditya Narain Srivastava, Suhas Hariharapura Sheshadri
  • Patent number: 10145963
    Abstract: Provided are a scintillator with improved energy sensitivity dependence within the energy range of diagnostic X-rays, more specifically in the range of 40-150 kV, and a radiation dosimeter using same. Due to the scintillator comprising a photopolymer resin that contains a polymerizable monomer, a filler, and a photopolymerization initiator, energy sensitivity dependence within the range of 40-150 kV is improved. Furthermore, changes in relative sensitivity within this energy range can be reduced to 3% or less by containing an inorganic fluorescent substance such as Zn2SiO4.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: December 4, 2018
    Assignee: National University Corporation Hokkaido University
    Inventor: Masayori Ishikawa
  • Patent number: 10136865
    Abstract: Radioimaging methods, devices and radiopharmaceuticals therefor.
    Type: Grant
    Filed: April 15, 2018
    Date of Patent: November 27, 2018
    Assignee: Spectrum Dynamics Medical Limited
    Inventors: Benny Rousso, Shlomo Ben-Haim, Ran Ravhon, Yoel Zilberstien, Eli Dichterman, Simona Ben-Haim, Nathaniel Roth
  • Patent number: 10132743
    Abstract: Disclosed is a low-cost, portable photo thermal spectroscopy (PTS) reader for use in detecting the presence of diseases in the bodily fluid of affected patients. The PTS reader is designed to be durable, easy to use and provide readings from the Lateral Flow Assay (LFA) with rapid results. Also provided are methods of use.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: November 20, 2018
    Assignees: General Electric Company, Tokitae LLC
    Inventors: Ralf Lenigk, Mark Marshall Meyers, Victor Petrovich Ostroverkhov, Timothy Toepfer, Keith Michael Looney, Terry Lee Saunders, Kevin Paul Flood Nichols, Matthew P. Horning, Benjamin K. Wilson, Daniel Keith Connors, David Gasperino
  • Patent number: 10132944
    Abstract: A method for calibrating an ionizing radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence. The invention first relates to a method for calibrating a device for detecting ionizing radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionizing radiation and the detection material, the method including the determination of a weighting factor at the amplitude A.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: November 20, 2018
    Inventors: Sylvain Stanchina, Guillaume Montemont
  • Patent number: 10132679
    Abstract: Techniques are provided to furnish a light sensor that includes a filter positioned over a photodetector to filter visible and infrared wavelengths to permit the sensing of ultraviolet (UV) wavelengths. In one or more implementations, the light sensor comprises a semiconductor device (e.g., a die) that includes a substrate. A photodetector (e.g., photodiode, phototransistor, etc.) is formed in the substrate proximate to the surface of the substrate. In one or more implementations, the substrate comprises a silicon on insulator substrate (SOI). A filter (e.g., absorption filter, interference filter, flat pass filter, McKinlay-Diffey Erythema Action Spectrum-based filter, UVA/UVB filter, and so forth) is disposed over the photodetector. The filter is configured to filter infrared light and visible light from light received by the light sensor to at least substantially block infrared light and visible light from reaching the photodetector.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: November 20, 2018
    Inventors: Arvin Emadi, Nicole D. Kerness, Cheng-Wei Pei, Joy T. Jones, Arkadii V. Samoilov, Ke-Cai Zeng
  • Patent number: 10128808
    Abstract: An imaging system includes an array of photodetectors and electronic circuitry associated with the photodetectors to read intensity values from the photodetectors. The electronic circuitry can include an integrator with an integrator capacitor having a nominal capacitance, wherein a gain of the electronic circuitry associated with a photodetector can depend at least in part on the actual capacitance of the integrator capacitor, the actual capacitance differing from the nominal capacitance. The imaging system can be configured to determine a gain factor that depends at least in part on the actual capacitance and/or a signal voltage input to the integrator. The imaging system can be configured to apply the gain factor based at least in part on the actual capacitance of the integrator capacitor calculated. The imaging system can be a thermal imaging system and may include an infrared camera core.
    Type: Grant
    Filed: March 9, 2017
    Date of Patent: November 13, 2018
    Assignee: Seek Thermal, Inc.
    Inventors: Jason Wolfe, William J. Parrish, Ross Williams
  • Patent number: 10126442
    Abstract: A neutron spectrometer is described. The neutron detector comprises a conversion layer provided on an outer surface of a spherical core of neutron-moderating material. The conversion layer comprises a neutron absorbing material and a phosphor material. The spherical core is arranged to receive photons emitted from the phosphor material of the conversion layer. The neutron detector further comprises a photodetector optically coupled to the spherical core and arranged to detect the photons emitted from the conversion layer.
    Type: Grant
    Filed: February 13, 2013
    Date of Patent: November 13, 2018
    Assignee: Symetrica Limited
    Inventor: David Ramsden
  • Patent number: 10119868
    Abstract: A system and method for a higher speed auto-correcting temperature measurement in a system using a fiber optic distributed sensor.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: November 6, 2018
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Jason E. Therrien, Mikko Jaaskelainen
  • Patent number: 10114129
    Abstract: A detector for detecting a single x-ray photon with high temporal resolution and high efficiency includes a semiconductor substrate, the semiconductor substrate including element(s) from each of Groups III and V of the Periodic Table of Elements, and pixels on the substrate. Each pixel includes a semiconductor transistor including an epitaxial layer having element(s) from each of Groups III and V of the Periodic Table of Elements, an anode electrically connected to a gate of the semiconductor transistor, and a cathode electrically connected to a drain of the semiconductor transistor. Photon(s) are caused to impinge the single-photon detector along a y-direction (long side of pixel) to provide adequate stopping power, and electron-hole pairs generated by the photon(s) are collected along an x-direction or z-direction (short sides of pixel) to provide short transit time. Detectors form an array of pixels for x-ray imaging with temporal resolution of single photons.
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: October 30, 2018
    Inventors: Michael Yakimov, Serge Oktyabrsky
  • Patent number: 10113954
    Abstract: The present invention relates to an absorption spectroscopy device, comprising a light cavity vessel (1) whose inner wall is at least partially coated with a light reflective layer (2), wherein said light reflective layer is a distributed Bragg reflector or is composed of stainless steel or aluminium; a photo-detector; and a light source, wherein said light source is capable of emitting light radiation which passes through said light cavity vessel, wherein said light cavity vessel is capable of reflecting the emitted radiation and wherein said photo-detector is capable of detecting at least a portion of the emitted light.
    Type: Grant
    Filed: December 11, 2014
    Date of Patent: October 30, 2018
    Assignee: Koninklijke Philips N.V.
    Inventors: Daiyu Hayashi, Achim Hilgers
  • Patent number: 10101207
    Abstract: A method is provided of obtaining a vapor phase spectrum of a compound. The method comprises providing an isolated condensed phase sample of the compound, vaporizing the sample and supplying the vapor to an absorption cell of a spectrometer. A rate at which vapor enters the absorption cell is determined and a steady state concentration of vapor in the absorption cell is established. The spectrum of the vapor is then measured.
    Type: Grant
    Filed: May 29, 2015
    Date of Patent: October 16, 2018
    Inventors: Damien Weidmann, Neil Angus Macleod
  • Patent number: 10094214
    Abstract: Methods, systems, devices, and products for estimating a parameter of interest of a downhole fluid in a borehole intersecting an earth formation. Apparatus include evanescent wave measurement instruments, which may include a substrate configured for contact with a downhole fluid such that at least a portion of the substrate is immersed in the downhole fluid; a waveguide formed in an interior of the substrate and having a configuration geometrically configured to generate an interaction between the downhole fluid and an evanescent wave arising from electromagnetic energy propagating in a segment of the waveguide; and a detector configured to generate measurement information indicative of the downhole fluid in response to electromagnetic signals received from the waveguide responsive to the interaction. The interaction may result in absorption of at least a portion of the electromagnetic energy propagating in the waveguide. The waveguide may be written in the substrate using laser pulses.
    Type: Grant
    Filed: April 6, 2016
    Date of Patent: October 9, 2018
    Inventors: Gunnar Tackmann, Sebastian Jung, Thomas Kruspe
  • Patent number: 10094771
    Abstract: A device for determining a concentration of at least one gas in a sample gas flow by infrared absorption spectroscopy. The device includes an infrared radiation source which emits a radiation which is conducted through an analysis cell, a feed line, the sample gas flow which is conducted into and out of the analysis cell via the feed line, a detector which measures an absorption spectrum arising in the analysis cell, a suction jet pump which includes a propellant gas connection, and a propellant gas line which extends to the propellant gas connection of the suction jet pump. The suction jet pump is arranged downstream of the analysis cell and feeds the sample gas flow through the analysis cell via the feed line. The propellant gas line includes a regulating valve which regulates a propellant pressure in the propellant gas line.
    Type: Grant
    Filed: January 15, 2015
    Date of Patent: October 9, 2018
    Inventor: Stephan Fetzner
  • Patent number: 10088415
    Abstract: A probe includes a transmission line support substrate, a probe tip and a probe tip support substrate. The transmission line support substrate supports a transmission line through which a terahertz wave is transmitted. The probe tip transmits the terahertz wave, and is contact with an object to be measured. The probe tip support substrate supports the probe tip. The probe tip support substrate is detachable from the transmission line support substrate.
    Type: Grant
    Filed: August 9, 2016
    Date of Patent: October 2, 2018
    Inventor: Tsuyoshi Ataka
  • Patent number: 10082390
    Abstract: Methods and systems for feed-forward of multi-layer and multi-process information using XPS and XRF technolgies are disclosed. In an example, a method of thin film characterization includes measuring first XPS and XRF intensity signals for a sample having a first layer above a substrate. A thickness of the first layer is determined based on the first XPS and XRF intensity signals. The information for the first layer and for the substrate is combined to estimate an effective substrate. Second XPS and XRF intensity signals are measured for a sample having a second layer above the first layer above the substrate. The method also involves determining a thickness of the second layer based on the second XPS and XRF intensity signals, the thickness accounting for the effective substrate.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: September 25, 2018
    Inventors: Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael C. Kwan, Mark Klare, Charles Thomas Larson