Patents Examined by Chi-Cheng G Kao
  • Patent number: 7783005
    Abstract: It is an object of the present invention to provide a radiation inspection system, such as an X-ray system, that can operate efficiently even in inclement weather conditions while being highly mobile. Thus the improved inspection system of the present invention is capable of operating in high temperature and corrosive environments and is designed to withstand moisture, dirt and/or dust from the articles of inspection as well.
    Type: Grant
    Filed: November 21, 2008
    Date of Patent: August 24, 2010
    Assignee: Rapiscan Systems, Inc.
    Inventor: Brian Kaval