Abstract: A method is described for determining the polarization state of a sensor of an X-ray detector. In the method, the X-ray detector is illuminated with a sequence of light pulses wherein the individual pulses of the light pulse sequence have a different intensity. It is further determined at what intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit. Also described is a method for obtaining and/or setting functional data of a sensor of an X-ray detector and/or of a sensor illumination unit. Furthermore, an X-ray detector is described.

Abstract: An emitter is configured to move around the object and to emit radiation toward an object. A controller is configured to control the emitter to stop a radiation emission, when the emitter is located in a radiation reception zone in which the radiation emitted by the emitter is received or in which the radiation emitted by the emitter is supposed to be received.