Abstract: A sensor (1) and a method of manufacturing the sensor (1), the sensor (1) including a number of metallic strips (5,6,7) mounted on a non-conducting substrate (4) and a module (3) for forming electrical connections to the strips (5,6,7) whereby to enable communication between the strips (5,6,7) and monitoring equipment for the sensor (4), the module including a number of wire connections (16), the method including the steps of encapsulating the wire connections within a flexible chemical and heat resistant sealing compound, and subsequently, encapsulating the flexible sealing compound within a second sealing compound (34) by an injection molding process.

Abstract: A vessel for storing an object, comprising an electrically insulating container, intended to contain the object and an electrically conductive layer, arranged on a surface of the container. There is a control circuit including an electrically conductive detection element, electrically insulated from the conductive layer and capacitively coupled to the conductive layer. The control circuit is configured to measure the capacitance formed between the conductive layer and an electrically charged object brought close to the conductive layer and to generate a control signal dependent on the measured capacitance.

Abstract: A method of determining a noise figure (NF) response of a device under test (DUT) comprises determining a frequency response of a noise receiver over a first frequency range, measuring a gain of the DUT over a second frequency range encompassing the first frequency range, measuring output-noise power of the DUT over the second frequency range, determining an estimated gain of the DUT based on the frequency response of the noise receiver and the gain of the DUT over the first frequency range, and determining the NF response of the DUT over the second frequency range based on the estimated gain and the output-noise power.

Abstract: A sensor assembly for use in sensor bearings, the sensor assembly comprising at least two sensor units configured to be arranged on a ring of the sensor bearing in different angular positions with regard to the rotation axis of the bearing. Each of the sensor units includes at least one hall sensor plate. At least two hall sensor plates of different sensor units are wired in an antiparallel orientation in order to compensate offset voltages of the hall sensor plates.

Abstract: A method of automated sensing of an electrical anomaly associated with a thermostat may include switching a switching circuit within the thermostat to an on state. The switching circuit may be configured to activate an HVAC function when switched to the on state. The method may also include monitoring one or more electrical properties associated with the switching circuit. The method may additionally include determining if an electrical anomaly is associated with the switching circuit based at least in part on the monitored one or more electrical properties. The method may further include switching the switching circuit to an off state if an electrical anomaly is detected.

Abstract: A process to check a connection between a battery (2) supplying a low-voltage network (1) of a motor vehicle (12), the voltage of which is less than the voltage of a high-voltage network (6) of the motor vehicle (12), and the low-voltage network (1); wherein a DC voltage converter (5), which is configured for exchanging electrical power between the high-voltage network (6) and the low-voltage network (1), connects the high-voltage network (6) to the low-voltage network (1); wherein a DC voltage converter (5) modulates the output voltage into the low-voltage network at a modulation frequency; wherein the current hereby applied and the voltage hereby applied are measured by the battery (2), and a resistance value is determined and evaluated with respect to at least one connection criterion, according to which a connection fault is determined when at least one connection criterion is not fulfilled.

Abstract: There is provided a detection device including: a detection electrode that is arranged at a position on an arrangement plane near a tubular body; a drive electrode that is arranged on the arrangement plane; and a controller configured to generate lines of electric force between the detection electrode and the drive electrode and to detect a state of the tubular body by detecting lines of electric force entering the detection electrode.

Abstract: A structure and method of facilitating testing of an electronic device (device under test or DUT) using a non-permanent and reusable structure to terminate contact pads and contact pin holes on a surface of the DUT.

Abstract: Various systems and methods for implementing and using a full tensor micro-impedance downhole imaging tool that includes downhole emitters that induce, at azimuthally-spaced positions on a borehole wall, fields having components in three different non-coplanar directions within a formation and directionally sensitive downhole sensors that sense the components caused by each emitter. The tool further includes a downhole controller that processes signals received from the directionally sensitive downhole sensors to provide a set of measurements representative of a 3×3 impedance tensor at each position.

Abstract: A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.

Abstract: A method of testing a semiconductor device against electrostatic discharge includes operating the semiconductor device, and, while operating the semiconductor device, monitoring a functional performance of the semiconductor device. The monitoring includes monitoring one or more signal waveforms of respective one or more signals on respective one or more pins of the semiconductor device to obtain one or more monitor waveforms, and monitoring one or more register values of one or more registers of the semiconductor device to obtain one or more monitor register values as function of time. The method includes applying an electrostatic discharge event to the semiconductor device while monitoring the functional performance of the semiconductor device. The method can further comprise determining a functional change from the one or more monitor waveforms and the one or more monitor register values as function of time.

Abstract: A method of interfacing an LC sensor with a control unit is described. The control unit may include first and second contacts, and the LC sensor may be connected between the first and second contacts. The method may include starting the oscillation of the LC sensor, and monitoring the voltage at the second contact, in which the voltage at the second contact corresponds to the sum of the voltage at the first contact and the voltage at the LC sensor. The voltage at the first contact may be varied such that the voltage at the second contact does not exceed an upper voltage threshold and does not fall below a lower voltage threshold.

Abstract: A method for ascertaining a position of a rotor relative to a stator of an electrical machine having a permanently excited rotor and a plurality of windings for the stator or vice versa; in response to an energization of at least one of the windings, a change in an inductance of the winding being ascertained; and, on the basis of the change in the inductance of the winding, the position of the rotor being ascertained relative to the stator.

Abstract: An optical waveguide sheet 50 is fastened to an inward facing access door 4 of the load center 2. When the door is closed, the optical waveguide sheet is positioned so that one portion is juxtaposed with the circuit breaker 10A in the load center, to enable the optical waveguide sheet to receive an optical signal 70A characterizing current in the circuit breaker. The optical waveguide sheet 50 is further positioned so that another portion is juxtaposed with an optical window 48 of an aggregator. The optical waveguide sheet is configured to internally reflect the optical signal 70A within its body and to conduct the internally reflected optical signal from the circuit breaker to the optical window of the aggregator. The aggregator may provide information characterizing current usage to an alarm, a measurement device, the smart grid, or a storage device for later use.

Abstract: A method and device for diagnosing an electrical condition of a spatially extended hardware component in a spatially resolved manner via interference between pulses fed into the component by a signal generator. The method includes: feeding at least two pulses into the component offset by a pulse interval; detecting the interfered pulses and echoes via an analysis unit; varying the pulse interval for the spatially resolved scanning of the hardware component along its length; repeating the steps until the component has been scanned at least in some sections; and analyzing the detected interfered pulses in the analysis unit. The device includes at least one signal generator connected to the component and to an analysis unit to generate the pulses, wherein local energy losses are mathematically determined over the length of the component on the basis of a plurality of interference voltage waveforms and voltage waveforms induced by the pulses.

Abstract: A method and apparatus to determine a parameter of a metal-containing film are provided herein. In some embodiments, a method of determining a parameter of a metal-containing film may include generating a first magnetic field by flowing an alternating current through a coil disposed adjacent to and spaced apart from the metal-containing film, wherein the first magnetic field induces a second magnetic field proximate the metal-containing film; heating the metal-containing film from a first temperature to a second temperature; measuring a response of the first magnetic field to the second magnetic field as the metal-containing film is heated from the first temperature to the second temperature; and correlating the response with a rate of temperature change of the metal-containing film as the metal-containing film is heated from the first temperature to the second temperature to determine a parameter of the metal-containing film.

Abstract: An apparatus is provided that measures usage of a motor unit having a motor and a motor cable leading to the motor to provide operational power to the motor. The apparatus includes a housing that attaches to the motor cable such that the motor cable passes through an interior region of the housing. A sensor is situated in the interior region of the housing and is operable to sense current that flows in the motor cable. The apparatus has a counter that logs accumulated time of operation of the motor based on an amount of time that current is sensed by the sensor to be flowing in the motor cable.

Abstract: A penetration terminal for connecting the coaxial cables inside and outside of the apparatus thereto is attached on the electric apparatus' frame, and the measurement of a combined capacitance of the antenna and the coaxial cable in the inner side of the apparatus is made possible from the outer side of the apparatus, so that it is possible to perform at any time the determination whether a wiring connection of the antenna mounted in the inner side of the electric apparatus is appropriate.

Abstract: An electronic device is provided. The electronic device includes a printed circuit board (PCB), an antenna structure, a radio frequency signal transceiving circuit and a testing structure. The antenna structure is disposed on the PCB. The radio frequency signal transceiving circuit is disposed on the PCB, and is connected to the antenna structure through a conductive line. The testing structure includes a testing point and a grounding structure. The testing point is disposed on the conductive line, and the grounding structure is disposed on the PCB.

Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.