Patents Examined by Cindy Khuu
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Patent number: 7340382Abstract: In an autostereoscopic display, a horizontal view range can be widened without reducing two-dimensional resolutions. Lenses are arranged to be a linear combination having integer coefficients of two unit vectors, thereby to control the vertical and horizontal view ranges.Type: GrantFiled: January 5, 2006Date of Patent: March 4, 2008Assignee: Hitachi Displays, Ltd.Inventors: Takafumi Koike, Michio Oikawa
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Patent number: 7328128Abstract: A method, system, and computer program product for performing prognosis and asset management services is provided. The method includes calculating an accumulated damage estimate for a component via a diagnostics function and applying future mission data for the component to at least one model that calculates accumulated damage or remaining life of the component. The method also includes inputting the accumulated damage estimate to the model and aggregating damage over time and quality assessments produced by the model. The method further includes calculating a damage propagation profile and remaining life estimate for the component based on the aggregating and providing an uncertainty estimate for the damage estimate and the remaining life estimate.Type: GrantFiled: February 22, 2006Date of Patent: February 5, 2008Assignee: General Electric CompanyInventors: Pierino Gianni Bonanni, Kai Frank Goebel, Neil Holger White Eklund, Gary Paul Moscarino
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Patent number: 7324916Abstract: A gyroscope, in one embodiment a ring laser gyro, is used in an alignment measuring device for checking and adjusting alignment of a vehicle. The device includes an “x” and a “y” digital inclinometer working in concert with the gyroscope to measure various angle related to vehicle alignment.Type: GrantFiled: July 28, 2006Date of Patent: January 29, 2008Inventor: Robert B. Phillips, III
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Patent number: 7310585Abstract: A method and system for inspecting integrated circuit chips during fabrication. The method including: selecting an integrated circuit chip at a selected level of fabrication; determining coordinates of potential failures of the integrated circuit chip based on one or more risk of failure analyses performed ancillary to fabrication of the integrated circuit chip; automatically generating one or more enhanced defect inspection regions for inspecting the integrated circuit chip based on the coordinates; automatically selecting one or more enhanced defect inspection parameters for each of the one or more enhanced defect inspection regions based on the one or more risk of failure analyses; and generating an enhanced defect inspection recipe, the enhanced defect inspection recipe including a location on the integrated circuit chip, an enhanced defect inspection parameter and a value for the enhanced defect inspection parameter for each of the one or more enhanced defect inspection regions.Type: GrantFiled: May 12, 2005Date of Patent: December 18, 2007Assignee: International Business Machines CorporationInventors: Colin J. Brodsky, MaryJane Brodsky
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Patent number: 7295946Abstract: A measuring system includes a measuring device, another device and a device configured to transmit data enabling bits of data to be transmitted between the measuring device and the other device. The measuring device also includes a signal monitoring circuit and a switch element. The switch element is electrically contacted to a test potential source. The test potential source is in contact with the signal monitoring circuit according to a switch element state. The signal monitoring circuit is also in contact with the device for transmitting date. A method provides for functional monitoring of such a measuring system in a monitoring mode when a test potential is applied.Type: GrantFiled: September 4, 2003Date of Patent: November 13, 2007Assignee: Dr. Johannes Heidenhain GmbHInventors: Hermann Hofbauer, Erich Strasser
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Patent number: 7292948Abstract: Techniques for removing distortion in an AC magnetic tracker identify a characteristic frequency in the distortion environment which is then utilized to extract distortion components from the tracker receiver signals so that the corrected position and orientation can be calculated. A multiplicity of alternative techniques for determining this characteristic frequency are disclosed, several of which can be done during operation without interrupting system operation while others can be done off-line. The invention also allows the use of a tuned tracker transmitter since it does not need to operate at multiple frequencies. The invention differs from the prior art by treating an extended conductor characteristic as just another unknown. The position and orientation algorithm solves the 6 unknown coordinates of position and orientation plus the one more unknown—the extended conductor characteristic frequency.Type: GrantFiled: April 22, 2005Date of Patent: November 6, 2007Assignee: Alken Inc.Inventors: Herbert R. Jones, Jr., Robert F. Higgins, Henry E. Himberg
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Patent number: 7246035Abstract: A system and method of multi-frame sampling for statistical analysis employs an estimator that may be generalize to two or more overlapping sampling frames. The estimator is accurate and requires less information and may be implemented more efficiently than previously known systems and methods. A generic computer system may be programmed to implement and employ the multi-frame sampling algorithms of the invention. Such algorithms may be employed to perform a statistical analysis on sample population data from multiple sample frames as stored in one or more databases accessible by the computer system.Type: GrantFiled: January 13, 2006Date of Patent: July 17, 2007Inventor: Charles D. Palit
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Patent number: 7158921Abstract: An electromagnetic field analyzer includes a division-into-element portion that divides form data as an analysis object into coarse elements and fine elements. A prolongation matrix forming portion forms a prolongation matrix defining an electromagnetic field vector of the coarse elements divided by the division-into-element portion related to an electromagnetic field vector of the fine elements. Then, an approximate value calculation portion and an approximate solution correction portion calculate an approximate solution of the electromagnetic field vector of the fine elements by applying an iteration method of simultaneous linear equations while referring to the prolongation matrix. Accordingly, it becomes possible to perform an electromagnetic field analysis at high speed by using a multi-grid method using a non-nested mesh.Type: GrantFiled: November 5, 2004Date of Patent: January 2, 2007Assignee: Murata Manufacturing Co., Ltd.Inventor: Tsutomu Okada
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Patent number: 7149634Abstract: A method and apparatus of determining an elastic modulus of a material having a Poisson's ratio v by a Berkovich indenter having an elastic modulus E; a Poisson's ratio v, and a cross sectional area A(h) as a function of depth are provided. The method and apparatus model the Berkovich indenter with a conical shape and a spherical cap.Type: GrantFiled: January 14, 2004Date of Patent: December 12, 2006Assignee: The Hong Kong Polytechnic UniversityInventors: Dejun Ma, Chung-Wo Ong
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Patent number: 7120543Abstract: An electronic flow measurement device (EFM), for use in conjunction with a flow meter in a pressurized gas line, has a microprocessor and read-only memory (ROM), and calculates and records gas flow rates corrected for variable factors such as gas pressure, temperature, and density. Look-up tables stored in the ROM contain intermediate values calculated in accordance with selected protocols for selected ranges of input variables such as gas temperature, pressure, density, and turbine “K” factors. Based on inputs received from gas temperature and pressure sensors, the EFM selects corresponding intermediate values from the look-up tables, and then uses these values to calculate corrected gas flow rates, using software residing in the EFM. The microprocessor's power consumption is significantly reduced because the use of look-up tables reduces the complexity and extent of calculations that the EFM needs to perform, as compared with performing all required calculations in the EFM.Type: GrantFiled: October 7, 2005Date of Patent: October 10, 2006Assignee: Flowstar Technologies Inc.Inventors: Brad Belke, Thomas MacArthur, Jack Hurford
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Patent number: 7107157Abstract: An automated measuring system includes an application server (2), a database server (1), and client computers (4) and measurement apparatuses (5) linking to the application server through a network (3). The application server includes a measurement information receiving module (21) for receiving measurement information; a procedure encoding module (23) for encoding all required measurement procedures for objects to be measured; a measurement apparatus assigning module (24) for assigning a suitable measurement apparatus to each of dimensions of the objects; a measuring module (25) for running the encoded measurement procedures to measure all the dimensions of the objects through the assigned measurement apparatuses; a tolerance calculating module (26) for obtaining measured data and a design value of each dimension, and for calculating an actual upper tolerance and an actual lower tolerance for each dimension; and a report generating module (28) for generating measurement reports.Type: GrantFiled: July 15, 2004Date of Patent: September 12, 2006Assignee: Hon Hai Precision Industry Co., Ltd.Inventors: Hsin-Pei Chang, Chih-Kuang Chang
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Patent number: 7079959Abstract: The present invention relates to a smart system and method of performing high-resolution frequency order analysis/diagnosis on rotor, in which such system is characterized in that capable of performing order analysis via a Kalman filter or a RLS (Recursive Least Square) algorithm while determining the failure status based on the Fuzzy theory. The smart system of present invention comprises a data acquisition means, a bench data setup means, a STFT time-spectra analysis/re-sampled order tracking means, a Kalman filter or RLS algorithmic means, a fuzzy diagnosis means and a window interface (e.g., GUI) while repeatedly making use the functions of those means so as to achieve the real-time diagnosis on rotor.Type: GrantFiled: January 20, 2004Date of Patent: July 18, 2006Assignee: National Chiao Tung UniversityInventors: Ming-Sian Bai, Ming-Hung Hung, Jia-Min Huang, Fu-Cheng Su
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Patent number: 6996485Abstract: A system and method for correcting a meter calibration curve in a fuel dispenser. The meter may be a turbine flow meter. A meter calibration curve is expressed in a finite number of data points. The meter calibration curve is used to determine the volume and/or flow rate of liquid flowing through the meter. Since the meter calibration curve may contain errors, the meter calibration curve is corrected by determining poles in the meter calibration curve for given known flow rates and/or volumes of liquid passing through the meter, determining an error correction at each of the poles in the meter calibration curve, correcting the expanded meter calibration curve at each of the poles, using linear interpolation to correct points in the meter calibration curve adjacent to the poles.Type: GrantFiled: September 30, 2004Date of Patent: February 7, 2006Assignee: Gilbarco Inc.Inventor: Edward A. Payne
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Patent number: 6965834Abstract: The present invention provides a method of inspecting a target component part (e.g., valve casing) of an apparatus (e.g., steam control valve) included in a steam turbine system. When a time period in a range of 24 to 100 hours passes from the shutting-down of the turbine system, or before a temperature of an atmosphere surrounding the component part is lowered to 100° C., the width of the opening of the crack formed in the component part or a clearance relating to the component part is measured without disassembling the target component part and an enclosing member (e.g., valve casing) from the apparatus. As the measurement is performed when a thermal stress is induced in the component parts or when the temperature distribution is wide, the risk level of the crack or the clearance is determined accurately.Type: GrantFiled: October 9, 2003Date of Patent: November 15, 2005Assignee: Kabushiki Kaisha ToshibaInventors: Kazuhiro Saito, Kazunari Fujiyama, Taiji Hirasawa, Satoshi Nagai, Toshihiro Fujiwara, Hitoshi Kichise, Hirotsugu Kodama, Mitsuyoshi Okazaki