Patents Examined by Coutney Thomas
  • Optical scheme for high flux low-background two-dimensional small angle x-ray scattering
    Patent number: 6330301
    Abstract: An x-ray analysis system including a focusing optic for focusing an x-ray beam to a focal point, a first slit optically coupled to the focusing optic, a second slit optically coupled to the first slit, and an x-ray detector, where the focal point is located in front of the detector.
    Type: Grant
    Filed: December 17, 1999
    Date of Patent: December 11, 2001
    Assignee: Osmic, Inc.
    Inventor: Licai Jiang