Patents Examined by Cuong M. Nguyen
  • Wave analyzing apparatus and wave analyzing method
    Patent number: 5703787
    Abstract: A wave analyzing apparatus and method reduce the amount of time required for wave analysis. When changing wave data of a specified discrete point within an analysis domain expressed by a plurality of discrete points, the wave analyzing apparatus analyzes propagation of the changes in the form of spatial and time variations of wave data of other discrete points.
    Type: Grant
    Filed: February 26, 1996
    Date of Patent: December 30, 1997
    Assignee: Fujitsu Limited
    Inventor: Takefumi Namiki