Abstract: A battery management system includes monitoring devices arranged in a housing that houses batteries and a control device. The monitoring device includes (i) a monitoring IC capable of acquiring battery information and (ii) a wireless IC. At a start-up time of the plurality of monitoring devices, each of the wireless ICs performs an advertising operation in a cyclic advertising event for establishing a connection of wireless communication between the plurality of monitoring devices and the control device, and the control device performs a scan operation. The wireless IC of each of the two or more monitoring devices has, respectively, an event management unit that manages a generation cycle of the adverting event, for performing the advertising operation at respectively different timings.

Abstract: A method, as applied to a program-controlled measuring instrument, determines an observable property of an object. The program-controlled measuring instrument has a diagnostic measurement program that is executed by a user. The diagnostic measurement program stores data related to the execution of the diagnostic measurement program and maintains the data for remote transmission to a remote service entity.

Abstract: A portable DS device includes a device housing, device-side electrical contacts, a computing system and a removable sensor receiver assembly. The device housing includes a removable sensor receiver compartment. The device-side electrical contacts are positioned in or adjacent to the removable sensor receiver compartment. The computing system is in communication with the device-side electrical contacts and includes an impedance analyzer. The removable sensor receiver assembly includes a removable sensor receiver housing selectively receivable in and removable from the removable sensor receiver compartment. The removable sensor receiver housing includes a fluid sensing apparatus receiving section that receives a fluid sensing apparatus in which a fluid to be tested is loaded.

Abstract: A method and a testing apparatus related to wafer testing are provided. In the method, testing raw data is obtained by a testing apparatus operating with a Unix-related system. The testing raw data is a testing result of probe testing on one or more wafers by the testing apparatus. The testing raw data is converted into converted data by the testing apparatus. The converted data is related to the defect information of the wafer. Analyzed data is generated by the testing apparatus according to the converted data. The analyzed data is used for a graphical interface. Therefore, real-time defect analysis during the testing procedure may be provided.

Abstract: A wall scanner that includes a housing, a plurality of sensors, a display, and a control section. The housing includes a handle portion and a body portion. The handle portion is adapted to receive a removable and rechargeable battery pack such as a high-voltage lithium-ion (“Li-Ion”) battery pack. The body portion of the housing encloses the plurality of sensing devices, such as capacitive plate sensors for sensing the presence of a stud behind a surface, a D-coil sensor for identifying the presence of metal behind the surface, and a non-contact voltage sensor. The display is configured to display the location of an object behind the surface in real-time, the depth of an object behind the surface, and whether an object behind the surface is ferrous or non-ferrous. The control section includes actuation devices for controlling the functions and operations of the wall scanner, such as the scanning mode.

Abstract: A radio frequency coil assembly for an MRI system. A support structure extends between a first end and a second end in a first direction and between an inner surface and an opposite outer surface in a second direction perpendicular to the first direction. The support structure has channels that extend into the support structure in the second direction. An RF coil is configured to transmit and/or receive RF signals. The RF coil is supported by the outer surface of the support structure. The channels are at least partially positioned between the support structure and the RF coil in the first direction and are configured to convey a cooling medium to cool the support structure in use.

Abstract: The system as described collects and utilizes weather data sensor information in order to rapidly collect and update weather forecasts using real-time weather data collected at high rates of frequency, and use this collected high frequency weather data to rapidly correct and update the weather forecasts generated by the system.

Abstract: A touch sensor device (TSD) includes TSD electrodes associated with a surface of the TSD. Also, an overlay that includes marker electrode(s) is also associated with at least a portion of the surface of the TSD. The TSD also includes drive-sense circuits (DSCs) operably coupled to the plurality of TSD electrodes. A DSC is configured to provide a TSD electrode signal to a TSD electrode and simultaneously to sense a change of the TSD electrode signal based on a change of impedance of the TSD electrode caused by capacitive coupling between the TSD electrode and the marker electrode(s) of the overlay. Processing module(s) is configured to process a digital signal generated by the DSC to determine characteristic(s) of the overlay that is associated with the at least a portion of the surface of the TSD.

Abstract: This sensor includes: a housing 10 which houses an electronic component in the internal space; a detection unit 40 which has a coil 42 and a core 41 that houses the coil 42 and which is arranged on the end side in the internal space; a substrate 30 which is arranged more inside the internal space than the detection unit 40 and on which a circuit electrically connected to the coil 42 is provided; a first shield 451 at least one portion of which is arranged further on the end side in the internal space than the detection unit 40 and which suppresses the penetration of noise from outside of the housing 10; and a spacer 51 which is positioned between the first shield 451 and the detection unit 40 and which separates the surfaces of the first shield 451 and the detection unit 40 that face each other.

Abstract: A circuit check method and an electronic apparatus applicable to a to-be-tested circuit are provided. The to-be-tested circuit has one or more first nodes related to a gate voltage of one or more transistor devices and a plurality of second nodes. The circuit check method includes: setting endpoint voltages of a plurality of input interface ports of the to-be-tested circuit; obtaining a first node voltage of the first node according to a conduction path of the to-be-tested circuit and the gate voltage of the transistor device; obtaining a second node voltage of each second node according to the conduction path, the endpoint voltages, and the first node voltage; and performing circuit static check on the to-be-tested circuit by applying the first node voltage and the second node voltage.

Abstract: A method of designing/manufacturing a static-magnetic-field shimming coil system for magnetic resonance imaging, includes determining an optimal stream function, defined on a reference surface enclosing a region of interest, for each member of a cohort of magnetic resonance imaging subjects; performing a Principal Component Analysis of the stream functions; determining at least one coil wiring pattern defined on the reference surface by discretizing at least a most significant principal component of the stream functions. A static-magnetic-field shimming coil system suitable to be obtained by the method at least one hollow dielectric support element having a cavity containing the region of interest and a surface having a shape corresponding to the reference surface or, where appropriate, one the additional surface; and a set of conducting elements deposed on or affixed to the surface of the dielectric support, forming the or one the coil wiring pattern.

Abstract: An NMR measuring arrangement (20) includes a cryostat (1), a superconducting magnet coil system (2) and an NMR probe (3). The cryostat has an evacuated vacuum container (5) and forms a bore (10). A wall (12) of the bore delimits the vacuum container. The cryostat forms only one evacuated gap (13) in a space (18) between the magnet coil system and the wall of the bore. At least a segment of the wall of the bore is thermally coupled to a heat sink of the cryostat. As a result, the NMR measurement arrangement provides more precise NMR measurements (in particular with a higher spectral resolution and/or a higher signal-to-noise ratio) on measurement samples.

Abstract: Disclosed embodiments include systems, vehicles, and methods for presenting weather conditions a traveler may encounter while traveling a route. In an illustrative embodiment, a computing device executes instructions to present an integrated route map. An input is received indicative of a trip to be made to a destination by a traveler. A store of route data for an area encompassing the trip is accessed. At least one route is identified. A weather forecasting service is accessed from which expected weather conditions are accessible for the area through the projected time. The expected weather conditions are identified for the location at the projected time. An integrated route map is displayed showing the at least one route and the expected weather conditions for the location at the projected time.

Abstract: Processes for rapidly and accurately measuring the coefficient of moisture expansion for materials, such as adhesives, are disclosed. A replication technique may be used to manufacture highly flat and smooth adhesive samples. Moisture is introduced in a controlled humidity atmosphere, distortion is monitored with an accurate laser interferometer (e.g., ˜1 nanometer (nm) accuracy), and measurements are correlated with moisture content change. Such processes decrease sample size by three orders of magnitude as compared with conventional techniques and have a smaller adhesive mass requirement, which enables measurement of expensive microelectronic adhesives that were previously cost-prohibitive to measure. Also, thinner films allow CME measurements of ultraviolet (UV) cured adhesives that would otherwise have depth of penetration issues. Furthermore, saturation occurs quickly, allowing pre-stabilization at room temperature, which enabled parametric studies as a function of processing or cure state.

Abstract: Aspects of the subject disclosure may include, for example, a process that formulates an inference that a first group of mobile devices are at ground level, and obtains, for the first group of mobile devices, positions and barometric pressure readings. Ground heights with respect to a common reference height are determined for the first group of mobile devices, and reference barometric pressures are calculated for the first group of mobile devices, at the common reference height according to the barometric pressure readings and the determined ground heights. At least a portion of the reference barometric pressures are combined to obtain a reference barometric pressure. Other embodiments are disclosed.

Abstract: A method for screening and matching cells for qualification and binning can include conducting a first and second impedance-based measurement of a cell separated by a rest interval of the cell and analyzing change/shift in the impedance spectrum obtained before and after the rest interval to afford algorithms to match, categorize, or group cells within a plurality of cells (C1 . . . Cn) that have the same, substantially the same, or fall within a range of structural or functional parameters based on the impedance change/shift in the impedance spectrum.

Abstract: A human-scale closed-bore MPI device and method based on radial-Cartesian trajectory scanning are provided. The human-scale closed-bore MPI device includes: a gradient module configured to generate a static gradient magnetic field; a rotating scanning module configured to construct a rotating uniform alternating magnetic field; an excitation module configured to construct a uniform alternating magnetic field; an induction module configured to acquire a nonlinear magnetization response signal of magnetic particles; and a compensation module configured to compensate for a coupling signal between a first cylindrical coil and a second cylindrical coil.

Abstract: Provided is a preheating thermometer, including a temperature measuring assembly, and a preheating assembly disposed on the temperature measuring assembly. The preheating assembly includes a heating material layer and a sealing film covering the heating material layer to isolate the heating material layer from air. When the preheating thermometer is used for body temperature measurement, the sealing film is removed to allow the heating material layer to produce heat due to the contact of the heating material layer with the air.

Abstract: A detection circuit for instantaneous voltage drop and an on-board diagnostic system. The detection circuit comprises two RC circuits, each of the RC circuits comprises a first resistor, a second resistor, and an energy storage capacitor; a first end of the first resistor is used for receiving a to-be-detected voltage, and a second end thereof is connected to a first end of the second resistor; the energy storage capacitor is connected in parallel with the second resistor; the first end of the second resistor forms an output end of the RC circuit, and the output end is connected to an input end of the comparator; an output end of the comparator is connected to the determination unit; in the two RC circuits, the resistance ratios of the second resistors to the first resistors are different, the capacitances of the energy storage capacitors are different.

Abstract: A method for measuring alpha particle emissions may include obtaining a wafer emission rate, wherein the wafer emission rate is measured with a counter. The method may further include covering the wafer with a metal mesh grounded to a cathode of the counter wherein the metal mesh is grounded to the cathode outboard of the wafer and obtaining a mesh and wafer emission rate, wherein the mesh and wafer emission rate is measured with the counter. The method may further include replacing the wafer with a wafer carcass, obtaining a wafer carcass and mesh emission rate, and calculating a wafer carcass emissivity.