Abstract: A scanning head for eddy-current testing includes a probe coil configuration disposed on a film on a film base. The film base is matched to a shape of an object to be tested. This allows quick, low-interference eddy-current testing. A method for producing a scanning head for an eddy-current test and an eddy-current test method are also provided.
Type:
Grant
Filed:
May 4, 2000
Date of Patent:
September 17, 2002
Assignee:
Siemens Aktiengesellschaft
Inventors:
Erich Becker, Hans-Peter Lohmann, Gabriel Daalmans, Klaus Ludwig, Ludwig Bär