Patents Examined by Darrell D. Kinder
  • Patent number: 6693424
    Abstract: A magnetic rotation angle sensor has a rotor and a stator. Magnets are disposed to supply a magnetic flux that is modulated in accordance with the rotation angle. Magnetic sensor elements detect the magnetic flux and output signals indicative of the rotation angle between the rotor and the stator. External magnetic guides are disposed on both axial sides of the cores. The external magnetic guides provide a magnetic path that runs axially to avoid the magnetic sensor elements. The external magnetic guides are distanced enough from the rotor and the stator to reduce leakage of the magnetic flux supplied by the magnets. The magnets have enough height in magnetized direction so as to reduce short-circuiting leakage of the magnetic flux.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: February 17, 2004
    Assignee: Denso Corporation
    Inventors: Masahiro Makino, Yasunari Kato
  • Patent number: 6657431
    Abstract: A scanning magnetic microscope includes a specimen stage for holding a specimen to be examined; a sensor for sensing a magnetic field generated by the specimen, the sensor including one of a magnetic tunneling junction (MTJ) sensor, a spin valve sensor, or an extraordinary Hall effect sensor; translation apparatus for translating the sensor relative to a surface of said specimen; and a data processor, having an input coupled to an output of said sensor, for constructing an image of said magnetic field. In another embodiment a read/write head from a hard disk drive is shown to make a suitable magnetic sensor. The scanning magnetic microscope can be used for examining the current flow in integrated circuits and related phenomenon, such as electromigration, as well as magnetic data storage media and biomagnetic systems, to mention a few suitable applications.
    Type: Grant
    Filed: June 6, 2001
    Date of Patent: December 2, 2003
    Assignee: Brown University Research Foundation
    Inventor: Gang Xiao
  • Patent number: 6573712
    Abstract: In a non-destructive inspection device of the present invention which detects in a non-destructive manner a defect of a member to be inspected, based on a change in magnetic fluxes due to eddy currents that are generated by an inspection probe having a coil, a driving section which adjusts a position of the inspection probe, and measuring device for, based on a detection signal of the inspection probe, measuring a lift-off between the inspection probe and the member to be inspected are disposed. The driving section is controlled in accordance with a result of measurement of the measuring device, whereby a control of making the lift-off constant is performed.
    Type: Grant
    Filed: December 20, 2000
    Date of Patent: June 3, 2003
    Assignee: NSK Ltd.
    Inventor: Makoto Arai
  • Patent number: 6512368
    Abstract: A dewar for SQUID is provided. In the dewar for SQUID, an amount of leak gas discharged from absorbent arranged in the upper portion higher than the liquid surface level of liquid helium is small even if the liquid surface level of the liquid helium is lowered.
    Type: Grant
    Filed: January 30, 2001
    Date of Patent: January 28, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Hiroyuki Tanaka, Norihide Saho, Hitoshi Sasabuchi
  • Patent number: 6452384
    Abstract: A scanning head for eddy-current testing includes a probe coil configuration disposed on a film on a film base. The film base is matched to a shape of an object to be tested. This allows quick, low-interference eddy-current testing. A method for producing a scanning head for an eddy-current test and an eddy-current test method are also provided.
    Type: Grant
    Filed: May 4, 2000
    Date of Patent: September 17, 2002
    Assignee: Siemens Aktiengesellschaft
    Inventors: Erich Becker, Hans-Peter Lohmann, Gabriel Daalmans, Klaus Ludwig, Ludwig Bär