Abstract: In a component-embedded circuit substrate having a plurality of capacitors embedded therein, the capacitors are connected in parallel, inspection electrodes are formed, and the inspection electrodes connect to respective terminal electrodes of the capacitor through via conductors. At the terminal electrodes of the capacitor, the connection position of the via conductors for connecting the inspection electrodes differs from the connection position of via conductors for connecting respective terminal electrodes of the capacitor.

Abstract: Circuits and methods for fast detection of a low voltage in the range of few ?Volts have been achieved. In a preferred embodiment the low voltage represents a current via a shunt resistor and the circuit is used to generate a digital wake-up signal. In regard of the wake-up application the circuit invented is activated periodically and in case of a certain level of the voltage drop, e.g. 50 ?V, at the shunt resistor. The time required for a measurement of the voltage drop is inclusive calibration and integration time far below 1 ms. It is obvious that the circuit invented can be used for any measurements of very small voltages.

Abstract: Disclosed is a sensor that can accurately detect displacement and prevents the phenomenon of a contact section between a shaft member and a sliding element receiver being shifted. The sensor comprising: a case having a through hole; a resistance substrate fixed at an inside of said case; a shaft member having a first end portion which is one end of the shaft member placed within said case and a second end portion which is other end of the shaft member exposed to an outside of said case from said through hole, said shaft member being placed at said through hole in a movable manner in an axial direction; and a sliding element receiver having a bearing end contacting with said second end portion of said shaft member, and attached with a brush sliding together with said resistance substrate, said sliding element receiver being capable of moving relatively against said resistance substrate with said shaft member. A hemispherical end face is formed at said first end portion.

Abstract: A method for determining the frequency-dependent dielectric permittivity spectrum of a rock sample, comprising:—defining a series of electromagnetic measurement data comprising at least a first measurement at a frequency from which a substantially frequency-independent value of dielectric permittivity ??, can be obtained; and at least second and third measurements at different frequencies from which values for frequency-dependent dielectric permittivity ?rock (f) can be obtained; and—using the first, second and third measurements to determine the frequency-dependent spectrum of the sample.

Abstract: An inductive detection encoder according to the present invention includes: first and second members which are oppositely disposed so as to relatively move in a measurement direction; a transmitting coil formed in the first member; a magnetic flux coupled body which is formed in the second member and coupled with a magnetic field generated by the transmitting coil; and a receiving coil formed in the first member and having receiving loops. At least one of the transmitting coil and the receiving coil has a specific pattern that impairs the uniformity and periodicity of a pattern; and a dummy pattern formed in a position corresponding to a specific phase relationship of a cycle generated by the track with respect to the specific pattern.

Abstract: An apparatus is provided for highly accelerated life testing (HALT) of multi-junction solar cells according to a method that utilizes a high vacuum chamber, as well as lenses and windows transparent to broad spectrum solar radiation from typically a single source to house packaged solar chips and temperature monitoring and control means during testing, thereby allowing substantially greater control of environmental variables such as temperature, atmospheric composition, and light spectrum than is currently available.

Abstract: A monitoring circuit and method, wherein a voltage waveform having a linear falling edge is applied to a first node of at least one test memory cell (e.g., a plurality of test memory cells connected in parallel). The input voltage at the first node is captured when the output voltage at a second node of the test memory cell(s) rises above a high reference voltage during the falling edge. Then, a difference is determined between the input voltage as captured and either (1) the output voltage at the second node, as captured when the input voltage at the first node falls below the first reference voltage during the falling edge, or (2) a low reference voltage. This difference is proportional to the static noise margin (SNM) of the test memory cell(s) such that any changes in the difference noted with repeated monitoring are indicative of corresponding changes in the SNM.