Patents Examined by David Vanore
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Patent number: 12266500Abstract: The present disclosure provides a charged particle beam device capable of simultaneously achieving protection of a charged particle source against electrical discharging inside a charged particle gun and highly accurate control of the charged particle gun, for both DC and AC components. A charged particle gun according to the present disclosure is configured such that an extraction voltage and an acceleration voltage are superposed and supplied to a charged particle beam source, a wiring between the charged particle beam source and a voltage circuit is covered with first and second enclosures, the first enclosure is configured to be connected to an extraction electrode, and the second enclosure is configured to be connected to an acceleration electrode and to a reference voltage of the voltage circuit.Type: GrantFiled: December 13, 2019Date of Patent: April 1, 2025Assignee: Hitachi High-Tech CorporationInventor: Tomoyo Sasaki
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Patent number: 12266502Abstract: A sample milling apparatus includes an ion source, a swinging mechanism for swinging a sample, a positioning camera for bringing a target milling position on the sample into coincidence with the impact point of an ion beam, and a display section for displaying an image captured by the positioning camera. The adjustment method starts with observing the trace of the impinging ion beam left on the sample with the positioning camera while the position of the positioning camera is held relative to the swing axis of the swinging mechanism and capturing an observation image. Then, a display image to be displayed on the display section is extracted from the observation image based on the position of the trace, thus bringing the beam impact point and the position of the field of view of the display image into coincidence.Type: GrantFiled: March 1, 2022Date of Patent: April 1, 2025Assignee: JEOL Ltd.Inventor: Munehiro Kozuka
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Patent number: 12257373Abstract: A fluid disinfecting system includes a straight fluid directing conduit and a light source disposed on a side of the fluid directing conduit. The light source is operative to emit ultraviolet light into the fluid directing conduit, such that one or more cross sections of said fluid directing conduit are saturated with ultraviolet light. Any fluid passing through the fluid directing conduit is necessarily exposed to the ultraviolet light.Type: GrantFiled: March 30, 2020Date of Patent: March 25, 2025Inventor: Stephen J. Sustrick
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Patent number: 12261015Abstract: In one embodiment, an electron beam inspection apparatus includes an optical system irradiating a substrate with primary electron beams, a beam separator separating, from the primary electron beams, secondary electron beams emitted as a result of irradiating the substrate with the primary electron beams, a detector detecting the secondary electron beams separated, a movable stage on which the substrate is placed, a support base supporting the substrate on the stage, and an applying unit applying a first voltage to the substrate. The support base includes a plurality of support pins that support the substrate from below. The support pins each include a columnar insulator and a metal film disposed in the insulator. A second voltage is applied to the metal film.Type: GrantFiled: August 31, 2022Date of Patent: March 25, 2025Assignee: NuFlare Technology, Inc.Inventors: Atsushi Ando, Takahiro Murata
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Patent number: 12261016Abstract: Provided are an electron detection device and a scanning electron microscope. The electron detection device includes: a reflective energy analyzer including first and second control electrodes that are sequentially arranged in an incidence direction of an electron beam; a first detector disposed at a side of the second control electrode away from the first control electrode; a second detector disposed at a side of the first control electrode away from the second control electrode; and a conductive shielding tube penetrating the first and second control electrodes in the incidence direction and configured to shield an electric field generated by the reflective energy analyzer, allowing the electron beam to pass through and be incident on the target sample. First control electrode is configured to generate a first electric field between the first and second control electrodes. The first electric field is configured to guide the secondary electron to the first detector.Type: GrantFiled: January 3, 2025Date of Patent: March 25, 2025Assignee: CIQTEK CO., LTD.Inventors: Da Yin, Tianjun Li, Bin Sun, Wei Zhang, Feng Cao, Yu He
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Patent number: 12253480Abstract: According to some aspects, a method is provided comprising generating first monochromatic x-ray radiation at a first energy, directing at least some of the first monochromatic x-ray radiation to irradiate subject matter of interest, detecting at least some of the first monochromatic x-ray radiation transmitted through the subject matter of interest, and determining information about a chemical composition of the subject matter of interest based, at least in part, on the detected first monochromatic x-ray radiation and the first energy.Type: GrantFiled: January 7, 2021Date of Patent: March 18, 2025Assignee: Imagine Scientific, Inc.Inventor: Eric H. Silver
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Patent number: 12249479Abstract: Provided is a substrate holding device comprising: a holder that holds a substrate irradiated with an ion beam; and a driving device that rotates the holder around a predetermined axis to change an inclination of the held substrate with respect to the ion beam, wherein the driving device comprises: a power source that outputs power to rotate the holder; a reduction gear provided in the middle of a power transmission path from the power source to the holder; a first shaft member that rotates together with the holder by a power outputted from the reduction gear; a first detector that detects a rotational motion of the first shaft member; and a power control device that controls the power source based on a detection value of the first detector.Type: GrantFiled: July 22, 2022Date of Patent: March 11, 2025Assignee: Nissin Ion Equipment Co., Ltd.Inventors: Yusuke Otsuki, Masatoshi Onoda, Ippei Nishimura
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Patent number: 12247920Abstract: The present disclosure provides systems and methods for characterizing the interaction of free radicals with various materials and the use of known interactions to isolate free radical generation from free radical interaction with a target molecule.Type: GrantFiled: February 27, 2023Date of Patent: March 11, 2025Assignee: Wisconsin Alumni Research FoundationInventors: J. Leon Shohet, Michael R. Sussman, Faraz A. Choudhury, Benjamin B. Minkoff, Grzegorz Sabat, Joshua M. Blatz
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Patent number: 12240891Abstract: Methods and system for protein characterization using online chromatography and electrospray ionization mass spectrometry are provided.Type: GrantFiled: February 8, 2024Date of Patent: March 4, 2025Assignee: REGENERON PHARMACEUTICALS, INC.Inventor: Qian Zhang
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Patent number: 12237147Abstract: A method for measuring an electron signal or an electron induced signal may be provided. The method may include providing a threshold number of events or a threshold event rate for a pixel on a detector. The method may include collecting from the detector the threshold number of events or determining that the threshold event rate is achieved, wherein a signal at the detector is an electron signal or an electron induced signal from a sample. The method may include modulating an intensity of an electron source directed to the sample in response.Type: GrantFiled: October 24, 2023Date of Patent: February 25, 2025Assignees: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC., THE PROVOST, FELLOWS, FOUNDATION SCHOLARS, AND THE OTHER MEMBERS OF BOARD, OF THE COLLEGE OF THE HOLY AND UNDIVIDED TRINITY OF QUEEN ELIZABETH NEAR DUBLINInventors: Bryan Walter Reed, Lewys Jones
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Patent number: 12230491Abstract: A nebuliser outlet comprises an inlet end and an outlet end, a first channel and one or more second channels arranged between the inlet end and the outlet end. The first channel is configured to receive a capillary, and the one or more second channels are configured to pass gas to the outlet end. The nebuliser outlet is a single integrated component.Type: GrantFiled: October 18, 2023Date of Patent: February 18, 2025Assignee: Micromass UK LimitedInventors: Ian David Trivett, Anthony Hesse, Mark Walford, Daniel J. Kenny, David Gordon, Stanislaw Koziol, Steve D. Trudeau, Alastair M. Booth, Stephen Ayrton
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Patent number: 12224163Abstract: An ion beam source including a plasma chamber including a plasma generating space, a plasma generator configured to generate plasma in the plasma generating space, a first grid connected to the plasma chamber, a second grid connected to the plasma chamber, and a first grid driver connected to the first grid. The first grid driver may be configured to move the first grid relative to the second grid.Type: GrantFiled: August 15, 2023Date of Patent: February 11, 2025Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: SeungWan Yoo, Jeongyeon Lee, Dohyung Kim, Jaehong Park, Dong-Chan Lim
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Patent number: 12214386Abstract: A structural coupling for use within a laser system. In a preferred embodiment, a laser system for cleaning purposes would be displaced within a facility having dangerous conditions which could potentially damage the components of the laser, such as within a nuclear power facility. Protecting the laser components typically requires shielding which can fail, resulting in potential contamination of laser generator and components. The structural coupling would allow the laser to pass through a structural element to be used on the interior of the facility such that the end effector may be freely used within the facility while the mobile laser unit itself is safely stored outside of the dangerous area. The coupling allows the laser to pass through the structural element or opening to the end effector without exposing the laser itself to potential contamination.Type: GrantFiled: November 14, 2022Date of Patent: February 4, 2025Inventor: Steven L. Silva
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Patent number: 12211681Abstract: A method for determining the integrity of at least one complex based on at least one biological sample and at least one matrix, including at least the following steps:—acquiring at least one image,—analyzing the image sent by extracting light intensity values representative of at least one spectral band,—relating the light intensity values to one another to obtain representative spectral data,—determining a state of integrity of the complex by comparing each of the representative spectral data by similarity grouping with a determined similarity threshold,—triggering at least one first alert, by the analysis unit, when the representative data are similar to the first state of integrity or to the second state of integrity.Type: GrantFiled: January 13, 2021Date of Patent: January 28, 2025Assignee: BIOMERIEUXInventors: Denis Leroux, Jean-Philippe Charrier, Régis Montvernay, Philippe Wandels
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Patent number: 12211668Abstract: Provided is a charged particle beam device capable of detecting signal charged particles in a wide range of elevation angles from a large elevation angle to a small elevation angle and distinguishing detection signals between backscattered charged particles and secondary charged particles regardless of distribution of the signal charged particles. The charged particle beam device according to the disclosure includes a first detector that detects the secondary charged particles or the backscattered charged particles and a second detector that detects tertiary charged particles generated from the first detector, and generates an observation image of a sample using a signal value obtained by subtracting at least a part of a second detection signal output by the second detector from a first detection signal output by the first detector, or subtracting at least a part of the first detection signal from the second detection signal.Type: GrantFiled: December 22, 2021Date of Patent: January 28, 2025Assignee: Hitachi High-Tech CorporationInventors: Kohei Suzuki, Shunsuke Mizutani, Yuji Kasai
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Patent number: 12196692Abstract: Systems and methods of providing a probe spot in multiple modes of operation of a charged-particle beam apparatus are disclosed. The method may comprise activating a charged-particle source to generate a primary charged-particle beam and selecting between a first mode and a second mode of operation of the charged-particle beam apparatus. In the flooding mode, the condenser lens may focus at least a first portion of the primary charged-particle beam passing through an aperture of the aperture plate to form a second portion of the primary charged-particle beam, and substantially all of the second portion is used to flood a surface of a sample. In the inspection mode, the condenser lens may focus a first portion of the primary charged-particle beam such that the aperture of the aperture plate blocks off peripheral charged-particles to form the second portion of the primary charged-particle beam used to inspect the sample surface.Type: GrantFiled: September 30, 2020Date of Patent: January 14, 2025Assignee: ASML Netherlands B.V.Inventors: Weiming Ren, Xuedong Liu, Zhong-wei Chen, Xiaoyu Ji, Xiaoxue Chen, Weimin Zhou, Frank Nan Zhang
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Patent number: 12196765Abstract: Methods are provided for detecting the amount of one or more CAH panel analytes (i.e., pregnenolone, 17-OH pregnenolone, progesterone, 17-OH progesterone, dehydroepiandrosterone (DHEA), androstenedione, testosterone, deoxycorticosterone, 11-deoxycortisol, and cortisol) in a sample by mass spectrometry. The methods generally involve ionizing one or more CAH panel analytes in a sample and quantifying the generated ions to determine the amount of one or more CAH panel analytes in the sample. In methods where amounts of multiple CAH panel analytes are detected, the amounts of multiple analytes are detected in the same sample injection.Type: GrantFiled: March 11, 2021Date of Patent: January 14, 2025Assignee: Quest Diagnostics Investments IncorporatedInventors: Amit Ghoshal, Nigel J. Clarke, Mildred M. Goldman
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Patent number: 12198892Abstract: A sample holder HL capable of efficiently applying a pressure to an observation surface of a sample SAM is provided. The sample holder HL includes a fixed electrode 4b, a movable electrode 5, and a pressure applying member 6 attached to the movable electrode 5 and having a function to move the movable electrode 5 in a horizontal direction. When the sample SAM is held between a side surface of the fixed electrode 4b and a side surface of the movable electrode 5, an upper surface of the sample SAM is located within a range of a width of the pressure applying member 6 at a position where the pressure applying member 6 is in contact with the movable electrode 5 in the Z direction.Type: GrantFiled: May 27, 2019Date of Patent: January 14, 2025Assignee: Hitachi High-Tech CorporationInventors: Shigeru Haneda, Junzo Azuma
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Patent number: 12186141Abstract: A cleaning chamber for cleaning a vein viewing device, includes a housing with an access door having an open position and a shut position, wherein when the access door is in the open position the vein viewing device can be placed inside the housing. When the access door is in the closed position the housing and access door together envelop the vein viewing device. A detector detects when the vein viewing device is contained within the housing. A light source is contained within the housing and is arranged to illuminate the exterior surfaces of the vein viewing device when the vein viewing device is detected within the housing.Type: GrantFiled: March 21, 2022Date of Patent: January 7, 2025Inventors: Vincent P. Luciano, Ron Goldman
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Patent number: 12191134Abstract: A set of acceleration electrodes for the acceleration of charged particles in a vacuum ion optical system, wherein each acceleration electrode comprises a conical section and at least an elongated leg protruding from the conical section, the elongated leg and any further elongated leg each being configured as a mechanical support and as an electrical connection between the conical section and an intended source of electric potential.Type: GrantFiled: October 22, 2020Date of Patent: January 7, 2025Assignee: Spacetek Technology AGInventors: Jürg Jost, Lukas Hofer