Abstract: A deflection-type refractometer with extended measurement range having a light source generating a beam of light; a measuring cell with a sample chamber receiving a sample liquid; an optical sensor mounted on a movable platform for detecting the deflected beam of light; a driving unit configured to move the platform; a distance measurement unit for monitoring the displacement of the platform; a control unit configured to calculate the deflection of the beam of light based on the displacement of the platform and an output signal of the optical sensor to obtain a refractive index measure of the sample liquid using the calculated deflection.

Abstract: Systems and methods for evaluating a subsurface region of the earth for hydrocarbon exploration, development, or production are disclosed. Embodiments of the present disclosure are configured to determine advanced radioactive formation data from commonly acquired well logging data sets. In particular, a predictive model is trained to generate “synthetic” spectral gamma ray logs are from basic neutron, density and total gamma ray logs measured from a well within the formation. The predictive model comprises a neural network that is trained using multi-resolution graph clustering techniques to correlate patterns in the density, neutron and gamma ray log data to patterns in spectral gamma ray log data. Embodiments of the present disclosure are further configured to use the synthetic spectral gamma ray logs output by the model to quantify the clay content of the formation, its permeability and determine a hydrocarbon productivity index for the formation.

Abstract: Methods of sensing carbon dioxide, sensors, and related articles and systems are generally described.

Abstract: Maximum voltage detection in a power management circuit is provided. In embodiments disclosed herein, the power management circuit includes a voltage processing circuit configured to receive a first time-variant target voltage having a first group delay relative to a time-variant target voltage and a second time-variant target voltage having a second group delay relative to the time-variant target voltage. The voltage processing circuit includes a maximum signal detector circuit configured to generate a windowed time-variant target voltage that is higher than or equal to a highest one of the first time-variant target voltage and the second time-variant target voltage in a group delay tolerance window(s) defined by the first group delay and the second group delay. In this regard, the windowed time-variant target voltage can tolerate a certain amount of group delay within the group delay tolerance window(s).

Abstract: A transformer fault diagnosis method and system using induced ordered weighted evidence reasoning is provided. The method includes the following steps. A typical data sample of transformer sweep frequency response analysis is loaded and a diagnostic label is set as an identification framework. Test data of a device to be diagnosed is loaded. Basic probability assignment is calculated and a reliability decision matrix is constructed. An induced ordered weighted averaging operator and its induction vector are calculated according to a sample source of the data. An index weight vector is calculated. All evidence is fused by the induced ordered weighted evidence theory and reliability of comprehensive evaluation is calculated, so as to determine a diagnosis result. The disclosure realizes fault identification, fault type distinction and fault position of power equipment by interpreting detection waveforms.

Abstract: A method comprises receiving moisture sensor data from at least one moisture sensor located in a device. The at least one moisture sensor is configured to detect moisture on a surface of the device. The method also comprises determining a likelihood of the device slipping from a grip of a user based on the received moisture sensor data; and altering a surface profile of a surface panel of the device based on the determined likelihood of the device slipping from the grip of the user.

Abstract: A power control device configured for diagnosing an open-circuit fault occurring in a power system of an autonomous vehicle and an open-circuit diagnosis method thereof, may include a power control switch that selectively connects or separates main power output from the first power supply and auxiliary power output from the second power supply, and a processor that determines a possibility of an open-circuit fault of a vehicle power source based on a current flowing through the power control switch and determines whether it is possible to drive an electric load with an output power of the second power supply alone and determine an open-circuit position based on an output of the first power supply when there is the possibility of the open-circuit fault.

Abstract: The disclosure relates to an electrical installation comprising a monitoring module positioned between a sensor connected to a measurement cable and first and second supply cables for the sensor. The monitoring module comprises a first transistor comprising first and second power electrodes and a control electrode, the first and the second power electrodes of the first transistor being electrically connected to the second supply cable and to the measurement cable, respectively, so that when the first transistor is in the closed state thereof, a first fault value is generated on the measurement cable. The control electrode of the first transistor is connected to the first supply cable so that the loss of current in the first supply cable, caused by the interruption of the current, automatically triggers the switching of the first transistor to the closed state thereof.

Abstract: Disclosed is an apparatus for testing a device, comprising: a switch (100) arranged to replace a circuit breaker (30) associated with an individual system in the device under test, wherein the switch (100) is operable to be controlled remotely from the device under test such that the switch (100) either activates or deactivates the individual system.

Abstract: A method of testing an integrated circuit on a test circuit board includes performing, by a processor, a simulation of a first heat distribution throughout an integrated circuit design, manufacturing the integrated circuit according to the integrated circuit design, and simultaneously performing a burn-in test of the integrated circuit and an automated test of the integrated circuit. The burn-in test has a minimum burn-in temperature of the integrated circuit and a burn-in heat distribution across the integrated circuit. The integrated circuit design corresponds to the integrated circuit. The integrated circuit is coupled to the test circuit board. The integrated circuit includes a set of circuit blocks and a first set of heaters.

Abstract: To reduce the construction effort and also to make it smaller, the detector coil (6) is formed in the detector head (7) of a magnetostrictive position sensor (100) in a semiconductor chip (2), in which at the same time also the evaluation circuit (16) is formed and—if biased electrically and by means of direct current—also the then necessary separate bias coil (18).

Abstract: In some implementations, an angle sensor may receive a first x-component value and a first y-component value from a first set sensing elements and a second x-component value and a second y-component value from a second set of angle sensing elements. The angle sensor may perform a safety check including determining a first range of angles associated with a target object based on a relationship between a magnitude of the first x-component value and a magnitude of the first y-component value; determining a second range of angles associated with the target object based on a relationship between a magnitude of the second x-component value and a magnitude of the second y-component value; and determining whether the second range of angles is a subset of the first range of angles. The angle sensor may output an indication of a result of the safety check.

Abstract: A sensor target cover capable of preventing an optical liquid level detection sensor from erroneously detecting a rise in a liquid level is provided. A sensor target cover is used in combination with an optical liquid level detection sensor. The sensor target cover includes a reflecting plate, an inner wall structure surrounding the reflecting plate, and an outer wall structure surrounding the inner wall structure. A gap is formed between the inner wall structure and the outer wall structure.

Abstract: Systems and methods for substrate support in a millisecond anneal system are provided. In one example implementation, a millisecond anneal system includes a processing chamber having a wafer support plate. A plurality of support pins can extend from the wafer support plate. The support pins can be configured to support a substrate. At least one of the support pins can have a spherical surface profile to accommodate a varying angle of a substrate surface normal at the point of contact with the substrate. Other example aspects of the present disclosure are directed to methods for estimating, for instance, local contact stress at the point of contact with the support pin.

Abstract: Probe structures, probe arrays, have varying intrinsic material properties along their lengths. Methods of forming probes and probe arrays comprise varying the plating parameters to provide varying intrinsic material properties. Some embodiments provide deposition templates created using multiphoton lithography to provide probes with varying lateral configurations along at least portion of their lengths.

Abstract: An arc fault detection device includes: a first electric line; at least one sensor for monitoring an electric current or voltage spectrum in the first electric line and outputting an analogue HF measurement signal; and an input section connected to the at least one sensor, the input section including: an input bandpass filter connected to the at least one sensor so as to filter the analogue HF measurement signal, a passband of the input bandpass filter having a predeterminable arc-frequency range so as to detect arcing effects; and a sampling mixer connected to the input bandpass filter, the sampling mixer having a sampling frequency lower than twice an upper threshold frequency of the arc-frequency range.

Abstract: Electrical installation comprising a monitoring module positioned between a sensor connected to a measurement cable and first and second power supply cables for the sensor. The monitoring module comprises a first transistor comprising a first and a second power electrode and a control electrode, the first and the second power electrodes of the first transistor being electrically connected to the second power supply cable and to the measurement cable, respectively, so that, when the first transistor is in the closed state thereof, a first fault value is generated on the measurement cable. The control electrode of the first transistor is connected to the first power supply cable so that the loss of first potential on the first power supply cable, caused by the interruption thereof, automatically triggers the switching of the first transistor to the closed state thereof.

Abstract: A power verification circuit is provided. The power verification circuit includes a current source, a resistive random access memory (RRAM) cell and a Zener diode. The current source is coupled to a power terminal. The RRAM cell is coupled between the current source and a ground terminal. The Zener diode has an anode coupled to the RRAM cell and a cathode coupled to the power terminal. The impedance of the RRAM cell is determined by the power voltage applied to the power terminal.

Abstract: The present disclosure provides a probing apparatus for semiconductor devices using pressurized fluid to control the testing conditions. The probing apparatus includes a housing configured to define a testing chamber; a device holder positioned on the housing and configured to hold and support at least one device under test; a platen positioned on the housing and configured to retain at least one probe; a card holder positioned on the platen and configured to hold a probe card including the probe; and at least one flow line positioned in the card holder. The flow line is configured to flow a fluid therein to adjust the temperature of the device under test.

Abstract: A method is disclosed for locating an earth fault in a DC network, to which multiple load zones are connectable. Each load zone has two symmetrically earthed load zone lines. In an embodiment of the method, for each load zone line, a line voltage is continuously measured between a line potential, at which the load zone line lies, and an earth potential. In the event that an earth fault is detected at a main line of the DC network, the main lines are separated from both load zone lines of a load zone and the earth fault is assigned to this load zone, if a magnitude difference between the magnitudes of the line voltages of the two load zone lines of this load zone are not significantly reduced after separating the main lines from the load zone lines.