Abstract: A test probe for use with a testing apparatus. The test probe includes a first portion, a second portion, and a third portion, with hinges between the first and second portions and the second and third portions. The first portion folded at the first hinge over the second portion, the third portion folded at the second hinge over the second portion, where the second portion is stacked between the first portion and the third portion. The test probe is compressible from a first uncompressed state to a second compressed state.

Abstract: To provide a magnetic sensor capable of supporting a magnetic block stably and allowing a further size reduction of the sensor chip. A magnetic sensor includes a sensor chip and a magnetic block which are mounted on a circuit board. The sensor chip is mounted on the circuit board such that a mounted surface thereof faces a mounting surface, and the magnetic block is mounted on the circuit board such that first and second surfaces and face an element formation surface and the mounting surface, respectively. The magnetic block has a cutout portion, and some of terminal electrodes E11 to E16 are disposed within a space formed by the cutout portion. According to the present invention, the magnetic block can be supported stably. In addition, the presence of the cutout portion in the magnetic block allows a further size reduction of the sensor chip.

Abstract: A high-sensitivity capacitive sensor circuit having improved sensitivity by implementing a plurality of detection units using charging and discharging, has: an oscillation unit for generating a control clock; a first charge/discharge unit connected to a sensing unit electrode, which generates a sensing signal while being charged/discharged according to the control clock; a second charge/discharge unit connected in parallel to the first charge/discharge unit, which generates a reference signal while being charged/discharged according to the control clock; and a detection unit for detecting a change in the capacitance on the side of the sensing unit electrode by comparing the sensing signal from the first charge/discharge unit with the reference signal from the second charge/discharge unit.

Abstract: A method of making an electrostatic discharge (ESD) testing structure includes forming, in a first die, a first measurement device. The method further includes forming, in a second die, a fuse, a first trim pad, and a second trim pad. The method further includes forming, between the first die and the second die, a plurality of electrical bonds, wherein a first bond of the plurality of bonds is electrically connected to the first trim pad and a first side of the fuse, and a second bond of the plurality of bonds is electrically connected to the second trim pad and a second side of the fuse.

Abstract: A voltage detection circuit includes a resistance dividing circuit containing a coarse adjustment variable resistance circuit and a fine adjustment variable resistance circuit, a coarse adjustment circuit controlling the coarse adjustment variable resistance circuit, a fine adjustment circuit controlling the fine adjustment variable resistance circuit, and a control circuit controlling the coarse adjustment circuit and the fine adjustment circuit based upon a detection signal of a comparator circuit.

Abstract: A current sensor includes an electrical-conduction member, a magnetoelectric converter, and a shield. The shield includes a first shield and a second shield each having a plate shape. The first shield and the second shield being arranged such that surfaces are opposed to and spaced away from each other. A part of the electrical-conduction member and the magnetoelectric converter are located between the surface of the first shield and the surface of the second shield. The part of the electrical-conduction member extends in an extension direction that is along the surface of the first shield. At least one of the first shield and the second shield has an anisotropy in magnetic permeability in which the magnetic permeability in a lateral direction that is along the surface of the first shield and perpendicular to the extension direction is higher than the magnetic permeability in the extension direction.

Abstract: The invention relates to a monitoring device for monitoring an energy parameter in a distribution station, wherein the monitoring device is designed to be attached to a voltage conductor in the distribution station, comprising: a device identifier for uniquely identifying the monitoring device, which device identifier is designed to be read out from immediate spatial proximity; a measurement unit for measuring an electrical current and/or a voltage of an alternating current flowing through the voltage conductor; an evaluation unit for determining the energy parameter based on the measured electrical current and/or voltage; and a communication unit for receiving a request from a readout device and for transmitting the energy parameter to the readout device if the received request comprises access information that is based on the device identifier.

Abstract: Disclosed is a passive wireless device for microfluidic detection of multi-level droplets. A primary inductor channel and a secondary inductor channel each comprise two layers of inductance coils, and the inductance coils of the primary inductor channel and the secondary inductor channel are alternately arranged in each layer. A double-resonance circuit is formed after a liquid conductive material is injected. A first part of a detection channel is disposed between a primary capacitor channel, and a second part of a detection channel is disposed between a secondary capacitor channel. A reading device is used to read a resonant frequency of the double-resonance circuit, and perform detection according to the resonant frequency to obtain information of a corresponding first droplet group and/or second droplet group.

Abstract: A magnetic sensor includes a substrate, and a magneto-resistive element portion which is provided on the substrate and has a predetermined magneto-sensitive direction, and in which a bias magnetic field is applied in a direction orthogonal or substantially orthogonal to the magneto-sensitive direction. The magneto-resistive element portion includes a magnetic layer having a negative magneto-striction constant, and stress-induced anisotropy of the magnetic layer develops in a direction parallel or substantially parallel to the direction of the bias magnetic field in response to a tensile stress act on the substrate in a direction parallel or substantially parallel to the magneto-sensitive direction.

Abstract: Structures for a Hall sensor and methods of forming a structure for a Hall sensor. The structure includes a semiconductor body having a top surface and a sloped sidewall defining a Hall surface that intersects the top surface. The structure further includes a well in the semiconductor body and multiple contacts in the semiconductor body. The well has a section positioned in part beneath the top surface and in part beneath the Hall surface. Each contact is coupled to the section of the well beneath the top surface of the semiconductor body.

Abstract: An apparatus for performing a test on an integrated circuit device is provided. The apparatus includes a processor, at least one mounting portion configured to accommodate at least one integrated circuit device to be tested, and an interface configured to connect the processor to the at least one integrated circuit device to allow data transmission and reception therebetween. The processor is configured to transfer a heating traffic data pattern, which is configured to raise a temperature of the at least one integrated circuit device to a target temperature according to heating test conditions, to the at least one integrated circuit device via the interface.

Abstract: A temperature control system includes a fluid chiller, an air dryer, and a plurality of test stations positioned at remote locations from the fluid chiller and the air dryer. The fluid chiller is configured to generate a chilled fluid stream. The air dryer is configured to generate a dry air stream. Each local test station includes a heat exchanger and thermal control unit. The heat exchanger is configured to selectively cool the dry air stream with the chilled fluid stream to generate an output stream. The thermal control unit is configured to control distribution of the output stream to a local test site.

Abstract: A current sensor system includes a plurality of conductors, each having a first major surface, a second major surface opposite the first major surface, and an aperture extending from the first major surface through a thickness of the conductor to the second major surface. Each of the plurality of conductors is configured to carry a current and wherein the apertures of each of the plurality of conductors are aligned with a common reference line. The current sensor system further includes a plurality of current sensors, each positioned at least partially in the aperture of a respective conductor and including one or more magnetic field sensing elements.

Abstract: A method carries out a self-test of an electrical converter circuit, by use of a control device, proceeding from a known operating point at which a predetermined electrical operating variable has a predetermined starting value, a measurement cycle is begun by the converter circuit being operated. It is additionally provided that the time since the starting of the measurement cycle is detected, and the electrical operating variable and the time constitute two monitoring variables of the self-test. The measurement cycle is ended if one of the two monitoring variables satisfies an ending criterion. A test value is then formed from a measurement value of the other of the two monitoring variables at the end of the measurement cycle and a check is made to ascertain whether the test value lies outside a predetermined reference interval. If so an error signal is generated.

Abstract: A solution for evaluating a medium using electrical signals is described. A plurality of electrical signals having different frequencies are transmitted through the medium and signal data corresponding to the electrical signals after having traveled through the medium is acquired. A complex impedance and a complex permittivity and/or complex conductivity can be calculated for the medium. A set of characteristics of the medium can be computed using mixing models and/or known information of the medium. A level of one or more attributes of the medium can be determined from the characteristics using nonparametric Bayesian inference. One particular application is directed to determining a nitrate level of soil.

Abstract: A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe (10) comprises a probe body (12), a first cantilever (20a) extending from the probe body. The first cantilever defining a first loop with respect to said probe body. The probe further comprises a first contact probe being supported by said first cantilever, and a second contact probe being electrically insulated from the first contact probe. The second contact probe being supported by the first cantilever or by a second cantilever (20b) extending from the probe body.

Abstract: An electronic device test system includes a contactor having probe pairs with first and second conductive probes to couple to a respective conductive feature of a packaged electronic device or wafer die region. The system also includes a test circuit having a voltage source to provide a common mode voltage signal; a first buffer with a first input coupled to an output of the voltage source, an output coupled to a first conductive probe of a first probe pair, and a second input coupled to a second conductive probe of the first probe pair; and a second buffer with a first input coupled to the output of the voltage source, an output coupled to a first conductive probe of a second probe pair, and a second input coupled to a second conductive probe of the second probe pair.

Abstract: A method for monitoring a power electronic assembly is improved to be more effective and versatile. It includes converting and/or modifying an electrical input into at least one electrical output by a conversion and/or modifying process which proceeds in connection with the power electronic assembly. During the conversion and/or modification a bit stream is generated by a delta-sigma modulator and represents the electrical value, that is to say the electrical input or the at least one electrical output. One bit stream each can also be generated by a plurality of delta-sigma modulators and represents the respective electrical value, that is to say the electrical input and the at least one electrical output. The power electronic assembly is monitored based on the one bit stream(s) thus generated and available as a result. The bit stream(s) is/are not demodulated, and therefore very meaningful information of the corresponding useful signal is provided.

Abstract: A method for producing a measurement value transmitter for a sensor device includes providing a magnetic body, providing a coil configured to be supplied with a current, and shaping the coil into a helical winding with an internal diameter that is greater than an outer contour of the magnetic body. The winding is shaped such that the pitch of the winding changes at least in some sections when viewed along the longitudinal extension of the winding. The method further includes arranging the magnetic body within the coil, in particular coaxially to the coil, and supplying the coil with a current so as to magnetize the magnetic body in order to produce the measurement value transmitter.

Abstract: An integrated self-test mechanism for monitoring an analog-to-digital converter (ADC), a reference voltage (Vref) source associated with the ADC, a low-dropout regulator (LDO), or a power supply is provided. In one example, an ADC that is associated with an integrated circuit (IC) can monitor its own Vref, the voltage (VLBO) of an LDO associated with the IC, or the voltage (AVDD) provided to an electrical coupling mechanism in the IC that is coupled to a power supply associated with the IC. The ADC can generate a digital output code based, at least in part, on the Vref and one or more of the VLBO and the AVDD. The digital output code can be used to determine whether one or more of the ADC, the Vref source, the LDO, and the power supply is malfunctioning or nonoperational.