Abstract: The present invention includes a semiconductor device having a layer including an elemental metal and its conductive metal oxide, wherein the layer is capable being oxidized or reduced preferentially to an adjacent region of the device. The present invention also includes processes for forming the devices. Substrate regions, silicon-containing layers, dielectric layers, electrodes, barrier layers, contact and via plugs, interconnects, and ferroelectric capacitors may be protected by and/or formed with the layer. Examples of elemental metals and their conductive metal oxides that may be used with the present invention are: ruthenium and ruthenium dioxide, rhenium and rhenium dioxide, iridium and iridium dioxide, osmium and osmium tetraoxide, or the like.
Type:
Grant
Filed:
November 18, 1994
Date of Patent:
April 23, 1996
Assignee:
Motorola, Inc.
Inventors:
Papu D. Maniar, Reza Moazzami, C. Joseph Mogab
Abstract: A semiconductor switching device having gate-controlled regenerative and non-regenerative conduction modes includes a P-N-P-N thyristor and a diverter region in a semiconductor substrate. Regenerative conduction can be initiated by electrically connecting the thyristor's cathode region and first base region in response to a first bias signal. Non-regenerative conduction can also be initiated by electrically connecting the thyristor's second base region to the diverter region in response to a second bias signal, after regenerative conduction has been initiated. Alternative, non-regenerative conduction can be initiated by electrically connecting the thyristor's second base region to the diverter region and then electrically connecting the thyristor's first base region to the cathode region.
Abstract: A resin-encapsulated semiconductor device is of the structure wherein a silicon chip on a die pad is encapsulated with a molding resin. The rear surface of the die pad remote from the silicon chip, preferably the entire surfaces of the elements are treated with a primer, typically a silane coupling agent and a low stress epoxy resin encapsulant is used, preventing the encapsulating resin from separating and cracking upon subsequent dipping in solder bath.