Abstract: A method and arrangement for determining the phase difference between two timing signals provides that the first timing signal is ed to a delay line multiple times, whereby the number of passes through the delay line is obtained. The phase difference is determined in that a first transit time information is determined that corresponds to that number of delay elements of the delay line that are passed through by the first timing signal during a differential time-span between the two timing signals. Second transit time information is further obtained corresponding to that number of delay elements passed through by the first timing signal during a timing pulse period of time second timing signal. The determination of the first and second transit time information occurs dependent on the number of total passes of the first timing signal through the delay line, respectively, which is obtained at the respective determination time.

Abstract: A probe assembly for probing pins of an integrated circuit (IC) includes a base providing a set of solder-coated contacts arranged to contact a corresponding set of IC pins when the base is placed over the IC pins. The base also includes an heating element for briefly delivering heat to the contacts so that when the base is placed over the IC with the contacts in resting on the IC pins, the heat provided by heating element temporarily melts the solder coating on the contacts. Thereafter, the solder cools and solidifies to form a firm bond between the contacts to the IC pins. The heating element suitably comprises material that generates substantial heat in response to a voltage pulse applied across the heating element or alternatively may act as a heat conductor for conducting heat from an external heat source to the contacts.