Abstract: A wireless assembly for communicating electrical signals between test equipment and a unit under test using contact probes having at a first end a spring-loaded head electrically connected to a test point on the unit under test, and having at a second end a fixed contact post. The wireless assembly is provided with a translator board having at least one conductive pad electrically connected to the test equipment. A guide plate having a first through hole communicating with a bore is provided on the translator board. A contact receptacle is provided in the bore and electrically contacts the conductive pad. The contact receptacle is adapted to at least partially receive the contact post, and is provided with at least one contact finger configured to swipe the contact post and maintain electrical connection therebetween. A spring provided in the bore urges the contact receptacle into electrical contact with the at least one conductive pad.

Abstract: The improved device for precise measurement of magnitudes includes a closed network circuit, an instrument for detecting malfunctions in the closed network circuit and means for outputting an indication of the balance of the closed network circuit. The closed network circuit includes a power source; a transducer in the form of a Wheatstone bridge that is defined by paired series resistors and defines a branch of the closed network circuit and the transducer is serially connected to the power source; and a resistive branch connected in series to the Wheatstone bridge. The instrument is connected to a first connecting point in the resistive branch and to second and third connecting points on the Wheatstone bridge. The instrument calculates a sum of the potential differences between the second and third connecting points and the first connecting point and outputs the summed potential differences.

Abstract: In an IC testing apparatus, a current detecting resistor is connected to a power supply terminal of an IC under test and a switch is provided to bypass large currents while the IC operates. The switch is opened when the IC is in a quiescent mode so that the voltage across the current detecting resistor can be used to measure quiescent current. The IC is judged to be non-conforming article if the measured quiescent current is greater than a prescribed value. A control is provided to close the switch whenever the voltage across the current detecting resistor rises above as prescribed value, and to delay opening the switch when the voltage falls below the prescribed value.

Abstract: A spectrum analyzer that incorporates a YTO (YIG tuned oscillator) as a sweep frequency local oscillator and a YTF (YIG tuned filter) as a frequency pre-selector for an incoming signal and improves a C/N (carrier to noise) ratio with low cost.

Abstract: The microwave leakage field sensor for measuring moisture and/or density of dielectric materials is distinguished by the fact that it is of essentially rotationally symmetrical design and transmissive for electromagnetic radiation in the axial direction toward at least one side, and that an essentially rotationally symmetrical alternating field of standing waves can be generated in it, the spatial period of which field in the peripheral direction is less than the vacuum wavelength at the frequency of the alternating field.

Abstract: It is an object of the invention to provide a magnetic sensor and a current sensor that exhibit high performance at low costs. A magnetic sensor has a magnetic core (1) having a magnetic saturation property and a sensor coil (2) wound around the magnetic core (1). An end of a detection coil (20) is connected to an end of the sensor coil (2). The other end of the detection coil (20) is grounded. The magnetic sensor further comprises a drive circuit (3) and a detection circuit (4). The drive circuit (3) has a series resonance circuit part of which is made up of the sensor coil (2). To the sensor coil (2) the drive circuit (3) supplies a resonance current flowing into the series resonance circuit as an alternating current that allows the magnetic core (1) to reach a saturation region. The detection circuit (4) detects a magnetic field to be measured by detecting variations in resonance current flowing through the sensor coil (2).

Abstract: An on-chip test bus circuit for testing a plurality of circuits and an associated method. The test bus circuit consists of a test bus and a plurality of switching circuits which selectably provide electrical connections between the respective circuits and the test bus. The plurality of switching circuits are configured to transfer an electrical charge between a node disposed within each switching circuit not selected to provide an electrical connection and a respective charge source or sink. The charge source or sink may consist of a low-impedance, substantially noise-free DC voltage or signal source.

Abstract: In an IC testing apparatus, a sense line which is used for purpose of voltage measurement and a force line which is used for purpose of current supply are connected to a terminal of an IC under test through a first switch and a second switch, respectively, and a functional tester is connected to the terminal of the IC under test through a third switch. The first to the third switch are formed by semiconductor switches, and a fourth switch formed by a semiconductor switch having a reduced on resistance is connected across terminals of the first switch and the second switch which are located opposite from their terminals connected to the terminal of the IC under test. During an overload test in the DC test, the fourth switch is turned on to execute the test.

Abstract: A lenticular lens sheet for enlarging vertical and horizontal view angles and minimizing a color shift. In the sheet, incident side lenses formed in a half-cylinder shape are arranged in parallel to converge an incident light. The light converged by each of the half-cylinder shaped lenses is diffused in the vertical and horizontal direction by prism shaped output side lenses.

Abstract: A presentation system, method and software for displaying an image on a screen and correcting image keystoning caused by a projection lens of a projector not being centered on the screen. The presentation system comprises a computer including a processor and memory and a projector interfaced with the computer to project an image A stored in the computer's memory. A program of instructions stored in the computer's memory includes instructions configured to correct keystoning of the image projected by the projector without centering the projector on the screen. The program provides a software solution to avoid hardware modifications to the computer or projector to correct keystoning. The program also includes instructions configured to input right/left and upward/downward projection angles to correct keystoning caused by some combination of the angles being greater than or less than 90°.

Abstract: A handler for a device under test (“DUT”) includes a rotating table which supports up to eight DUTs. The DUTs are held in place over openings in the table and separate heat exchangers contact the individual DUTs through the openings and conductively control the temperature of the DUTs. Six of the DUTs are in conditioning stations and are lifted off of the rotary table until they contact separate spring-loaded pads. One of the DUTs is in a test station and it is lifted off of the rotary table until it contacts a test head, at which point testing is performed. The temperature of each of the DUTs is controlled throughout the process.

Abstract: A circuit for a NOx concentration sensor includes two connected measurement cells disposed in a solid-state electrolyte, a first circuit configuration that, by tapping off a first Nernst voltage (first reference variable), establishes in the cell an oxygen concentration that differs from that in a measured gas, a second circuit configuration that, by tapping off a second Nernst voltage (second reference variable), establishes in the cell an oxygen concentration that differs from that in the first cell, a third circuit configuration that, by tapping off a third Nernst voltage (third reference variable), drives a pump current of oxygen ions that originate from NOx, out of the second cell, a conditioning circuit, and a digital controller.

Abstract: The pump currents in an NOx measurement sensor are generated by voltage-controlled current sources. Instead of the respective pump current, a setting voltage received by the voltage-controlled current sources occurs as the feedback variable in a respective control loop, so that a current measurement can be dispensed with.

Abstract: Accordingly, there is disclosed herein a fast word compare circuit suitable for use in a BIST or BISR environment. In one embodiment, the comparator includes a front end and a zero-detector circuit. The front end receives two or more words and compares them bitwise, generating a set of bit match signals that indicate which bits match. The zero detector receives the bit match signals from the front end and asserts an output signal when all the bit match signals indicate a match. The front end may consist of a set of exclusive-or (XOR) gates, each configured to generate a bit match signal from respective bits of the input words. The zero detector may include a set of bit transistors coupled in parallel between a first node and ground. Each bit transistor receives a respective bit match signal and conducts when the respective bit match signal is asserted.

Abstract: A device for sensing discharges in a test object (1) with two electric connection conductors (1a, 1b, 1c, 1d), preferably a cable joint, comprises at least one first and one second sensor (2a, 2b) and evaluation equipment (EVU). Each one of the sensors generates and supplies to the evaluation equipment sensor signals in dependence on current pulses through the connection conductors and the direction thereof, the first sensor a first sensor signal (v1) and the second sensor a second sensor signal (v2). The evaluation equipment generates in dependence on received sensor signals an indication signal (IND), indicating a partial discharge in the test object.

Abstract: A method and apparatus for determining the position of the main contacts of an automatic transfer switch, without need for special position contacts, by monitoring for the presence of voltages at the normal source voltage contacts, the alternate source voltage contacts, the normal source coil control voltage contacts and the alternate source coil control voltage contacts of the automatic transfer switch, and providing an indication of switch position in response thereto.

Abstract: In a device for projecting flat articles profiles in a machine for cutting these flat articles, a stationary support extends over a working plane of this machine and a pair of adjustable first and second mirrors are connected to the stationary support over the working plane. A projector is mounted on a support rotated alternatively between a first position, in which an image generated by the projector is reflected by the first mirror and projected in a first area of the working plane, and a second position, in which an image generated by the projector is reflected by the second adjustable mirror and projected in a second area of the working plane. The device includes a pneumatic cylinder for driving the support into rotation.

Abstract: A method for testing node interconnection on a circuit board. The method utilizes an automated test system having at least one test channel, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a second output and a second input. The second input of the receiver is coupled to the first output of the driver and to a test probe. The test probe is configured to couple the driver and receiver to one of a plurality of nodes on a circuit board. During a node interconnection test, the driver of a first test channel applies a test signal to a selected node of the plurality of nodes. A predetermined amount of time after application of the test signal, the receiver of the first test channel reads a node voltage of the selected node. The node voltage is then compared to a predetermined threshold voltage of the receiver of the first test channel, and the result of the comparison is an indication as to whether the selected node is coupled to ground.

Abstract: A plasma monitoring apparatus for monitoring a condition of plasma of a plasma load to which power is supplied from a high frequency power source through an impedance matcher provides with a first input impedance calculator for calculating an impedance as a first input impedance from a supply-side terminal of the matcher to the plasma load-side based on voltage, current and phase difference detected at the supply-side terminal of the matcher, a second input impedance calculator for calculating an impedance as a second input impedance from a load-side terminal of the matcher to the plasma load based on a impedance of a element of the matcher and the first input impedance and a plasma impedance calculator for calculating an impedance of the plasma load from the second input impedance and an impedance of a supply-side connecting the matcher and the plasma load.

Abstract: A method for probing a semiconductor component for an active single device test, in accordance with the present invention, includes providing a semiconductor device to be tested and accessing at least one component of the semiconductor device by simultaneously milling a hole and depositing a plug in the hole to connect to the at least one component. A circuit is provided through the plug to make electrical measurements of the semiconductor device.