Abstract: A display panel includes a first substrate including a common electrode, a second substrate including a first solid pixel electrode and a second solid pixel electrode, and a liquid crystal layer including liquid crystal between the first substrate and the second substrate. The second solid pixel electrode is spaced apart from the first solid pixel electrode, and surrounds the first solid pixel electrode.

Abstract: A direct type LED backlight device improves color unevenness on the periphery of the display region without increase of the driver and its control circuit and contour change of a liquid crystal panel. This device includes a bottom wall, a set of optical members arranged opposite to an inner surface of the bottom wall, a side wall maintaining the bottom wall and the set of optical members at a predetermined distance, and LEDs fixed to the inner surface of the bottom wall. The side wall has a protrusion protruding toward a central portion of a space formed by the bottom wall, the side wall, and the set of optical members. At least part of emission surfaces of the LEDs arranged at outermost positions are overlapped with the protrusion and located at such positions as to be invisible when seen along a direction perpendicular to the set of optical members.

Abstract: An improved way of using radiographic imagery to locate inclusions within concrete. Radiographic film is placed on one side of a concrete structure and X-rays are transmitted towards the film from the other side. A target which is selectively radiographically impervious is interposed to generate location indicia on the film. Once developed, the film may be used to generate an image display such as a paper bearing indicia from the film or may be used directly to mark the location of inclusions on the concrete. The target may comprise a metallic plate with a viewing window and location indicia rendered in radiographically impervious material to establish measurement indicia in the final film image.

Abstract: There is provided a nondestructive method for inspecting ceramic structures, the method which not only easily detects the position and size of an internal defect in a ceramic structure in a short time, but also accurately identifies the position, shape, and size of the internal defect. In the method, the distribution of X-ray absorption coefficients (CT numbers) at fault planes of the ceramic structure is measured by irradiating the periphery of the ceramic structure with X rays along the periphery of the ceramic structure so that the X rays scan the entire periphery. The X rays are emitted from an X-ray tube at a tube voltage in the range of 80 to 400 kV and a tube current in the range of 2 to 400 mA.