Abstract: An ion beam apparatus includes a source part generating plasma therein, a process part in which a process using an ion beam is performed, and a slit structure provided between the source part and the process part and extracting the ion beam from the plasma. The slit structure includes at least one electrode structure. The electrode structure has a slit penetrating the electrode structure and extending in a first direction. The ion beam is irradiated onto a substrate at an incident angle through the slit. The incident angle of the ion beam is adjusted by rotating the electrode structure on a rotation axis parallel to the first direction.

Abstract: A method of mass spectrometry or ion mobility spectrometry is disclosed. The method comprises: providing a plurality of species of ions; analyzing the ions during a plurality of sequential acquisition periods so as to obtain spectral data relating to the ions; varying the value of an operational parameter of the spectrometer such that it has different values during the different acquisition periods, wherein the spectral data obtained for a given ion varies depending on the value of the operational parameter; storing the spectral data obtained during the different acquisition periods separately; selecting a target ion; and then interrogating the spectral data so as to identify a set of first acquisition periods that include data corresponding to said target ion. Selecting spectral data from only a subset of the first acquisition periods allows the selection of the optimal spectral data for the target ion, while discarding less optimal data.

Abstract: The invention generally relates to systems and methods for continuous or batch wise sampling of a surface for analysis of trace chemical constituents that may be present on the surface by mass spectrometry. Integration of time and place of the sampling and analysis processes allows real-time on-the-spot response to the analytical data and can take into account that material is not necessarily uniformly distributed on a surface. A further feature of the systems and methods of the invention is that the swabbing process also cleans the surface being analyzed. Accordingly, systems and methods of the invention provide an integrated approach that allows for a surface to be cleaned, sampled and analyzed in real-time, providing a faster and more efficient way to verify or validate whether a manufacturing vessel is sufficiently clean to start another production.

Abstract: Methods and apparatuses for the identification and/or characterization of properties of a sample using mass spectrometry. The method involves using a measured spectrum of data from a sample taken with a mass spectrometer, deconvoluting the measured spectrum of data by applying parsimony weighting to minimize the number of charge states based on one or more of: the number of intense peaks in the mass spectrum; the number of harmonic relationships (e.g., masses in small integer ratios); and the number of off-by-one relationships (e.g., m/z bins with high probability for two adjacent charges). Thus, the underlying m/z spectrum may be inferred from the family of plausible deconvoluted spectra determined by applying parsimony and the inferred m/z spectrum may be used to identify and/or characterize the sample.

Abstract: The present specification discloses a radiographic inspection system for screening an area. The inspection system has a container that defines an enclosed volume, a radiation source positioned within the enclosed volume, a detector array, a movable structure attached to a portion of the base of the container, and a controller programmed to move the movable structure to achieve an optimum height of the radiation source's field of view based upon a plurality of data.

Abstract: An assembly comprises a wet compartment (100) having at least one inlet opening for allowing water to enter the wet compartment (100), a functional unit (2) located in the wet compartment (100), a dry area (200) which cannot be reached by water and which is outside of the wet compartment (100), a barrier (110) situated between the dry area (200) and the wet compartment (100), and at least one energy source (20) which is arranged and configured to emit energy for preventing biofouling of at least an exterior surface (17) of the functional unit (2), wherein the energy source (20) is arranged in the dry area (200), a path (112) being present between the dry area (200) and the wet compartment (100) for allowing energy emitted by the energy source (20) during operation thereof to reach the wet compartment (100), through the barrier (110).

Abstract: A time-of-flight image sensor including a readout circuit is provided. The readout circuit may include a pixel array including multiple pixels. The pixel array may be configured to produce a pixel signal for each of one or more pixels over a series of timesteps. The pixel signal may include an illuminated value and a reset value. The readout circuit may further include a plurality of gain selection comparators configured to receive the pixel signal and select an amplifier gain value. The readout circuit may further include analog correlated double sampling circuitry. The readout circuit may further include a programmable gain amplifier configured to generate an amplified pixel signal from the pixel signal, which may be amplified at the selected amplifier gain value. The readout circuit may further include a plurality of analog-to-digital converters. Each of the analog-to-digital converters may have a common ramp generated by a global ramp generator.

Abstract: The purpose of the present invention is to be able to acquire high-resolution images in a scanning electron microscope using a combination of a cold cathode (CFE) electron source and a boosting process, even at low accelerating voltage enhancing the current stability of the CFE electron source. A configuration in which a CFE electron source (101), an anode electrode (103) at positive (+) potential, and an insulator (104) for isolating the anode electrode (103) from ground potential are accommodated within a single vacuum chamber (105), and an ion pump (106) and a non-evaporable getter (NEG) pump (107) are connected to the vacuum chamber (105), is employed.

Abstract: The present disclosure relates to a radiographic shield incorporating a radiographic shutter mechanism, and a protective jacket for a radiographic device. The radiographic shutter mechanism includes machined tungsten components which in some embodiments, includes a jigsaw puzzle type interconnection, the radiographic shield includes an S-shaped passageway in combination with the radiographic shutter mechanism. The protective jacket allows for various mounting configurations, such as integrated SCAR mounting configurations, including a ratchet snap configuration.

Abstract: A lighting assembly includes a light source, such as an ultraviolet (UV) light source that is configured to emit UVC light, and a reflector system including a base having an internal central crest that is configured to direct emitted light away from the light source.

Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.

Abstract: An electron detector assembly configured for detecting electrons emitted from a sample irradiated by an electron beam, comprising a scintillator including a scintillator layer, the scintillator layer emitting light signals corresponding to impingement of electrons thereupon, a light guide plate coupled to the scintillator layer and comprising a peripheral surface, and a single or plurality of silicon photomultiplier devices positioned upon the peripheral surface and arranged perpendicularly or obliquely relative to the scintillating surface, the silicon photomultiplier device being configured to yield an electrical signal from an electron impinging upon the scintillator layer.