Patents Examined by Eun Hee Chung
  • Patent number: 7177788
    Abstract: Input parameters and technically possible parameter values associated therewith are selected, from which are obtained support point values and result values assigned thereto for the geometrical properties. At each support point value, the respective result value is assigned to the parameter value assigned to the respective support point value. A response surface is adapted to the result values in a total range of the assigned parameter values. This results in response values for which a minimum value and a maximum value are determined in subranges. A total interval is formed from the largest response value overall and the smallest response value overall. The total interval is divided into a given number of sub-intervals. For each of the sub-intervals, the individual probabilities are cumulated, which yields a total probability value for a respective sub-interval over all the value intervals.
    Type: Grant
    Filed: October 17, 2002
    Date of Patent: February 13, 2007
    Assignee: Infineon Technologies AG
    Inventor: Martin Roessiger